IP Library Granted Patent US 8,344,779
Granted Patent B2
US 8,344,779 · App. 12/871,597 · Granted Jan 1, 2013

Comparator circuit with hysteresis, test circuit, and method for testing

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Quick Facts
Patent No.
US 8,344,779
App. No.
12/871,597
Granted
Jan 1, 2013
Kind
B2
Abstract

A comparator has a first input, a second input, an output, a control electrode of a first hysteresis transistor coupled to the output, and a control electrode of a second hysteresis transistor coupled to the output. A method for testing the comparator includes: reconfiguring the comparator to be an amplifier with unity gain feedback; providing an input voltage to the input; providing a first voltage to the first hysteresis transistor to provide a first offset voltage; measuring a first output voltage at the output; removing the first voltage from the first hysteresis transistor; providing the first voltage to the second hysteresis transistor; and measuring a second output voltage at the output.

Claims (53)

1. In a comparator having a first input, a second input, an output, a first hysteresis transistor having a control electrode coupled to the output, and a second hysteresis transistor having a control electrode coupled to the output, a method for testing the comparator, the method comprising:

reconfiguring the comparator to be an amplifier with unity gain feedback;

providing an input voltage to the first input;

providing a first voltage to the first hysteresis transistor to provide a first offset voltage;

measuring a first output voltage at the output;

removing the first voltage from the first hysteresis transistor;

providing the first voltage to the second hysteresis transistor; and

measuring a second output voltage at the output.

2. The method of claim 1 , wherein reconfiguring the comparator further comprises:

decoupling the control electrode of the first hysteresis transistor from the output;

decoupling the control electrode of the second hysteresis transistor from the output; and

coupling the second input to the output.

3. The method of claim 1 , wherein providing the first voltage to the first hysteresis transistor further comprises providing a second voltage to the second hysteresis transistor, wherein the second voltage is different than the first voltage.

4. The method of claim 3 , wherein the first voltage is characterized as being a positive power supply voltage and the second voltage is zero volts.

5. The method of claim 1 , wherein providing the first voltage to the second hysteresis transistor further comprises providing a second voltage to the first hysteresis transistor, wherein the second voltage is different than the first voltage.

6. The method of claim 1 , wherein providing the input voltage to the input further comprises providing the input voltage from a voltage divider coupled between first and second power supply voltage terminals.

7. The method of claim 6 , wherein the comparator is used in a power-on-reset application.

8. The method of claim 1 , further comprising coupling a compensation capacitor between the output and ground.

9. In a comparator circuit having a first input transistor having a control electrode for receiving an input voltage, a second input transistor having a control electrode for receiving a reference voltage, a current mirror having an input coupled to a second current electrode of the first input transistor, the current mirror having an output, a first hysteresis transistor having a first current electrode coupled to a first current electrode of the first input transistor, a second hysteresis transistor having a first current electrode coupled to a first current electrode of the second input transistor, a control electrode of each of the first and second hysteresis transistors selectively coupled to the output, a method for testing the comparator, the method comprising:

decoupling the control electrodes of the first and second hysteresis transistors from the output;

coupling the control electrode of the second input transistor to the output of the current mirror;

providing a first power supply voltage to the control electrode of the first hysteresis transistor;

providing a second power supply voltage to the control electrode of the second hysteresis transistor, the second power supply voltage being different than the first power supply voltage;

providing an input voltage to the control electrode of the first input transistor;

measuring a first output voltage at the output of the current mirror;

providing the second power supply voltage to the control electrode of the first hysteresis transistor;

providing the first power supply voltage to the control electrode of the second hysteresis transistor; and

measuring a second output voltage at the output of the current mirror.

10. The method of claim 9 , wherein the comparator is used in a power-on-reset circuit.

11. The method of claim 9 , wherein the first power supply voltage is a positive power supply voltage and the second power supply voltage is zero volts.

12. The method of claim 9 , wherein measuring the first output voltage further comprises measuring a high hysteresis threshold voltage of the comparator, wherein measuring the second output voltage further comprises measuring a low hysteresis threshold voltage of the comparator.

13. The method of claim 9 , further comprising coupling a compensation capacitor between the output of the current mirror and a power supply voltage terminal.

14. The method of claim 9 , wherein providing the input voltage to the control electrode of the first input transistor further comprises providing the input voltage from a voltage divider coupled between first and second power supply voltage terminals.

15. A comparator comprising:

a first input transistor having a first current electrode, a second current electrode, and a control electrode for receiving a first input voltage;

a second input transistor having first current electrode, a second current electrode, and a control electrode for receiving a second input voltage;

a current mirror having an input terminal coupled to the first current electrode of the first input transistor, and an output terminal;

a first hysteresis transistor having a first current electrode coupled to the second current electrode of the first input transistor, a second current electrode, and a control electrode;

a second hysteresis transistor having a first current electrode coupled to the second current electrode of the second input transistor, a second current electrode, and a control electrode;

a first switch having a first terminal coupled to the control electrode of the second input transistor, and a second terminal coupled to the output terminal of the current mirror;

a second switch coupled between the control electrode of the first hysteresis transistor and one of either a power supply voltage or a first output voltage from the current mirror; and

a third switch coupled between the control electrode of the second hysteresis transistor and one of either the power supply voltage or a second output voltage from the current mirror.

16. The comparator of claim 15 , further comprising a resistive element having a first terminal coupled to the second current electrode of the first input transistor and a second terminal coupled to the second current electrode of the second input transistor.

17. The comparator of claim 15 , further comprising a voltage divider coupled to the control electrode of the first input transistor for providing the first input voltage.

18. The comparator of claim 15 , further comprising an inverter coupled between the output terminal of the current mirror and a terminal of the third switch.

19. The comparator of claim 15 , further comprising a current source having a first terminal coupled to the second current electrodes of the first and second hysteresis transistors, and a second terminal coupled to a power supply voltage terminal.

20. The comparator of claim 15 , wherein the current mirror comprises:

a first transistor having a first current electrode coupled to a first power supply voltage terminal, and a control electrode and a second current electrode both coupled to the first current electrode of the first input transistor;

a second transistor having a first current electrode coupled to the first power supply voltage terminal, a second current electrode, and a control electrode coupled to the first current electrode of the first input transistor;

a third transistor having a first current electrode coupled to the second current electrode of the second transistor, a second current electrode coupled to a second power supply voltage terminal, and a control electrode;

a fourth transistor having a first current electrode and control electrode both coupled to the control electrode of the third transistor, and a second current electrode coupled to the second power supply voltage terminal;

a fifth transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the first current electrode of the second input transistor, and a second current electrode coupled to the first current electrode of the fourth transistor; and

a sixth transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode and a second current electrode both coupled to the first current electrode of the second input transistor.

Assignments (22)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0387 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0334 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
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To: CITIBANK, N.A., AS COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2010
From: TISINGER, ERIC W.
To: FREESCALE SEMICONDUCTOR, INC.
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