IP Library Granted Patent US 7,990,622
Granted Patent B2
US 7,990,622 · App. 12/896,128 · Granted Aug 2, 2011

Projection objective of a microlithographic projection exposure apparatus

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Quick Facts
Patent No.
US 7,990,622
App. No.
12/896,128
Granted
Aug 2, 2011
Kind
B2
Abstract

A projection objective of a microlithographic projection exposure apparatus comprises a manipulator for reducing rotationally asymmetric image errors. The manipulator in turn contains a lens, an optical element and an interspace formed between the lens and the optical element, which can be filled with a liquid. At least one actuator acting exclusively on the lens is furthermore provided, which can generate a rotationally asymmetric deformation of the lens.

Claims (76)

1. An apparatus, comprising:

a first optical element that is refractive;

a second element;

a liquid between the first optical element and the second element; and

an actuator coupled to the first optical element such that operation of the actuator causes a rotationally asymmetric deformation of the first optical element substantially without causing a deformation of the second element,

wherein the apparatus is a microlithographic projection exposure apparatus.

2. An apparatus according to claim 1 , wherein the first optical element is a plane-parallel plate.

3. An apparatus according to claim 1 , wherein the first optical element is a meniscus lens.

4. An apparatus according to claim 1 , wherein the first optical element is a membrane.

5. An apparatus according to claim 1 , wherein:

there is an interspace between the first optical element and the second element and, the interspace has, in a direction along an optical axis of a projection objective of the apparatus, a maximum thickness of less than 1 mm.

6. An apparatus according to claim 5 , wherein the maximum thickness is less than 2 μm.

7. An apparatus according to claim 1 , wherein the deformation of the first optical element has an m-fold symmetry or a superposition of a plurality of m-fold symmetries with m being an even, positive integer.

8. An apparatus according to claim 1 , comprising at least two actuators that are configured to exert bending moments on the first optical element.

9. An apparatus according to claim 8 , wherein the at least two actuators are arranged along a circumference of the first optical element.

10. An apparatus according to claim 8 , wherein the actuators are configured such that at least two deformations of the first optical element can be generated having a different m-fold symmetry.

11. An apparatus according to claim 1 , wherein the second element is reflective.

12. An apparatus according to claim 1 , wherein the second element is refractive.

13. An apparatus according to claim 12 , wherein the second element is a meniscus lens or a plane-parallel plate.

14. An apparatus according to claim 1 , comprising a second actuator configured to act exclusively on the second element to generate a deformation of the second element.

15. An apparatus according to claim 14 , wherein the deformation of the second element is rotationally asymmetric.

16. An apparatus according to claim 14 , wherein the deformation of the second element is rotationally symmetric.

17. An apparatus according to claim 1 , comprising a pressure equalizer configured to maintain a constant pressure of the liquid in an immersion space.

18. An apparatus according to claim 1 , wherein the first optical element is arranged in or in close proximity of a pupil plane.

19. An apparatus according to claim 1 , wherein the actuator is fastened to a front or a rear surface of the first optical element, and wherein the actuator is configured to produce on the first optical element compressive and/or tensile forces along directions that are at least substantially tangential to the surface.

20. An apparatus according to claim 19 , wherein the actuator is formed by a layer which is applied to the surface, the layer having a variable dimension along at least one direction.

21. An apparatus according to claim 20 , wherein the layer comprises a piezo electric material.

22. An apparatus according to claim 20 , wherein the layer comprises a material having a coefficient of thermal expansion that is different from the coefficient of thermal expansion of the first optical element.

23. An apparatus according to claim 22 , comprising a device configured to controllably change the temperature of the layer.

24. An apparatus according of claim 23 , wherein the device is configured to direct radiation onto the layer.

25. An apparatus according of claim 23 , wherein the device is configured to apply a voltage to the layer.

26. An apparatus according to claim 20 , wherein a plurality of layers have the shape of ring segments, the ring segments forming a circular ring which is centered with respect to an optical axis of a projection objective of the apparatus.

27. An apparatus according to claim 26 , wherein the ring segments are spaced apart by gaps.

28. An apparatus according claim 19 , wherein a plurality of actuators are distributed over the surface within an area through which projection light propagates.

29. An apparatus according to claim 28 , wherein the plurality of actuators are at least substantially transparent at the wavelengths of the projection light.

30. An apparatus according to claim 28 , wherein the plurality of actuators are opaque at the wavelengths of the projection light, and wherein the manipulator is arranged in or in close proximity to a pupil plane of a projection objective of the apparatus.

31. An apparatus according to claim 1 , comprising a sensor that is fastened to a front or rear surface of the first optical element, wherein the sensor is configured to measure a deformation of the first optical element produced by the actuator.

32. An apparatus according to claim 31 , wherein the sensor is configured to produce an output signal which depends on the amount of compressive and/or tensile forces produced in the sensor by a deformation of the first optical element.

33. An apparatus according to claim 1 , wherein a plurality of actuators are distributed over an area, through which projection light is allowed to propagate, of a surface of the first optical element which is opposite to a surface which is in contact with the liquid.

34. An apparatus according to claim 33 , comprising a further optical element that is refractive on which the plurality of actuators rest.

35. An apparatus according to claim 1 , further comprising:

a third optical element; and

means for deforming the third optical element,

wherein there is an interspace between the second element and a third optical element, both the second element and the third optical element are refractive.

36. An apparatus according to claim 1 , comprising a device configured to change the pressure of the liquid.

37. An apparatus according to claim 1 , wherein the first optical element has a shape in its undeformed state which is rotationally asymmetric.

38. An apparatus according to claim 37 , wherein the first optical element has a thickness distribution in its undeformed state which is rotationally asymmetric.

39. An apparatus according to claim 38 , wherein the first optical element has a first surface, which is in contact to the liquid and has a rotationally asymmetric shape, and a second surface opposite the first surface, wherein the second surface has a rotationally symmetric shape.

40. An apparatus according to claim 1 , further comprising:

a controller configured to drive the actuator; and

a sensor arrangement connected to the controller, the sensor arrangement being configured to determine the image errors.

41. The apparatus of claim 40 , wherein the sensor arrangement comprises a CCD sensor, which is positionable in an image plane of a projection objective of the apparatus or in a field plane conjugate therewith.

42. The apparatus of claim 41 , wherein the actuator, the controller and the sensor arrangement form a closed feedback loop.

43. A method, comprising:

providing an apparatus according to claim 1 , the apparatus comprising an illumination system and a projection objective;

arranging a mask in an object plane of the projection objective of the apparatus;

using the illumination system to illuminate the mask with light; and

after illuminating the mask with light, using the projection objective to project the mask onto a photosensitive layer which is arranged in an image plane of the projection objective.

44. An apparatus, comprising:

a first optical element that is refractive, the first optical element having a thickness distribution in its undeformed state which is rotationally asymmetric,

a second element,

a fluid between the first optical element and the second element; and

means for deforming the first optical element,

wherein the apparatus is a microlithographic projection exposure apparatus.

45. A method, comprising:

providing an apparatus according to claim 44 , the apparatus comprising an illumination system and a projection objective;

arranging a mask in an object plane of the projection objective of the apparatus;

using the illumination system to illuminate the mask with light; and

after illuminating the mask with light, using the projection objective to project the mask onto a photosensitive layer which is arranged in an image plane of the projection objective.

46. An apparatus, comprising:

a first optical element that is refractive;

a second element;

a liquid between the first optical element and the second element; and

an actuator coupled to the first optical element such that operation of the actuator causes a rotationally asymmetric deformation of the first optical element substantially without causing a deformation of the second element,

wherein a ratio between the refractive index of the first optical element and the refractive index of the liquid is between 0.9 and 1.1, and the apparatus is a microlithographic projection exposure apparatus.

47. An apparatus according to claim 46 , wherein the ratio between the refractive index of the first optical element and the refractive index of the liquid is between 0.99 and 1.01.

Assignments (3)
A MODIFYING CONVERSION Recorded Feb 28, 2011
From: CARL ZEISS SMT AG
To: CARL ZEISS SMT GMBH
Reel/Frame 025858/0053 →
A MODIFYING CONVERSION Recorded Jan 18, 2011
From: CARL ZEISS SMT AG
To: CARL ZEISS SMT GMBH
Reel/Frame 025763/0367 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 1, 2010
From: CONRADI, OLAF; BLEIDISTEL, SASCHA; HAUF, MARKUS; HUMMEL, WOLFGANG; KAZI, ARIF; SCHWAER, BAERBEL; WEBER, JOCHEN; HOLDERER, HUBERT; TAYEBATI, PAYAM; BITTNER, BORIS
To: CARL ZEISS SMT AG
Reel/Frame 025079/0589 →