IP Library Granted Patent US 8,294,223
Granted Patent B2
US 8,294,223 · App. 12/966,060 · Granted Oct 23, 2012

Metal gate structure and method of manufacturing same

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Quick Facts
Patent No.
US 8,294,223
App. No.
12/966,060
Granted
Oct 23, 2012
Kind
B2
Abstract

A method of manufacturing a metal gate structure includes providing a substrate ( 110 ) having formed thereon a gate dielectric ( 120 ), a work function metal ( 130 ) adjacent to the gate dielectric, and a gate metal ( 140 ) adjacent to the work function metal; selectively forming a sacrificial capping layer ( 310 ) centered over the gate metal; forming an electrically insulating layer ( 161 ) over the sacrificial capping layer such that the electrically insulating layer at least partially surrounds the sacrificial capping layer; selectively removing the sacrificial capping layer in order to form a trench ( 410 ) aligned to the gate metal in the electrically insulating layer; and filling the trench with an electrically insulating material in order to form an electrically insulating cap ( 150 ) centered on the gate metal.

Claims (17)

1. An apparatus comprising:

a substrate;

a gate dielectric over the substrate;

a work function metal adjacent to the gate dielectric;

a gate metal adjacent to the work function metal;

an electrically insulating cap centered on the gate metal;

an electrically insulating layer over and at least partially surrounding the electrically insulating cap, the electrically insulating layer comprising a first section having a surface that is co-planar with a surface of the electrically insulating cap, the first section comprising a low-k material, and further comprising a second section above the first section, the second section also comprising the low-k material;

spacers adjacent to the gate dielectric; and

a dielectric material at least partially surrounding the spacers.

2. The apparatus of claim 1 wherein:

the gate metal is a substance taken from the group consisting of aluminum, tungsten, and titanium-nitride.

3. The apparatus of claim 1 wherein:

the electrically insulating cap is a substance taken from the group consisting of silicon nitride and silicon carbide.

4. The apparatus of claim 1 wherein:

the gate dielectric is a high-k dielectric material.

5. The apparatus of claim 1 wherein:

the work function metal and the gate metal are the same material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061175/0176 →