Detector arrangement having increased sensitivity
To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.
1. A detector arrangement comprising:
a light detector having a plurality of light sensitive regions and a plurality of light insensitive regions, the light sensitive regions being separated from each other by the light insensitive regions;
a light deflection element above the light detector, which has a plurality of groups of light entrance surfaces, each group having a planar first light entrance surface and at least one planar second light entrance surface adjacent thereto, each of the first light entrance surfaces being located above one of the light sensitive regions and each second light entrance surface being located above one of the light insensitive regions, wherein the first light entrance surface of each group is oriented substantially perpendicular to light incident on the detector arrangement so that the incident light strikes the light sensitive region therebeneath with substantially no deflection due to refraction, and wherein each second light entrance surface of each group is inclined relative to the incident light and to the first light entrance surface of the group to deflect the incident light by refraction onto the light sensitive region below the first light entrance surface of the group.
2. The detector arrangement according to claim 1 , wherein the at least one second light entrance surface and the first light entrance surface are arranged at regular intervals.
3. The detector arrangement of claim 1 , wherein the detector is a line detector.
4. The detector arrangement of claim 1 , wherein the detector is an area detector.
5. The detector arrangement of claim 1 , wherein the light deflection element is made from a contiguous material having the plurality of planar light entrance surfaces formed therein.
6. The detector arrangement of claim 1 , wherein each of the groups of light entrance surfaces is formed as an individual unit, and the light deflection element is composed of multiple individual groups joined together.
7. The detector arrangement according to claim 1 , wherein the light deflection element is made of PMMA.
8. The detector arrangement according to claim 7 , further comprising a glass substrate wherein the light deflection element is applied to the glass substrate.
9. The detector arrangement according to claim 8 , wherein the detector is a cooled PMT detector having a glass window, and the glass substrate is adhesively bonded to the glass window of the PMT detector.
10. The detector arrangement according to claim 1 , wherein the incident light is focused.
11. The detector arrangement according to claim 1 , wherein the incident light is collimated.
12. A microscope, preferably a laser scanning microscope, comprising the detector arrangement according to claim 1 .