Semiconductor integrated circuit and operating voltage control method
A semiconductor integrated circuit includes a first circuit part that is designed under a first corner condition with respect to a process variation, a second circuit part that is designed under a second corner condition narrower than the first condition, and a control part that changes an operating voltage supplied to the first circuit part and the second circuit part according to a delay amount of the first circuit part, and starts the second circuit part when a delay characteristic caused by a change in the operating voltage conforms to a delay characteristic under the second corner condition.
1. A semiconductor integrated circuit, comprising:
a first circuit part that is designed under a first corner condition with respect to a process variation;
a second circuit part that is designed under a second corner condition narrower than the first corner condition; and
a control part that changes an operating voltage supplied to the first circuit part and the second circuit part according to a delay amount of the first circuit part, and starts the second circuit part when a delay characteristic caused by a change in the operating voltage conforms to a delay characteristic under the second corner condition.
2. The semiconductor integrated circuit according to claim 1 ,
wherein the control part outputs an enable signal for operating the second circuit part when the delay amount conforms to the delay characteristic of the second corner condition, and
wherein the second circuit part starts operation according to the enable signal.
3. The semiconductor integrated circuit according to claim 1 , further comprising:
a variable voltage source that applies the operating voltage to the first circuit part and the second circuit part; and
a monitor part that detects the delay amount of the first circuit part which operates according to the operating voltage,
wherein the control part instructs, with an instruction, the variable voltage source to change the operating voltage according to a comparison result of the delay amount and a first reference value, and
wherein the variable voltage source changes the operating voltage according to the instruction received from the control part.
4. The semiconductor integrated circuit according to claim 3 , wherein the control part outputs an enable signal for operating the second circuit part according to a comparison result of the delay amount and a second reference value.
5. The semiconductor integrated circuit according to claim 4 ,
wherein the monitor part includes a ring oscillator,
wherein the control part includes a counter that counts a first oscillation number of the ring oscillator, a first register having a second oscillation number set based on the first reference value, and a second register having a third oscillation number set based on the second reference value, and
wherein the control part outputs a control signal for changing the operating voltage according to a comparison result of the first oscillation number and the second oscillation number, and outputs the enable signal according to a comparison result of the first oscillation number and the third oscillation number.
6. The semiconductor integrated circuit according to claim 3 , wherein the monitor part includes a critical path replica and a plurality of delay circuits connected in series, and detects the delay amount on the basis of a phase difference of respective data signals delayed by the delay circuits through the critical path replica.
7. The semiconductor integrated circuit according to claim 3 , wherein the monitor part is disposed in the second circuit part.
8. The semiconductor integrated circuit according to claim 1 , wherein the control part changes a substrate voltage which is applied to the first circuit part and the second circuit part according to the delay amount of the first circuit part.
9. The semiconductor integrated circuit according to claim 1 , wherein the control part changes a supply voltage that is applied to the first circuit part and the second circuit part according to the delay amount of the first circuit part.
10. The semiconductor integrated circuit according to claim 1 ,
wherein the control part is mounted on the first circuit part.
11. The semiconductor integrated circuit according to claim 1 ,
wherein each of the first corner condition and the second corner condition includes a fast condition and a slow condition which are process corners, and
wherein the fast condition in the first corner condition is set to be faster than the fast condition in the second corner condition, and the slow condition in the first corner condition is set to be slower than the slow condition in the second corner condition.
12. The semiconductor integrated circuit according to claim 1 ,
wherein the control part outputs a stop signal for stopping the second circuit part when the delay amount does not conform to the second corner condition, and
wherein the second circuit part stops its operation according to the stop signal.
13. The semiconductor integrated circuit according to claim 12 , further comprising:
an emulator; and
a selector that selects and outputs one of a first output signal from the second circuit part and a second output signal from the emulator,
wherein the selector selects and outputs the first output signal while the second circuit part operates, and selects and outputs the second output signal while the second output signal stops.
14. An operating voltage control method, comprising:
changing, by a control part, according to a delay amount of a first circuit part designed under a first corner condition with respect to a process variation, an operating voltage supplied to the first circuit part and a second circuit part designed under a second corner condition narrower than the first corner condition; and
starting, by the control part, the second circuit part when a delay characteristic caused by a change in the operating voltage conforms to a delay characteristic in the second corner condition.