X-ray topography apparatus
An x-ray topography apparatus in which x-rays diffracted from a sample which is scanned with a linear x-ray are detected by an x-ray detector to obtain a planar diffraction image. In this x-ray topography apparatus, the x-ray detector is an imaging plate shaped as a cylinder and provided with a surface area that is larger than the sample, and the imaging plate is made to undergo α-rotation about the center axis of the cylindrical shape in coordination with scanning movement of the linear x-rays. The center axis of the cylindrical shape extends in a direction at a right angle with respect to the direction of the scanning movement of the linear x-rays.
1. An x-ray topography apparatus comprising:
an x-ray source for generating x-rays;
a first slit for forming the x-rays from the x-ray source into a linear shape and causing the x-rays to be incident on a sample;
a scanning stage for moving the sample relative to the x-ray source;
an x-ray detector for receiving the x-rays from the sample; and
a second slit provided between the sample and the x-ray detector, wherein:
a planar diffraction image is obtained by moving the sample by the scanning stage, keeping the second slit fixed in place relative to the x-ray source, and moving the x-ray detector in synchronization with the sample, while performing measurements of applying x-rays to the sample and receiving the x-rays from the sample by the x-ray detector;
the x-ray detector is a planar x-ray detector of cylindrical shape having a surface area greater than the surface area of the sample;
detector rotation means is provided for rotating the planar x-ray detector about a center axis of the cylindrical shape in coordination with a scanning movement of the linear x-rays;
the center axis of the cylindrical shape extends in a direction at a right angle to the direction of the scanning movement of the linear x-ray; and
the second slit is provided at an incline relative to the sample so that x-rays from the sample enter the x-ray detector from a normal line direction relative to the x-ray detector.
2. The x-ray topography apparatus according to claim 1 ,
wherein the extension direction of the linear x-ray is a direction at a right angle to the direction of the scanning movement of the linear x-ray, and
the center axis of the cylindrical shape of the planar x-ray detector extends parallel to the same direction as the extension direction of the linear x-ray.
3. The x-ray topography apparatus according to claim 2 , wherein the detector rotation means rotates the planar x-ray detector so that a peripheral speed of an external peripheral surface of the planar x-ray detector and a scanning movement speed of the linear x-ray are the same.
4. The x-ray topography apparatus according to claim 2 ,
wherein the planar x-ray detector has a cylindrical storage phosphor as a member irradiated with a diffracted x-ray from the sample, and
the storage phosphor accumulates energy in a portion irradiated with the x-ray, and releases the energy as light emission when the portion is irradiated with light.
5. The x-ray topography apparatus according to claim 2 , wherein the planar x-ray detector is disposed in a dark box,
a read device and an erase device are provided around the planar x-ray detector in the dark box,
the read device reads an image stored in the planar x-ray detector, and
the erase device erases the image stored in the planar x-ray detector.
6. The x-ray topography apparatus according to claim 2 , further comprising:
a two-dimensional CCD sensor in which a plurality of CCD elements for receiving an x-ray and outputting a signal are arranged in a plane; and
means for selectively placing either one of the planar x-ray detector and the two-dimensional CCD sensor at a position for detecting a diffracted x-ray from the sample.
7. The x-ray topography apparatus according to claim 6 , further comprising:
CCD control means for controlling an operation of the plurality of CCD elements and determining an x-ray intensity on the basis of an output signal from each of the CCD elements, wherein the CCD control means controls the plurality of CCD elements on the basis of a TDI method.
8. The x-ray topography apparatus according to claim 2 , further comprising:
a two-dimensional pixel detector in which a plurality of semiconductor x-ray detecting elements for receiving an x-ray and outputting a signal are arranged in a plane; and
means for selectively placing either one of the planar x-ray detector and the two-dimensional pixel detector at a position for detecting a diffracted x-ray from the sample.
9. The x-ray topography apparatus according to claim 1 , wherein the detector rotation means rotates the planar x-ray detector so that a peripheral speed of an external peripheral surface of the planar x-ray detector and a scanning movement speed of the linear x-ray are the same.
10. The x-ray topography apparatus according to claim 9 ,
wherein the planar x-ray detector has a cylindrical storage phosphor as a member irradiated with a diffracted x-ray from the sample, and
the storage phosphor accumulates energy in a portion irradiated with the x-ray, and releases the energy as light emission when the portion is irradiated with light.
11. The x-ray topography apparatus according to claim 9 , wherein the planar x-ray detector is disposed in a dark box,
a read device and an erase device are provided around the planar x-ray detector in the dark box,
the read device reads an image stored in the planar x-ray detector, and the erase device erases the image stored in the planar x-ray detector.
12. The x-ray topography apparatus according to claim 9 , further comprising:
a two-dimensional CCD sensor in which a plurality of CCD elements for receiving an x-ray and outputting a signal are arranged in a plane; and
means for selectively placing either one of the planar x-ray detector and the two-dimensional CCD sensor at a position for detecting a diffracted x-ray from the sample.