IP Library Granted Patent US 8,616,873
Granted Patent B2
US 8,616,873 · App. 13/014,354 · Granted Dec 31, 2013

Micro-conformal templates for nanoimprint lithography

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Quick Facts
Patent No.
US 8,616,873
App. No.
13/014,354
Granted
Dec 31, 2013
Kind
B2
Abstract

A micro-conformal nanoimprint lithography template includes a backing layer and a nanopatterned layer adhered to the backing layer. The elastic modulus of the backing layer exceeds the elastic modulus of the nanopatterned layer. The micro-conformal nanoimprint lithography template can be used to form a patterned layer from an imprint resist on a substrate, the substrate having a micron-scale defect, such that an excluded distance from an exterior surface of the micron-scale defect to the patterned layer formed by the nanoimprint lithography template is less than a height of the defect. The nanoimprint lithography template can be used to form multiple imprints with no reduction in feature fidelity.

Claims (33)

1. A nanoimprint lithography template comprising:

a backing layer;

a silicon-containing cured nanopatterned resist layer adhered to the backing layer;

an oxidized layer on the surface of the silicon-containing cured nanopatterned resist layer, wherein the oxidized layer is formed by oxidizing the silicon-containing cured nanopatterned resist layer;

wherein the elastic modulus of the oxidized layer exceeds the elastic modulus of the silicon-containing cured nanopatterned resist layer, and a thickness of the oxidized layer is at least 5 nm.

2. The nanoimprint lithography template of claim 1 , wherein the oxidized layer is formed by oxidizing the silicon-containing cured nanopatterned resist layer via oxygen plasma processing, oxygen ashing, or UV-ozone treatment of the silicon-containing nanopatterned resist layer.

3. The nanoimprint lithography template of claim 1 , wherein a silicon content of the silicon-containing cured nanopatterned resist layer is at least about 10 wt %.

4. The nanoimprint lithography template of claim 1 , wherein a thickness of the oxidized layer is between about 10 nm and about 30 nm.

5. The nanoimprint lithography template of claim 1 , wherein the silicon-containing cured nanopatterned resist layer is formed from a composition comprising a surfactant.

6. The nanoimprint lithography template of claim 5 , wherein the surfactant is a fluorinated surfactant.

7. The nanoimprint lithography template of claim 1 , wherein the elastic modulus of the backing layer is greater than the elastic modulus of the silicon-containing cured nanopatterned resist layer.

8. The nanoimprint lithography template of claim 1 , wherein the silicon-containing cured nanopatterned resist layer comprises an inorganic-organic hybrid polymer.

9. The nanoimprint lithography template of claim 1 , wherein the elastic modulus of the silicon-containing cured nanopatterned resist layer is greater than the elastic modulus of polydimethylsiloxane.

10. The nanoimprint lithography template of claim 1 , wherein the nanoimprint lithography template shows no reduction in feature fidelity after 200 imprints.

11. The nanoimprint lithography template of claim 1 , wherein the nanoimprint lithography template forms a patterned layer in an imprint resist on a substrate having a micron-scale defect, such that an excluded distance from an exterior surface of the micron-scale defect to the patterned layer formed by the nanoimprint lithography template is less than a height of the defect.

12. A nanoimprint lithography method comprising:

selecting a backing layer;

disposing a silicon-containing polymerizable material on the backing layer;

contacting the silicon-containing polymerizable material with a patterned master nanoimprint lithography template;

solidifying the silicon-containing polymerizable material to form a silicon-containing patterned layer adhered to the backing layer;

separating the master nanoimprint template from the silicon-containing patterned layer; and

oxidizing the surface of the silicon-containing patterned layer to form an oxidized layer with a thickness of at least 5 nm on the surface of the silicon-containing patterned layer.

13. The method of claim 12 , wherein oxidizing the surface of the silicon-containing patterned layer comprises an oxidizing treatment selected from the group consisting of oxygen plasma processing, oxygen ashing, reactive ion etching, and UV-ozone treatment.

14. The method of claim 12 , wherein a silicon content of the silicon-containing polymerizable material is at least about 10 wt %.

15. The method of claim 12 , wherein the silicon-containing polymerizable material comprises a fluorinated surfactant.

16. The method of claim 12 , wherein the elastic modulus of the backing layer is greater than the elastic modulus of the silicon-containing patterned layer.

17. The method of claim 12 , wherein the silicon-containing patterned layer comprises an inorganic-organic hybrid polymer.

18. A nanoimprint lithography template comprising:

a backing layer; and

a silicon-containing cured nanopatterned resist layer adhered to the backing layer, wherein the silicon-containing cured nanopatterned resist layer comprises an oxidized surface formed by oxidizing the silicon-containing cured nanopatterned resist layer, and the elastic modulus of the backing layer exceeds the elastic modulus of the silicon-containing cured nanopatterned resist layer,

wherein the nanoimprint lithography template forms a patterned layer from an imprint resist on a substrate, the substrate having a micron-scale defect, such that an excluded distance from an exterior surface of the micron-scale defect to the patterned layer formed by the nanoimprint lithography template is less than a height of the defect, and wherein the nanoimprint lithography template shows no reduction in feature fidelity after multiple imprints.

19. The nanoimprint lithography template of claim 1 , wherein the elastic modulus of the silicon-containing cured nanopatterned resist layer is greater than about 5 MPa.

20. The nanoimprint lithography template of claim 1 , wherein the silicon-containing cured nanopatterned resist layer is free of polydimethylsiloxane.

Assignments (6)
ASSIGNMENT OF SECURITY INTEREST IN PATENTS Recorded Nov 7, 2019
From: JPMORGAN CHASE BANK, N.A.
To: CITIBANK, N.A.
Reel/Frame 050967/0138 →
PATENT SECURITY AGREEMENT Recorded Aug 22, 2019
From: MAGIC LEAP, INC.; MOLECULAR IMPRINTS, INC.; MENTOR ACQUISITION ONE, LLC
To: JP MORGAN CHASE BANK, N.A.
Reel/Frame 050138/0287 →
CONFIRMATORY ASSIGNMENT OF JOINT PATENT OWNERSHIP Recorded Apr 27, 2015
From: CANON NANOTECHNOLOGIES, INC.
To: MOLECULAR IMPRINTS, INC.
Reel/Frame 035507/0559 →
CHANGE OF NAME Recorded Jul 30, 2014
From: MII NEWCO, INC.
To: MOLECULAR IMPRINTS, INC.
Reel/Frame 033449/0684 →
CHANGE OF NAME Recorded Jul 24, 2014
From: MOLECULAR IMPRINTS, INC.
To: CANON NANOTECHNOLOGIES, INC.
Reel/Frame 033400/0184 →
ASSIGNMENT OF JOINT OWNERSHIP Recorded Jul 15, 2014
From: MOLECULAR IMPRINTS, INC.
To: MII NEWCO, INC.
Reel/Frame 033329/0280 →