Large Displacement Micro-Lamellar Grating Interferometer
A micro-lamellar grating interferometer for deriving the spectrum of an incident beam from a scene of interest from a generated interferogram is disclosed with a method for using the same. The interferometer comprises a lamellar grating defined by two interleaved reflective mirror set; a first stationary set of electromagnetically reflective elements and a second moveable set of electromagnetically reflective elements. The first and second set of electromagnetically reflective elements are referred to as mirror elements herein. The second mirror element set is disposed on a moveable platform supported by flexures that are driven with a high stiffness magnetic, thermal or piezoelectric actuator designed have a predetermined vertical displacement that is perpendicular to the first mirror set.
1 . A micro-lamellar grating interferometer fabricated from a MEMS process comprising:
a lamellar grating comprising a first stationary set of mirror elements and a second moveable set of mirror elements,
the first and second set of mirror elements interleaved whereby the second set of mirror elements may be perpendicularly driven a predetermined distance with respect to the first set of mirror elements,
the second set of mirror elements driven by a flexure element having a predetermined stiffness,
actuator means for driving the flexure element and second set of mirror elements perpendicularly with respect to the first set of mirror elements.
2 . The interferometer of claim 1 wherein the actuator means comprises magnetic actuator means.
3 . The interferometer of claim 1 wherein the actuator means comprises thermal actuator means.
4 . The interferometer of claim 1 wherein the actuator means comprises piezoelectric actuator means.
5 . The interferometer of claim 1 further comprising second mirror set position feedback means.
6 . The interferometer of claim 3 wherein the thermal actuator means comprises a bi-morph element.
7 . The interferometer of claim 4 wherein the piezoelectric actuator means comprises a plurality of stacked piezoelectric disk elements.
8 . The interferometer of claim 5 wherein the position feedback means comprises capacitive sensing means.
9 . The interferometer of claim 5 wherein the position feedback means comprises inductive sensing means.
10 . The interferometer of claim 5 wherein the position feedback means comprises laser reference means.
11 . The interferometer of claim 1 further comprising a photo-detector element.
12 . The interferometer of claim 1 further comprising circuitry for performing a Fast Fourier Transform.
13 . The interferometer of claim 1 further comprising a gas cell having a predetermined gas sample.
14 . A method for identifying the electromagnetic spectrum of a radiation source comprising the steps of:
providing a micro-lamellar grating interferometer fabricated from a MEMS process comprising a lamellar grating comprising a first stationary set of mirror elements and a second moveable set of mirror elements wherein the first and second set of mirror elements are interleaved whereby the second set of mirror elements may be perpendicularly driven a predetermined distance with respect to the first set of mirror elements,
the second set of mirror elements cooperating with and driven by a flexure element having a predetermined stiffness and further comprising actuator means for driving the second set of mirror elements perpendicularly with respect to the first set of mirror elements,
producing a 0 th order beam from the radiation source using the micro-lamellar grating interferometer,
passing the 0 th order beam through a gas cell comprising a predetermined gas to produce a gas cell output,
detecting the gas cell output on a photo-detector.
15 . The method of claim 14 further comprising the step of coupling the radiation source with a laser reference source using a first dichroic element to produce a coupled output.
16 . The method of claim 15 further comprising the step of collimating the coupled output prior to produce the 0 th order beam.
17 . The method of claim 16 further comprising the step of collimating the 0 th order beam.
18 . The method of claim 17 further comprising the step of separating the laser reference source from the collimated 0 th order beam using a second dichroic element.