Electronic self-healing methods for radio-frequency receivers
Systems and methods for providing self-healing integrated circuits. The method is characterized in that the behavior of a circuit or a device in response to an input signal is observed. One or more operational parameters or characteristics of the circuit or the device are derived. A corrective action to bring the operational parameters or characteristics of the circuit or device within a desired range is deduced, if needed. The corrective action can be the application of a correction signal or a modification of one or more parameters or characteristics of an element in the circuit. The calculated corrective action, if needed, is applied to bring the operational parameters or characteristics of the circuit or device within the desired range. Optionally, the operational parameters or characteristics of the circuit or the device after the correction is effectuated can be checked.
1. A self-healing integrated circuit system, comprising:
an integrated circuit comprising at least a first plurality of nominally identical circuit blocks each configured to perform an operation in response to an input signal and to provide a response signal, said at least a first plurality of nominally identical circuit blocks each having a respective at least one input terminal and having a respective at least one output terminal;
a measurement module configured to measure a respective response to a test signal applied to of each of at least two of said at least a first plurality of nominally identical circuit blocks, each of said respective responses indicative of at least one parameter or characteristic of said respective one of said at least two of said at least a first plurality of nominally identical circuit blocks, said measurement module configured to be placed in electrical communication with each of said at least two of said at least a first plurality of nominally identical circuit blocks during a test duration, said measurement module configured to provide said test signal and to provide as data said respective responses;
an analysis module configured to receive as input said respective responses, configured to analyze said respective responses to extract information indicative of the respective at least one parameter or characteristic of each of said at least two of said at least a first plurality of nominally identical circuit blocks, and configured to make a determination whether a corrective action is to be applied to any of said respective ones of said at least two of said at least a first plurality of nominally identical circuit blocks, said analysis module having at least one output at which said determination is provided as a signal; and
a correction module configured to receive said determination as input and to apply said respective corrective action to each of said at least two of said at least a first plurality of nominally identical circuit blocks.
2. The self-healing integrated circuit system of claim 1 , wherein said integrated circuit is a radio receiver.
3. The self-healing integrated circuit system of claim 1 , wherein said measurement module is configured to isolate each of said at least two of said at least a first plurality of nominally identical circuit blocks during said test duration.
4. The self-healing integrated circuit system of claim 1 , wherein said at least one parameter or characteristic is a frequency response.
5. The self-healing integrated circuit system of claim 1 , wherein said at least one parameter or characteristic is an I/Q mismatch.
6. The self-healing integrated circuit system of claim 1 , wherein said at least one parameter or characteristic is an absolute gain variation.
7. The self-healing integrated circuit system of claim 1 , wherein said at least one parameter or characteristic is a generated phase relationship between two signals.
8. The self-healing integrated circuit system of claim 1 , wherein said at least one parameter or characteristic is an array peak to null ratio.
9. The self-healing integrated circuit system of claim 1 , wherein said at least one parameter or characteristic is a spurious frequency tone that is to be removed.
10. The self-healing integrated circuit system of claim 1 , wherein all of said integrated circuit, said measurement module, said analysis module, and said correction module are integrated on a single substrate.
11. A method of self-healing an integrated circuit, comprising the steps of:
providing an self-healing integrated circuit system, comprising:
an integrated circuit comprising at least a first plurality of nominally identical circuit blocks;
a measurement module;
an analysis module; and
a correction module;
measuring a respective response to a test signal applied to of each of at least two of said at least a first plurality of nominally identical circuit blocks, each of said respective responses indicative of at least one parameter or characteristic of said respective one of said at least two of said at least a first plurality of nominally identical circuit blocks;
analyzing said respective responses to extract information indicative of the respective at least one parameter or characteristic of each of said at least two of said at least a first plurality of nominally identical circuit blocks;
determining whether a corrective action is to be applied to any of said respective ones of said at least two of said at least a first plurality of nominally identical circuit blocks; and
applying said respective corrective action to each of said at least two of said at least a first plurality of nominally identical circuit blocks.
12. The method of self-healing an integrated circuit of claim 11 , further comprising the optional steps of repeating said measuring, analyzing and determining steps to observe an effect of said applied respective corrective actions.
13. The method of self-healing an integrated circuit of claim 11 , wherein said measuring step is applied to each of said at least two of said at least a first plurality of nominally identical circuit blocks in a sequential procedure.
14. The method of self-healing an integrated circuit of claim 11 , wherein said measuring step is applied to each of said at least two of said at least a first plurality of nominally identical circuit blocks in a parallel procedure.
15. The method of self-healing an integrated circuit of claim 11 , wherein all of said integrated circuit, said measurement module, said analysis module, and said correction module are integrated on a single substrate.