IP Library Patent Application 12938493
Patent Application
App. No. 12/938,493

ELECTRONIC CIRCUIT AND METHOD FOR OPERATING A CIRCUIT IN A STANDBY MODE AND IN AN OPERATIONAL MODE

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Patent No.
US None
App. No.
12/938,493
Abstract

A method and an electronic circuit, the electronic circuit includes: a first circuit; a leakage measurement circuit arranged to determine a leakage level of the first circuit when the first circuit is in a standby mode, and to determine an information maintenance level of a supply voltage in response to the leakage level; and a voltage supply circuit arranged to provide to the first circuit a supply voltage of a functional level when the first circuit is in a functional mode, and to provide to the first circuit a supply voltage of the information maintenance level when the first circuit is in the standby mode; wherein the first circuit is arranged to maintain information when provided with the supply voltage of the information maintenance level.

Claims (29)

1 . An electronic circuit, comprising:

a first circuit having a functional mode and a standby mode;

a leakage measurement circuit connected to the first circuit, for determining a leakage level of the first circuit when the first circuit is in a standby mode, and to determine an information maintenance level of a supply voltage, suitable for the first circuit to maintain information in the standby mode, at least partial based on the determined leakage level; and

a voltage supply circuit connected to the first circuit to provide a supply voltage of a functional level when the first circuit is in the functional mode, and to provide to the first circuit a supply voltage of the information maintenance level when the first circuit is in the standby mode;

2 . The electronic circuit according to claim 1 , wherein the leakage measurement circuit is arranged to determine the information maintenance level based on a mapping between leakage levels and information maintenance levels.

3 . The electronic circuit according to claim 1 , wherein the voltage supply circuit is arranged to provide a voltage supply of an initial level when the first circuit enters the standby mode and to reduce the level of the supply level until reaching the information maintenance level.

4 . The electronic circuit according to claim 1 , wherein the leakage measurement circuit is arranged to measure the leakage of the first circuit when the first circuit is in the standby mode.

5 . The electronic circuit according to claim 1 , wherein the leakage measurement circuit is arranged to estimate the leakage of the first circuit when the first circuit is in the standby mode.

6 . The electronic circuit according to claim 1 , further comprising a temperature sensor arranged measure a temperature of the first circuit and to provide to the leakage measurement circuit temperature information about the temperature of the first circuit; wherein the leakage measurement circuit is arranged to determine the information maintenance level in response to the temperature information.

7 . The electronic circuit according to claim 1 , wherein the information maintenance level is a minimal level of the supply voltage that allows the first circuit to maintain the information at a current temperature of the first circuit.

8 . The electronic circuit according to claim 1 , wherein the information maintenance level is a minimal level of the supply voltage that allows the first circuit to maintain the information regardless of a temperature of the first circuit.

9 . A method for operating a first circuit having a functional mode and a standby mode, the method comprising:

determining, by a leakage measurement circuit, a leakage level of the first circuit when the first circuit is in the standby mode;

determining, by the leakage measurement circuit, an information maintenance level of a supply voltage, suitable for the first circuit to maintain information in the standby mode, at least partial based on the determined leakage level;

determining whether the first circuit should enter a functional mode or should enter a standby node;

when the first circuit should enter the standby mode:

providing to the first circuit a supply voltage of the information maintenance level; and

maintaining information stored in the first circuit; when the first circuit should enter the functional mode:

providing to the first circuit a supply voltage of a functional level; and

operating the first circuit in the functional mode.

10 . The method according to claim 9 , comprising determining the information maintenance level based on a mapping between leakage levels and information maintenance levels.

11 . The method according to claim 9 , comprising providing a voltage supply of an initial level when the first circuit enters the standby mode and reducing the level of the supply level until reaching the information maintenance level.

12 . The method according to claim 9 , comprising measuring the leakage of the first circuit when the first circuit is in the standby mode.

13 . The method according to claim 9 , comprising estimating the leakage of the first circuit when the first circuit is in the standby mode.

14 . The method according to claim 9 , comprising measuring a temperature of the first circuit, providing temperature information about the temperature of the first circuit; and determining the information maintenance level in response to the temperature information.

15 . The method according to claim 9 , wherein the information maintenance level is a minimal level of the supply voltage that allows the first circuit to maintain the information at a current temperature of the first circuit.

16 . The method according to claim 9 , wherein the information maintenance level is a minimal level of the supply voltage that allows the first circuit to maintain the information regardless of a temperature of the first circuit.

17 . The method according to claim 9 , comprising determining the information maintenance level of the supply voltage each time the first circuit enters the standby mode.

18 . The method according to claim 9 , comprising determining the information maintenance level of the supply voltage during a manufacturing process of the first circuit.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0285 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0387 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0334 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0477 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0075 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027621/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2010
From: PRIEL, MICHAEL; ROZEN, ANTON; SHOSHANI, YOSSI
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 025241/0910 →