X-ray spectrometer
The invention relates to X-ray spectral analysis and can be used for control of radiation spectra of X-ray generators as well as for analysis of elemental chemical composition and atomic structure of the specimens by measuring their absorption spectra. The X-ray spectrometer comprises at least one dispersing prism element, means of translation of the dispersing element relative to an X-ray beam, a refracted radiation detector and measuring tools for angle positioning of the dispersing element and the refracted radiation detector. The main distinction of the claimed spectrometer is that it contains an additional radiation detector, means to install it downstream the radiation reflected from the refracting surface of the dispersing element and measuring tools for its angle position in relation to the primary X-ray beam. The dispersing element is made of diamond, or beryllium, lithium hydride or boron carbide. The claimed spectrometer scheme provides a multiple increase of spectral measurements accuracy within the energy range up to 100 keV and possibility of pulse spectra calibration.
1. An X-ray spectrometer comprising
at least one dispersing prism element,
means of translation of the dispersing prism element relative to an X-ray beam,
a refracted radiation detector and measuring tools for angle positioning of the dispersing prism element and the refracted radiation detector,
an additional radiation detector installed downstream from radiation reflected from a refracting surface of the dispersing prism element, and
additional measuring tools installed for displacement determination of the additional radiation detector.
2. The X-ray spectrometer according to claim 1 ,
wherein means for synchronization of measurement cycles of the refracted radiation detector and the additional radiation detector is included.
3. The X-ray spectrometer according to claim 1 ,
wherein both said radiation detectors have the translation means for independent linear movements relative to the dispersing prism element and rotation means for angular movements relative to an axis normal to a plane of radiation incidence.
4. The X-ray spectrometer according to claim 1 ,
wherein the dispersing prism element is made of one of the following materials: diamond, beryllium, lithium hydride or boron carbide.
5. The X-ray spectrometer according to claim 1 ,
wherein the additional dispersing prism elements and the additional refracted radiation detectors are installed, and for said radiation detectors there are linear translation means in a direction perpendicular to a primary radiation beam axis.