IP Library Granted Patent US 8,299,624
Granted Patent B2
US 8,299,624 · App. 12/877,317 · Granted Oct 30, 2012

Semiconductor device, circuit substrate, and electronic device

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Quick Facts
Patent No.
US 8,299,624
App. No.
12/877,317
Granted
Oct 30, 2012
Kind
B2
Abstract

A semiconductor device has a through electrode formed in a through hole which penetrates a Si substrate from one surface to the other surface of the Si substrate, wherein a rectangular electrode pad is provided on the other surface with an insulation film laid between the electrode pad and the other surface, an opening of the through hole on the one surface side is circular, an opening of the through hole on the other surface side is rectangular, and the area of the opening on the other surface side is made smaller than the area of the opening on the one surface side.

Claims (21)

1. A semiconductor device, comprising:

a silicon substrate that has a first surface and a second surface;

a through hole that is formed in the silicon substrate, the through hole penetrating the silicon substrate from the first surface to the second surface;

a rectangular electrode pad that is provided on the second surface with an insulation film provided between the electrode pad and the second surface;

a first opening of the through hole provided at the first surface, the first opening having a circular shape; and

a second opening of the through hole provided at the second surface, the second opening having a rectangular shape,

wherein an area of the first opening is smaller than an area of the second opening, and

the through hole has a truncated pyramid-shaped inclined surface next to the second opening, and the inclined surface is directed toward a center of the second opening.

2. The semiconductor device according to claim 1 , wherein

a through electrode that is formed in the through hole and penetrates the insulation film, and the through electrode is connected to the electrode pad.

3. The semiconductor device according to claim 1 , wherein

the area of the second opening is smaller than an area of the electrode pad.

4. The semiconductor device according to claim 1 , wherein

the first surface is a (100) face, and the inclined surface is a (111) face.

5. The semiconductor device according to claim 4 , wherein

a crystal face of the silicon substrate is determined such that edges of the silicon substrate and sides of the rectangular shaped second opening are parallel to each other.

6. A circuit substrate, comprising:

the semiconductor device according to claim 1 mounted on the circuit substrate.

7. An electronic device, comprising:

a circuit substrate; and

the semiconductor device according to claim 1 mounted on the circuit substrate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2017
From: SEIKO EPSON CORPORATION
To: ADVANCED INTERCONNECT SYSTEMS LIMITED
Reel/Frame 044938/0869 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 8, 2010
From: MATSUO, YOSHIHIDE
To: SEIKO EPSON CORPORATION
Reel/Frame 024952/0747 →