Spatially resolved thermal desorption/ionization coupled with mass spectrometry
A system and method for sub-micron analysis of a chemical composition of a specimen are described. The method includes providing a specimen for evaluation and a thermal desorption probe, thermally desorbing an analyte from a target site of said specimen using the thermally active tip to form a gaseous analyte, ionizing the gaseous analyte to form an ionized analyte, and analyzing a chemical composition of the ionized analyte. The thermally desorbing step can include heating said thermally active tip to above 200° C., and positioning the target site and the thermally active tip such that the heating step forms the gaseous analyte. The thermal desorption probe can include a thermally active tip extending from a cantilever body and an apex of the thermally active tip can have a radius of 250 nm or less.
1. A method of analyzing a chemical composition of a specimen, comprising:
providing a specimen for evaluation and a thermal desorption probe, having a thermally active tip, wherein an apex of said thermally active tip has a radius of 250 nm of less;
thermally desorbing an analyte from a target site at atmospheric pressure of said specimen using said thermally active tip to form a gaseous analyte, wherein said thermally desorbing step comprises:
heating said thermally active tip to above 200° C., and positioning said target site and said thermally active tip such that said heating step forms said gaseous analyte;
ionizing said gaseous analyte to form an ionized analyte; and
analyzing a chemical composition of said ionized analyte.
2. The method according to claim 1 , further comprising:
determining a predetermined sampling path comprising a plurality of target sites prior to said first thermal desorption step, and
sequentially articulating said thermally active tip along said predetermined sampling path and repeating said thermally desorbing, ionizing and analyzing steps for each target site.
3. The method according to claim 2 , wherein said determining step comprises analyzing a topography of said specimen utilizing said thermal desorption probe in an atomic force microscopy mode.
4. The method according to claim 3 , wherein said thermal desorption probe is maintained in contact with said specimen while said thermal desorption probe is sequentially articulated along said sampling path.
5. The method according to claim 3 , wherein said thermal desorption probe is intermittently removed from contact with said specimen between said target sites.
6. The method according to claim 3 , wherein said thermal desorption probe does not contact said specimen during at least one of said thermal desorbing steps.
7. The method according to claim 3 , further comprising: mapping a property of a chemical component for each of said target sites.
8. The method according to claim 1 , further comprising maintaining said gaseous analyte above a condensation temperature between said thermal desorption step and said ionizing step.
9. The method according to claim 1 , wherein said analyzing step comprises evaluating said ionized analyte with a mass spectrometer.
10. The method according to claim 1 , wherein said ionizing step comprises passing said gaseous analyte through an ionization source.
11. The method according to claim 1 , wherein said thermal desorbing step comprises volatizing said analyte.
12. A system for analyzing a chemical composition of a specimen, comprising:
a specimen stage for supporting a specimen;
a thermal desorption probe, having a thermally active tip, wherein an apex of said thermally active tip has a radius of 250 nm or less;
a collection device arranged to capture an gaseous analyte desorbed from a specimen by said thermal desorption probe;
a heating device for maintaining a temperature of a gaseous analyte above a condensation temperature within said collection device;
an analytical instrument for determining a chemical composition of an analyte, wherein an outlet of said collection device is coupled to an inlet of said analytical instrument;
a stepper mechanism configured to provide relative motion between said specimen stage and said thermal desorption probe; and
a controller configured for (i) actuating said stepper mechanism to sequentially articulate said thermal desorption probe and/or said sample stage along a predetermined sampling path comprising a plurality of target sites, and (ii) heating said thermally active tip to a temperature greater than 200° C. while proximate the target site at atmospheric pressure in order to cause analytes at the plurality of target sites to form gaseous analytes.
13. The system according to claim 12 , wherein said controller is configured for locally heating said thermally active tip to a temperature greater than 350° C.
14. The system according to claim 12 , wherein said controller is configured for causing said stepper mechanism to bring said thermal desorption probe into contact with a specimen at each of said target sites.
15. The system according to claim 14 , wherein said controller is configured for removing said thermal desorption probe from contact with a specimen while said thermal desorption probe is articulated along said sampling path.
16. The system according to claim 14 , wherein said controller is configured for articulating said thermal desorption probe along said sampling path in a non-contact mode.
17. The system according to claim 14 , wherein a chemical composition of an analyte desorbed at each of said plurality of target sites is determined by said analytical instrument and a plot of said data is generated.
18. The system according to claim 12 , wherein a distance between said collection device and said thermally active tip is less than 0.1 mm.
19. The system according to claim 12 , wherein said analytical instrument is a mass spectrometer, an ionization source, a separation method, or a combination thereof.