All electric piezoelectric finger sensor (PEFS) for soft material stiffness measurement
A PEFS (Piezoelectric Finger Sensor) acts as an “electronic finger” capable of accurately and non-destructively measuring both the Young's compression modulus and shear modulus of tissues with gentle touches to the surface. The PEFS measures both the Young's compression modulus and shear modulus variations in tissue generating a less than one-millimeter spatial resolution up to a depth of several centimeters. This offers great potential for in-vivo early detection of diseases. A portable hand-held device is also disclosed. The PEF offers superior sensitivity.
1. A sensor system comprising:
a cantilever having:
a first layer made of piezoelectric material enabled to provide a force;
a second layer made of non-piezoelectric material; and
a third layer made of piezoelectric material
wherein said first layer and said third layer have different lengths;
an apparatus for applying voltage via said first layer to generate a force in said cantilever;
an apparatus for measuring a voltage; and
a structure for transmitting an induced voltage to said apparatus for measuring a voltage, wherein the induced voltage is indicative of a displacement of said second layer resultant from said generated force, wherein said sensor is capable of simultaneously inducing a force in said cantilever and measuring a displacement of said second layer.
2. The sensor system of claim 1 , wherein said first and said second layers have different lengths.
3. The sensor system of claim 1 , wherein said first layer directly contacts said second layer and wherein said second layer directly contacts said third layer.
4. The sensor system of claim 1 , wherein said piezoelectric layer is made of lead zirconate titanate.
5. The sensor system of claim 4 , wherein said first layer directly contacts said second layer and wherein said second layer directly contacts said third layer and said first layer includes a restrained base at a proximal end thereof and a cantilever portion extending to a distal end of said first layer.
6. The sensor system of claim 5 , wherein said second layer extends beyond the distal end of said first layer to form an extended portion of said second layer.
7. The sensor system of claim 6 , wherein the extended portion of said second layer is substantially L-shaped or substantially U-shaped.
8. The sensor system of claim 4 , wherein said second layer comprises a member that extends beyond said first layer and wherein the member is oriented at an angle greater than or less than 180 degrees with respect to said first layer.
9. The sensor system of claim 1 , wherein said first layer includes a restrained base at a proximal end thereof and a cantilever portion extending to a distal end of said first layer.
10. The sensor system of claim 9 , wherein said second layer extends beyond the distal end of said first layer to form an extended portion of said second layer.
11. The sensor system of claim 10 , wherein the extended portion of said second layer is substantially L-shaped or substantially U-shaped.
12. The sensor system of claim 1 , wherein said second layer comprises a member that extends beyond said first layer and wherein the member is oriented at an angle greater than or less than 180 degrees with respect to said first layer.
13. The sensor system of claim 12 , wherein said member is oriented at a 90 degree angle with respect to a remainder of said second layer.
14. A sensor system as claimed in claim 1 for sensing stiffness
wherein said sensor system detects the stiffness of a sample by applying a force to said cantilever while said cantilever is in contact with the sample and measuring voltage from said third piezoelectric layer.
15. The sensor system of claim 14 , wherein each of said first and third layers includes a restrained base at a proximal end thereof and a cantilever portion extending to a distal end of each of said first and third layers and wherein said second layer extends beyond the distal ends of the first and third layers to form an extended portion of the second layer, and
wherein the extended portion of the second layer is substantially square-shaped, substantially L-shaped, U-shaped, O-shaped, square-shaped, or tapered.
16. The sensor system of claim 15 , wherein the extended portion of the second layer is substantially square-shaped, substantially L-shaped, U-shaped, O-shaped, square-shaped, or tapered.
17. The sensor system of claim 14 , wherein said structure for transmitting an induced voltage comprises first and second electrodes located on a same side of said first layer.
18. The sensor system of claim 14 , wherein said piezoelectric layer is made of lead zirconate titanate.
19. A sensor system comprising:
a cantilever having:
a first layer made of piezoelectric material enabled to provide a force;
a second layer made of non-piezoelectric material; and
a third layer made of piezoelectric material
wherein said first layer and said third layer have different lengths and said second layer has a different length than said first layer and said third layer;
an apparatus for applying voltage via said first layer to generate a force in said cantilever;
an apparatus for measuring a voltage; and
a structure for transmitting an induced voltage to said apparatus for measuring a voltage, wherein the induced voltage is indicative of a displacement of said second layer resultant from said generated force.
20. The sensor system of claim 19 , wherein said first layer includes a restrained base at a proximal end thereof and a cantilever portion extending to a distal end of said first layer, said second layer extends beyond the distal end of said first layer to form an extended portion of said second layer, the extended portion of said second layer is substantially L-shaped or substantially U-shaped, and said sensor system is capable of simultaneously inducing a force in said cantilever and measuring a displacement of said second layer.
21. The sensor system of claim 19 , wherein said first layer directly contacts said second layer and wherein said second layer directly contacts said third layer.
22. The sensor system of claim 19 , wherein said second layer comprises a member that extends beyond said first layer and wherein the member is oriented at an angle greater than or less than 180 degrees with respect to said first layer.
23. The sensor system of claim 19 , wherein said piezoelectric layer is made of lead zirconate titanate.
24. A sensor system comprising:
a cantilever having:
a first layer made of piezoelectric material enabled to provide a force;
a second layer made of non-piezoelectric material wherein said second layer comprises an exposed contact surface for contacting a sample and said exposed contact surface comprises a portion of one of an upper and lower surface of said second layer; and
a third layer made of piezoelectric material
wherein said first layer and said third layer have different lengths;
an apparatus for applying voltage via said first layer to generate a force in said cantilever;
an apparatus for measuring a voltage; and
a structure for transmitting an induced voltage to said apparatus for measuring a voltage, wherein the induced voltage is indicative of a displacement of said second layer resultant from said generated force.
25. The sensor system of claim 24 , wherein said first layer directly contacts said second layer and wherein said second layer directly contacts said third layer.
26. The sensor system of claim 24 , wherein said first layer includes a restrained base at a proximal end thereof and a cantilever portion extending to a distal end of said first layer.
27. The sensor system of claim 26 , wherein said second layer extends beyond the distal end of said first layer to form an extended portion of said second layer and the extended portion of said second layer is substantially L-shaped or substantially U-shaped.
28. The sensor system of claim 24 , wherein said second layer comprises a member that extends beyond said first layer and wherein the member is oriented at an angle greater than or less than 180 degrees with respect to said first layer.