IP Library Granted Patent US 8,035,281
Granted Patent B2
US 8,035,281 · App. 12/963,222 · Granted Oct 11, 2011

Physical quantity detecting sensor and actuator

Assignee: Hitachi Cable, Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,035,281
App. No.
12/963,222
Granted
Oct 11, 2011
Kind
B2
Abstract

A sensor for detecting a physical quantity includes a piezoelectric thin film device having a lower electrode, a piezoelectric thin film and an upper electrode, and a voltage detecting device connected between the lower and upper electrodes of the piezoelectric thin film device. The piezoelectric thin film is formed of an alkali niobium oxide-based perovskite material expressed by (K 1-x Na x )NbO 3 (0<x<1), and a (001) KNN plane diffraction peak of the piezoelectric thin film indicates an angle 2θ from 22.1° to 22.5° in an X-ray diffraction 2θ/θ measurement to a surface of the piezoelectric thin film, and the (001) KNN plane diffraction peak occupies 80% or more of diffraction peaks of the piezoelectric thin film.

Claims (24)

1. A sensor for detecting a physical quantity, comprising:

a piezoelectric thin film device including a lower electrode, a piezoelectric thin film and an upper electrode; and

a voltage detecting device connected between the lower and upper electrodes of the piezoelectric thin film device;

wherein the piezoelectric thin film is formed of an alkali niobium oxide-based perovskite material expressed by (K 1-x Na x )NbO 3 (0<x<1); and

wherein a (001) KNN plane diffraction peak of the piezoelectric thin film indicates an angle 2θ from 22.1° to 22.5° in an X-ray diffraction 2θ/θ measurement to a surface of the piezoelectric thin film, and the (001) KNN plane diffraction peak occupies 80% or more of diffraction peaks of the piezoelectric thin film.

2. The sensor according to claim 1 , wherein an absolute value of the piezoelectric constant |d 31 | of the piezoelectric thin film is 80 pm/V or more under an applied electric field of 30 kV/cm.

3. The sensor according to claim 1 , wherein the lower electrode is formed of a platinum thin film.

4. The sensor according to claim 1 , wherein the lower electrode is formed of a highly preferentially (111) Pt plane oriented platinum thin film.

5. The sensor according to claim 1 , wherein the piezoelectric thin film device further includes a substrate and an adhesive layer, and wherein the adhesive layer is disposed between the substrate and the lower electrode.

6. The sensor according to claim 1 , wherein the piezoelectric thin film device further includes a substrate and an adhesive layer, and wherein the adhesive layer is disposed between the substrate and the lower electrode, and is formed of a titanium thin film.

7. The sensor according to claim 1 , wherein between the lower electrode and the piezoelectric thin film is interposed a thin film of a material selected from a group consisting of LaNiO 3 , NaNbO 3 and (K 1-x Na x )NbO 3 (0<x<1) having a composition ratio x greater than that of the piezoelectric thin film.

8. The sensor according to claim 1 , wherein the sensor is any one of a gyro sensor, a supersonic sensor, a pressure sensor, and a velocity/acceleration sensor.

9. An actuator, comprising:

a piezoelectric thin film device including a lower electrode, a piezoelectric thin film and an upper electrode; and

a voltage applying device connected between the lower and upper electrodes of the piezoelectric thin film device;

wherein the piezoelectric thin film is formed of an alkali niobium oxide-based perovskite material expressed by (K 1-x Na x )NbO 3 (0<x<1); and

wherein a (001) KNN plane diffraction peak of the piezoelectric thin film indicates an angle 2θ from 22.1° to 22.5° in an X-ray diffraction 2θ/θ measurement to a surface of the piezoelectric thin film, and the (001) KNN plane diffraction peak occupies 80% or more of diffraction peaks of the piezoelectric thin film.

10. The actuator according to claim 9 , wherein an absolute value of the piezoelectric constant |d 31 | of the piezoelectric thin film is 80 pm/V or more under an applied electric field of 30 kV/cm.

11. The actuator according to claim 9 , wherein the lower electrode is formed of a platinum thin film.

12. The actuator according to claim 9 , wherein the lower electrode is formed of a highly preferentially (111)Pt plane oriented platinum thin film.

13. The actuator according to claim 9 , wherein the piezoelectric thin film device further includes a substrate and an adhesive layer, and wherein the adhesive layer is disposed between the substrate and the lower electrode.

14. The actuator according to claim 9 , wherein the piezoelectric thin film device further includes a substrate and an adhesive layer, and wherein the adhesive layer is disposed between the substrate and the lower electrode, and is formed of a titanium thin film.

15. The actuator according to claim 9 , wherein between the lower electrode and the piezoelectric thin film is interposed a thin film of a material selected from a group consisting of LaNiO 3 , NaNbO 3 and (K 1-x Na x )NbO 3 (0<x<1) having a composition ratio x greater than that of the piezoelectric thin film.

16. The actuator according to claim 9 , wherein the actuator is used for any one of an inkjet printer, a scanner, and a supersonic generator.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SCIOCS COMPANY LIMITED
To: SUMITOMO CHEMICAL COMPANY, LIMITED
Reel/Frame 037703/0878 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 7, 2015
From: HITACHI METALS, LTD.
To: SCIOCS COMPANY LIMITED
Reel/Frame 036277/0553 →
MERGER AND CHANGE OF NAME Recorded Dec 18, 2014
From: HITACHI CABLE, LTD.; HITACHI METALS, LTD.
To: HITACHI METALS, LTD.
Reel/Frame 034669/0592 →
Priority Claims (1)
JP 2008-013973 · Jan 24, 2008 · national
Continuity (2)
Continuation 12358379 · Jan 23, 2009
Related Publication 20110074251A1 · Mar 31, 2011