Chip structure with bumps and testing pads
View Patent ↗A chip structure comprising a silicon substrate, a MOS device, dielectric layers, a metallization structure, a passivation layer, a plurality of metal layers and a polymer layer. The metallization structure comprises a first circuit layer and a second circuit layer over the first circuit layer, and comprises a damascene electroplated copper. The passivation layer is over the metallization structure and dielectric layers, the passivation layer including a first opening exposing a contact point of the metallization structure. The polymer layer is disposed over the passivation layer and the first metal layer, a second opening in the polymer layer being over a second contact point of the first metal layer, the polymer layer covering a top surface and sidewall of the first metal layer. The second contact point is connected to the first contact point through the first opening, the second opening not being vertically over the first opening.
1. A chip comprising:
a silicon substrate;
a MOS device in or on said silicon substrate;
a first dielectric layer over said silicon substrate;
a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer, wherein said metallization structure comprises a damascene electroplated copper;
a second dielectric layer between said first and second circuit layers;
a passivation layer over said metallization structure and said first and second dielectric layers, wherein a first opening in said passivation layer is over a first contact point of said metallization structure, and said first contact point is at a bottom of said first opening, wherein said passivation layer has a thickness greater than 0.35 micrometers, wherein said passivation layer comprises a nitride layer;
a first metal layer over said passivation layer and on said first contact point, wherein said first metal layer has a thickness greater than 0.6 micrometers, wherein said first metal layer comprises a first adhesion layer and a first copper layer over said first adhesion layer;
a polymer layer over said passivation layer and said first metal layer, wherein a second opening in said polymer layer is over a second contact point of said first metal layer, wherein said polymer layer covers a top surface and sidewall of said first metal layer, wherein said second contact point is connected to said first contact point through said first opening, wherein said second opening is not vertically over said first opening; and
a second metal layer on said polymer layer and said second contact point, wherein said second metal layer is connected to said second contact point through said second opening, wherein said second metal layer has a thickness greater than 0.6 micrometers, wherein said second metal layer comprises a second adhesion layer, a second copper layer over said second adhesion layer and a gold-containing layer over said second copper layer, wherein there is no polymer layer covering a top surface and sidewall of said second metal layer.
2. The chip of claim 1 , wherein said first adhesion layer comprises titanium.
3. The chip of claim 1 , wherein said first adhesion layer comprises titanium nitride.
4. The chip of claim 1 , wherein said polymer layer comprises polyimide.
5. The chip of claim 1 , wherein said second adhesion layer comprises titanium.
6. The chip of claim 1 , wherein said second adhesion layer comprises titanium nitride.
7. The chip of claim 1 , wherein said second metal layer is further vertically over said first contact point.
8. The chip of claim 1 , wherein said second metal layer has an area configured to have a tin-containing portion provided thereover.
9. The chip of claim 1 , wherein said second metal layer has an area configured to be wirebonded thereto.
10. The chip of claim 1 further comprising a tin-containing portion over a first area of said second metal layer, wherein said second metal layer further has a second area configured to contact a testing probe.
11. A chip comprising:
a silicon substrate;
a MOS device in or on said silicon substrate;
a first dielectric layer over said silicon substrate;
a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer;
a second dielectric layer between said first and second circuit layers;
a passivation layer over said metallization structure and said first and second dielectric layers, wherein a first opening in said passivation layer is over a first contact point of said metallization structure, and said first contact point is at a bottom of said first opening, wherein said passivation layer has a thickness greater than 0.35 micrometers, wherein said passivation layer comprises a nitride layer;
a first metal layer over said passivation layer and on said first contact point, wherein said first metal layer has a thickness greater than 0.6 micrometers, wherein said first metal layer comprises a first adhesion layer and a first copper layer over said first adhesion layer;
a polymer layer over said passivation layer and said first metal layer, wherein a second opening in said polymer layer is over a second contact point of said first metal layer, wherein said polymer layer covers a top surface and sidewall of said first metal layer, wherein said second contact point is connected to said first contact point through said first opening; and
a second metal layer on said polymer layer, on said second contact point and vertically over said first contact point, wherein said second metal layer is connected to said second contact point through said second opening, wherein said second metal layer has a thickness greater than 0.6 micrometers, wherein said second metal layer comprises a second adhesion layer, a second copper layer over said second adhesion layer and a gold-containing layer over said second copper layer, wherein there is no polymer layer covering a top surface and sidewall of said second metal layer.
12. The chip of claim 11 , wherein said first adhesion layer comprises titanium.
13. The chip of claim 11 , wherein said first adhesion layer comprises titanium nitride.
14. The chip of claim 11 , wherein said polymer layer comprises polyimide.
15. The chip of claim 11 , wherein said second adhesion layer comprises titanium.
16. The chip of claim 11 , wherein said second adhesion layer comprises titanium nitride.
17. The chip of claim 11 , wherein said first contact point is vertically over a portion of said MOS device.
18. The chip of claim 11 , wherein said second metal layer has an area configured to have a tin-containing portion provided thereover.
19. The chip of claim 11 , wherein said second metal layer has an area configured to be wirebonded thereto.
20. The chip of claim 11 further comprising a tin-containing portion over a first area of said second metal layer, wherein said second metal layer further has a second area configured to contact a testing probe.