Electron beam diagnostic system using computed tomography and an annular sensor
View Patent ↗A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.
1. An apparatus for analyzing an electron beam, comprising:
a circular electron beam diagnostic sensor adapted to receive the electron beam, said circular electron beam diagnostic sensor having a central axis;
an annular sensor structure operatively connected to said circular electron beam diagnostic sensor, wherein said sensor structure receives the electron beam;
a system for sweeping the electron beam radially outward from said central axis of said circular electron beam diagnostic sensor to said annular sensor structure wherein the electron beam is intercepted by said annular sensor structure; and
a device for measuring the electron beam that is intercepted by said annular sensor structure.
2. The apparatus for analyzing an electron beam of claim 1 wherein said annular sensor structure is a slit.
3. The apparatus for analyzing an electron beam of claim 1 wherein said annular sensor structure is a continuous slit.
4. The apparatus for analyzing an electron beam of claim 1 wherein said annular sensor structure is a segmented slit.
5. The apparatus for analyzing an electron beam of claim 1 wherein said annular sensor structure is a wire.
6. The apparatus for analyzing an electron beam of claim 1 wherein said annular sensor structure that receives the electron beam renders a current versus position of the electron beam and wherein said device for measuring the electron beam that is intercepted by said annular sensor structure generates a current versus time profile of the electron beam.
7. An apparatus for analyzing an electron beam, comprising:
circular electron beam diagnostic sensor means for receiving the electron beam, said circular electron beam diagnostic sensor means having a central axis;
annular sensor means for receiving the electron beam operatively connected to said circular electron beam diagnostic sensor means;
means for sweeping the electron beam radially outward from said central axis of said circular electron beam diagnostic sensor means to said annular sensor means wherein the electron beam is intercepted by said annular sensor means, and
means for measuring the electron beam that is intercepted by said annular sensor means.
8. The apparatus for analyzing an electron beam of claim 7 wherein said annular sensor means is a slit.
9. The apparatus for analyzing an electron beam of claim 7 wherein said annular sensor means is a continuous slit.
10. The apparatus for analyzing an electron beam of claim 7 wherein said annular sensor means is a segmented slit.
11. The apparatus for analyzing an electron beam of claim 7 wherein said annular sensor means is a wire.
12. The apparatus for analyzing an electron beam of claim 7 wherein said annular sensor means that receives the electron beam renders a current versus position of the electron beam and wherein said means for measuring the electron beam that is intercepted by said annular sensor means generates a current versus time profile of the electron beam.
13. A method of analyzing an electron beam, comprising the steps of:
providing a circular electron beam diagnostic sensor adapted to receive the electron beam, said circular electron beam diagnostic sensor having a central axis;
providing an annular sensor structure operatively connected to said circular electron beam diagnostic sensor, wherein said sensor structure receives the electron beam;
sweeping the electron beam radially outward from said central axis of said circular electron beam diagnostic sensor to said annular sensor structure wherein the electron beam is intercepted by said annular sensor structure; and
measuring the electron beam.
14. The method of analyzing an electron beam of claim 13 wherein said annular sensor structure that receives the electron beam renders a current versus position of the electron beam and wherein said device for measuring the electron beam that is intercepted by said annular sensor structure generates a current versus time profile of the electron beam.
15. The method of analyzing an electron beam of claim 13 wherein said step of measuring the electron beam comprises using a fast acting data acquisition system to render a current versus position of the electron beam that is integrated along the length of the portion of the sensor that is intercepting the beam.