Magnetron sputtering apparatus and magnetron sputtering method
A magnetron sputtering apparatus of the invention includes: a sputtering chamber in which a target can be opposed to an object to be subjected to film formation; a gas introduction port facing the sputtering chamber; a magnet provided outside the sputtering chamber and opposite to the target and being rotatable about a rotation center which is eccentric with respect to center of the magnet; a sensor configured to detect a circumferential position of the magnet in a plane of rotation of the magnet; and a controller configured to start voltage application to the target to cause electrical discharge in the sputtering chamber on the basis of the circumferential position of the rotating magnet and gas pressure distribution in the sputtering chamber.
1. A magnetron sputtering apparatus comprising:
a sputtering chamber in which a target can be opposed to an object to be subjected to film formation;
a gas introduction port facing the sputtering chamber;
a magnet provided outside the sputtering chamber and opposite to the target and being rotatable about a rotation center which is eccentric with respect to center of the magnet;
a sensor configured to detect a rotational position of the magnet in a plane of rotation of the magnet; and
a controller configured to control start timing of voltage application to the target to cause electrical discharge in the sputtering chamber on the basis of the rotational position of the rotating magnet with respect to a position of the gas introduction port,
wherein the controller starts the voltage application to the target when the center of the magnet is located on a region in the sputtering chamber in which a gas pressure is lower than at the gas introduction port.
2. The magnetron sputtering apparatus according to claim 1 , wherein the controller ends the voltage application to the target when the center of the magnet is located at an identical position to time when the voltage application to the target is started.
3. A magnetron sputtering apparatus comprising:
a sputtering chamber in which a target can be opposed to an object to be subjected to film formation;
a gas introduction port facing the sputtering chamber;
a magnet provided outside the sputtering chamber and opposite to the target and being rotatable about a rotation center which is eccentric with respect to center of the magnet;
a sensor configured to detect a rotational position of the magnet in a plane of rotation of the magnet; and
a controller configured to control start timing of voltage application to the target to cause electrical discharge in the sputtering chamber on the basis of the rotational position of the rotating magnet with respect to a position of the gas introduction port,
wherein the controller starts the voltage application to the target when the center of the magnet is located on a region farther from a position of the gas introduction port than a line passing through the rotation center and being orthogonal in the plane of rotation of the magnet to a line connecting between the position of the gas introduction port and the rotation center of the magnet.
4. A magnetron sputtering apparatus comprising:
a sputtering chamber in which a target can be opposed to an object to be subjected to film formation;
a gas introduction port facing the sputtering chamber;
a magnet provided outside the sputtering chamber and opposite to the target and being rotatable about a rotation center which is eccentric with respect to center of the magnet;
a sensor configured to detect a rotational position of the magnet in a plane of rotation of the magnet; and
a controller configured to control start timing of voltage application to the target to cause electrical discharge in the sputtering chamber on the basis of the rotational position of the rotating magnet with respect to a position of the gas introduction port,
wherein the controller ends the voltage application to the target when the center of the magnet is located on a region farther from the position of the gas introduction port than a line passing through the rotation center and being orthogonal in the plane of rotation of the magnet to a line connecting between the position of the gas introduction port and the rotation center of the magnet.
5. A magnetron sputtering method comprising:
opposing a target to an object to be subjected to film formation in a sputtering chamber;
introducing a sputtering gas into the sputtering chamber from a gas introduction port facing the sputtering chamber, and rotating a magnet about a rotation center which is eccentric with respect to center of the magnet, the magnet being provided outside the sputtering chamber and opposite to the target; and
starting voltage application to the target to cause electrical discharge in the sputtering chamber on the basis of a rotational position of the rotating magnet in a plane of rotation of the magnet with respect to a position of the gas introduction port,
wherein the voltage application to the target is started when the center of the magnet is located on a region in the sputtering chamber in which a gas pressure is lower than at the gas introduction port.
6. The magnetron sputtering method according to claim 5 , wherein the voltage application to the target is ended when the center of the magnet is located at an identical position to time when the voltage application to the target is started.
7. A magnetron sputtering method comprising:
opposing a target to an object to be subjected to film formation in a sputtering chamber;
introducing a sputtering gas into the sputtering chamber from a gas introduction port facing the sputtering chamber, and rotating a magnet about a rotation center which is eccentric with respect to center of the magnet, the magnet being provided outside the sputtering chamber and opposite to the target; and
starting voltage application to the target to cause electrical discharge in the sputtering chamber on the basis of a rotational position of the rotating magnet in a plane of rotation of the magnet with respect to a position of the gas introduction port,
wherein the voltage application to the target is started when the center of the magnet is located on a region farther from the position of the gas introduction port than a line passing through the rotation center and being orthogonal in the plane of rotation of the magnet to a line connecting between the position of the gas introduction port and the rotation center of the magnet.
8. A magnetron sputtering method comprising:
opposing a target to an object to be subjected to film formation in a sputtering chamber;
introducing a sputtering gas into the sputtering chamber from a gas introduction port facing the sputtering chamber, and rotating a magnet about a rotation center which is eccentric with respect to center of the magnet, the magnet being provided outside the sputtering chamber and opposite to the target; and
starting voltage application to the target to cause electrical discharge in the sputtering chamber on the basis of a rotational position of the rotating magnet in a plane of rotation of the magnet with respect to a position of the gas introduction port,
wherein the voltage application to the target is ended when the center of the magnet is located on a region farther from the position of the gas introduction port than a line passing through the rotation center and being orthogonal in the plane of rotation of the magnet to a line connecting between the position of the gas introduction port and the rotation center of the magnet.