Method and device for monitoring movement of mirrors in a MEMS device
A method for monitoring movement of at least one moving mirror in a MEMS device comprising one or more moving mirrors, and wherein the monitoring is based upon capacitance changes over time in the MEMS device. The method comprises the steps of: if the at least one moving mirror is an in-plain mirror, then: a. providing DC voltage to the MEMS device in addition to a driving voltage required for the movement of that at least one moving mirror; b. measuring current proportional to capacitance changes associated with the movement of the at least one moving mirror; and c. monitoring the movement of the at least one moving mirror based on the measured current. If the at least one moving mirror is a staggered mirror, then: d. measuring a current associated with the movement of the at least one moving mirror; e. identifying a plurality of ripples associated with capacitance changes in the MEMS device over time, in the measured current; and f. monitoring the movement of the at least one moving mirror based on the identified plurality of ripples.
1. A method for monitoring movement of at least one moving in-plane mirror in a MEMS device, comprising:
a. providing a DC voltage to said MEMS device and in addition applying a periodic pulsed driving voltage required for oscillation movement of said at least one moving mirror;
b. measuring current that is proportional to capacitance changes associated with the oscillation movement of said at least one moving in-plane mirror over an entire oscillation cycle of the in-plane mirror; and
c. monitoring said at least one moving in-plane mirror oscillation movement based on the measured current;
wherein measuring current further comprises omitting application of a pulse in the periodic pulsed driving voltage to said MEMS device and continuing to make the current measurement during a time segment of the omitted pulse.
2. A method according to claim 1 , further comprising determining in-plane mirror position based upon said monitored oscillation movement.
3. A method according to claim 1 , further comprising calculating a maximum deflection angle of said in-plane.
4. A method according to claim 1 , further comprising determining the direction at which said in-plane in plain mirror rotates.
5. A MEMS device comprising:
at least one moveable in-plane mirror; and
a circuit adapted to monitor movement of said in-plane mirror based upon capacitance changes in said MEMS device over time,
said circuit comprising:
a voltage supply operative to provide to said MEMS device a periodic pulsed driving voltage required for oscillation the movement of said in-plane mirror and a DC voltage;
a current measuring circuit operative to measure over an entire oscillation cycle of the in-plane mirror a current proportional to a capacitance change involved with the oscillation movement of said in-plane mirror and associated with said DC voltage;
a processor operative to monitor the movement of said in-plane mirror based on said current measurement; and
wherein said current measuring circuit is adapted to measure current during a time segment of an omitted pulse in the periodic pulsed driving voltage.
6. A MEMS device according to claim 5 , wherein said processor is further adapted to determine said at least one mirror position based upon the monitored movement of said in-plane mirror.
7. A MEMS device according to claim 5 , wherein said processor is further operative to establish when the movement direction of said in-plane mirror is changed based upon the monitored movement of said in-plane mirror.
8. A MEMS device according to claim 5 , wherein said processor is further operative to calculate maximum deflection angle of said in-plane.
9. A method for monitoring movement of at least one moving staggered mirror in a MEMS device, comprising:
a. measuring a current associated with a movement of said at least one moving staggered mirror at a deflected position;
b. identifying from said measured current a decaying resonance ripple associated with capacitance change oscillations in said MEMS device at the deflected position; and
c. applying a counter-acting signal to said MEMS device during a fly-back period to suppress said decaying resonance ripple at the deflected position.
10. A method according to claim 9 , wherein said counter-acting signal offsets unwanted resonance oscillations in the staggered mirror at the deflected position.
11. A method according to claim 9 , further comprising determining staggered mirror position based upon said monitored movement.
12. A method according to claim 9 , wherein the decaying resonance ripple is associated with a natural resonant frequency of said MEMS device.
13. A MEMS device comprising:
at least one moveable staggered mirror; and
a circuit adapted to monitor movement of said at least one moveable mirror based upon capacitance changes in said MEMS device over time,
said circuit comprising:
a voltage supply operative to provide a driving voltage to said MEMS device required for movement of staggered mirror to a deflected position;
a current measuring circuit operative to measure current associated with movement of said staggered mirror at the deflected position;
a processor operative to identify from said measured current a decaying resonance ripple associated with capacitance change oscillations in said MEMS device at the deflected position and apply a counter-acting signal to said MEMS device during a fly-back period to suppress said decaying resonance ripple at the deflected position.
14. A MEMS device according to claim 13 , wherein the decaying resonance ripple is associated with a natural resonant frequency of said MEMS device.
15. A MEMS device according to claim 13 , wherein the counter acting signal offsets the decaying resonant ripple.