IP Library Granted Patent US 8,516,423
Granted Patent B2
US 8,516,423 · App. 12/894,102 · Granted Aug 20, 2013

System and method for determining simulated response extrema for integrated circuit power supply networks

Inventors: Georgios Stamoulis (Volos, GR); Sotirios Bantas (Athens, GR); Dimitrios Bountas (Atheus, GR); Nestoras Evmorfopoulos (Volos, GR); Michael Tsiampas (Atheus, GR); Panayotis Merakos (Atheus, GR)
Assignee: Nanotropic S.A.
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Quick Facts
Patent No.
US 8,516,423
App. No.
12/894,102
Granted
Aug 20, 2013
Kind
B2
Abstract

Systems and methods related to fast simulation of power supply networks and identification of a set of extrema (e.g., maxima or minima) waveforms associated with the power supply networks. In accordance with an embodiment, a method is provided for estimating the worst case voltage drop on the power delivery network of a circuit, comprising selecting a model of a power delivery network of a circuit, simulating the circuit over a predefined number of vectors, collecting dynamic voltage waveforms at each of a plurality of points on the power delivery network, calculating a dynamic worst case voltage waveform at each of the plurality of points, and reporting the dynamic worst case voltage waveform along with an associated confidence interval.

Claims (41)

1. A method for estimating the worst case voltage fluctuation on the power delivery network of a circuit, comprising:

selecting a model of a power delivery network of a circuit;

simulating, by a computer, including a non-transitory computer readable storage medium and processor, the circuit over a predefined period of time;

collecting samples of dynamic voltage waveforms at each of a plurality of points on the power delivery network over the predefined period of time;

statistically estimating a worst-case dynamic voltage waveform at each of the plurality of points on the power delivery network based on the collected samples of dynamic voltage waveforms, resulting in a shift from the collected samples of dynamic voltage waveforms for the predefined period of time; and

reporting the statistical estimate of the worst-case dynamic voltage waveform at each point along with an associated confidence interval.

2. The method of claim 1 wherein the model is an R, RC, RL, RLC or RLCK model.

3. The method of claim 1 wherein the plurality of points include connections of digital gates to the power grid (i.e. ‘tap points’) and preselected points on the network.

4. The method of claim 1 wherein the predefined period of time can be varied depending on a required confidence interval for the simulation.

5. The method of claim 1 wherein extreme value theory is used to statistically estimate the worst-case dynamic voltage waveforms.

6. The method of claim 5 further comprising:

determining a set of extrema waveforms at each of the plurality of points.

7. The method of claim 6 further comprising:

performing transient analysis on each of the plurality of points based on the set of extrema waveforms using a linear network simulator.

8. The method of claim 7 wherein statistically estimating the worst-case dynamic voltage waveform includes computing a voltage drop for each transient analysis and determining a maximum value from among the computed voltage drops.

9. A system for estimating the worst case voltage fluctuation on the power delivery network of a circuit, comprising:

a computer, including a non-transitory computer readable storage medium and processor operating thereon;

a simulation tool, executing on the computer, wherein the simulation tool is operable to select a model of a power delivery network of a circuit,

simulate the circuit over a predefined period of time to achieve a particular accuracy,

collect samples of dynamic voltage waveforms at each of a plurality of points on the power delivery network over the predefined period of time,

statistically estimate a worst-case dynamic voltage waveform at each of the plurality of points on the power delivery network based on the collected samples of dynamic voltage waveforms, resulting in a shift of the collected samples of voltage waveforms for the predefined period of time, and

report the statistical estimate of the worst-case dynamic voltage waveform at each point along with an associated confidence interval.

10. The system of claim 9 wherein the model is an R, RC, RL, RLC or RLCK model.

11. The system of claim 9 wherein the plurality of points include tap points and preselected points on the network.

12. The system of claim 9 wherein the predefined period of time can be varied depending on a required confidence interval for the simulation.

13. The system of claim 9 wherein extreme value theory is used to statistically estimate the worst-case dynamic voltage waveforms.

14. The system of claim 13 further comprising:

determining a set of extrema waveforms at each of the plurality of points.

15. The system of claim 14 further comprising:

performing transient analysis on each of the plurality of points based on the set of extrema waveforms using a linear network simulator.

16. The system of claim 15 wherein statistically estimating the worst-case dynamic voltage waveform includes computing a voltage drop for each transient analysis and determining a maximum value from among the computed voltage drops.

17. A method for predicting extrema in time varying signals, comprising:

receiving, at a computer, including a non-transitory computer readable storage medium and processor, a model of a circuit wherein the model includes a plurality of cells;

simulating the model using a plurality of input vectors;

collecting dynamic waveform data for each of the plurality of cells;

using extreme value theory to statistically estimate a set of worst-case dynamic waveforms for each of the plurality of cells based on the collected samples of dynamic waveform data, resulting in a shift of the collected dynamic waveform data for the plurality of input vectors; and

reporting the statistical estimate of the set of worst-case dynamic waveforms for each of the plurality of cells.

18. The method of claim 17 further comprising:

determining a set of extrema waveforms at each of the plurality of cells.

19. The method of claim 18 further comprising:

performing analysis on each of the plurality of cells based on the set of extrema waveforms using a linear network simulator.

Assignments (4)
MERGER Recorded Jan 7, 2021
From: HELIC, INC.
To: ANSYS, INC.
Reel/Frame 054850/0070 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 035098 FRAME: 0069. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 25, 2015
From: NANOTROPIC S.A.
To: HELIC, INC.
Reel/Frame 035282/0887 →
MERGER Recorded Mar 5, 2015
From: NANOTROPIC S.S.
To: HELIC, INC.
Reel/Frame 035098/0069 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 20, 2011
From: STAMOULIS, GEORGIOS; BANTAS, SOTIRIOS; BOUNTAS, DIMITRIOS; EVMORFOPOULOS, NESTORAS; TSIAMPAS, MICHAEL; MERAKOS, PANAYOTIS
To: NANOTROPIC S.A.
Reel/Frame 025670/0672 →
Continuity (2)
Provisional Application 61246951 · Sep 29, 2009
Related Publication 20110313738A1 · Dec 22, 2011