Plasma reactor with feed forward thermal control system using a thermal model for accommodating RF power changes or wafer temperature changes
View Patent ↗A plasma reactor having a reactor chamber and an electrostatic chuck with a surface for holding a workpiece inside the chamber includes a backside gas pressure source coupled to the electrostatic chuck for applying a thermally conductive gas under a selected pressure into a workpiece-surface interface formed whenever a workpiece is held on the surface and an evaporator inside the electrostatic chuck and a refrigeration loop having an expansion valve for controlling flow of coolant through the evaporator. The reactor further includes a temperature sensor in the electrostatic chuck and a memory storing a schedule of changes in RF power or wafer temperature. The reactor further includes a thermal model capable of simulating heat transfer between the evaporator and the surface based upon measurements from the temperature sensor, and a control processor coupled to the thermal model and to the memory and governing the backside gas pressure source in response to a prediction from the model of a change in the selected pressure that would compensate for the next scheduled change in RF power or implement the next scheduled change in wafer temperature.
1. A plasma reactor, comprising:
a reactor chamber and an electrostatic chuck having a surface for holding a workpiece inside said chamber;
a backside gas pressure source coupled to said electrostatic chuck for applying a thermally conductive gas under a selected pressure into a workpiece-surface interface formed whenever a workpiece is held on said surface;
an evaporator inside said electrostatic chuck and a refrigeration loop having an expansion valve for controlling flow of coolant through said evaporator;
a temperature sensor in said electrostatic chuck;
a memory storing a schedule of changes in RF power or workpiece temperature;
a thermal model capable of simulating heat transfer between said evaporator and said surface based upon measurements from said temperature sensor;
a first control processor coupled to said thermal model and to said memory and governing said backside gas pressure source in response to a prediction from said model of a change in said selected pressure that would compensate for the effect of the next scheduled change in RF power or implement the next scheduled change in workpiece temperature.
2. The reactor of claim 1 further comprising:
a second control processor coupled to said thermal model and governing said expansion valve in response to a prediction from said model of a change in thermal conditions in or near said evaporator that would compensate for the effect of the next scheduled change in RF power or implement the next scheduled change in workpiece temperature.
3. The reactor of claim 2 wherein said model comprises:
plural cascaded simulation elements representing thermal properties of corresponding layers of said electrostatic chuck.
4. The reactor of claim 3 wherein each of said simulation elements of said model comprises a heat capacitance value and a thermal resistance value representative of the corresponding layer of said electrostatic chuck.
5. The reactor of claim 3 wherein each of said simulation elements comprises an empirically constructed look-up table correlating heat flow rate, time and temperature difference across the layer.
6. The reactor of claim 5 wherein said model further comprises means for incorporating said simulation elements in heat flow calculations based upon initial conditions input to said thermal model.
7. The reactor of claim 5 wherein the simulation element for the layer corresponding to the interface between the workpiece and the surface of said electrostatic chuck comprises look-up tables correlating backside gas pressure, heat flow rate, time and the temperature difference across the layer.