IP Library › Granted Patent US 8,467,216
Granted Patent B2
US 8,467,216 · App. 12/917,832 · Granted Jun 18, 2013

Semiconductor memory device for reducing bit line coupling noise

Inventors: Sang-yun Kim (Hwaseong-si, KR); Tai-young Ko (Seongnam-si, KR)
Assignee: Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 8,467,216
App. No.
12/917,832
Granted
Jun 18, 2013
Kind
B2
Abstract

A semiconductor memory device including: first and second memory cell arrays each including at least one word line, at least three bit lines, and memory cells; and a sense amplifier area disposed between the first and second memory cell arrays and including a sense amplifier circuit for sensing and amplifying data of the memory cells, wherein the at least three bit lines of the first memory cell array and the at least three bit lines of the second memory cell array extend in a first direction and the at least three bit lines of the first and the second memory cell arrays are respectively connected to data lines disposed in a second direction, and wherein a bit line located between two of the at least three bit lines of each of the first and the second memory cell arrays is connected to an outermost data line of the data lines.

Claims (10)

1. A semiconductor memory device, comprising:

first and second memory cell arrays each comprising at least one word line, at least three bit lines disposed in a direction perpendicular to the at least one word line, and memory cells disposed at intersections between the at least one word line and the at least three bit lines; and

a sense amplifier area disposed between the first and second memory cell arrays and comprising a sense amplifier circuit for sensing and amplifying data of the memory cells,

wherein the at least three bit lines of the first memory cell array and the at least three bit lines of the second memory cell array extend in a first direction in the sense amplifier area and the at least three bit lines of the first and the second memory cell arrays are respectively connected to data lines disposed in a second direction in the sense amplifier area, and

wherein a first bit line of the at least three bit lines of the first memory cell array is connected to a data line of a middle data line pair of the data lines and a first bit line of the at least three bit lines of the second memory cell array is connected to another data line of the middle data line pair, a second bit line of the at least three bit lines of the first memory cell array is connected to a data line of an outer data line pair of the data lines and a second bit line of the at least three bit lines of the second memory cell array is connected to another data line of the outer data line pair, and a third bit line of the at least three bit lines of the first memory cell array is connected to a data line of an inner data line pair of the data lines and a third bit line of the at least three bit lines of the second memory cell array is connected to another data line of the inner data line pair.

2. The semiconductor memory device of claim 1 , wherein the at least three bit lines include a first conductive wiring layer, and the data lines include a second conductive wiring layer.

3. The semiconductor memory device of claim 1 , wherein the second direction is perpendicular to the first direction.

4. The semiconductor memory device of claim 1 , wherein each bit line of the second memory cell array and its corresponding bit line of the first memory cell array form a complementary bit line pair.

5. The semiconductor memory device of claim 1 , wherein the semiconductor memory device is included in a memory chip of a memory module, and wherein the memory chip is mounted on a printed circuit board.

6. The semiconductor memory device of claim 1 , wherein the semiconductor memory device is included in a system having a controller for controlling the semiconductor memory device through a bus.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2010
From: KIM, SANG-YUN; KO, TAI-YOUNG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 025234/0472 →
Priority Claims (1)
KR 10-2010-0006498 · Jan 25, 2010 · national
Continuity (1)
Related Publication 20110182099A1 · Jul 28, 2011