IP Library Granted Patent US 8,963,538
Granted Patent B2
US 8,963,538 · App. 13/032,107 · Granted Feb 24, 2015

Magnetometer test arrangement and method

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,963,538
App. No.
13/032,107
Granted
Feb 24, 2015
Kind
B2
Abstract

Manufacturing of magnetometer units ( 20 ′) employs a test socket ( 41 ) having a substantially rigid body ( 43 ) with a cavity ( 42 ) therein holding an untested unit ( 20 ) in a predetermined position ( 48 ) proximate electrical connection ( 50 ) thereto, wherein one or more magnetic field sources ( 281, 332, 333, 334, 335, 336 ) fixed in the body ( 43 ) provide known magnetic fields at the position ( 48 ) so that the response of each unit ( 20 ) is measured and compared to stored expected values. Based thereon, each unit ( 20 ) can be calibrated or trimmed by feeding corrective electrical signals back to the unit ( 20 ) through the test socket ( 41 ) until the actual and expected responses match or the unit ( 200 ) is discarded as uncorrectable. In a preferred embodiment, the magnetic field sources ( 281, 332, 333, 334, 335, 336 ) are substantially orthogonal coil pairs ( 332, 333, 334 ) arranged so that their centerlines ( 332 - 1, 333 - 1, 334 - 1 ) coincide at a common point ( 46 ) within the predetermined position ( 48 ). Because the test-socket ( 41 ) is especially rugged and compact, other functions (e.g., accelerometers) included in the unit ( 20 ) can also be easily tested and trimmed.

Claims (29)

1. A method for manufacturing a magnetometer, comprising:

installing the magnetometer in a predetermined position in a test socket, wherein the test socket comprises a substantially rigid body with a cavity therein adapted to receive the magnetometer in the predetermined position within the cavity, one or more magnetic field sources fixedly held by the substantially rigid body in predetermined relation to the predetermined position and adapted to provide a magnetic field passing through the predetermined position, and electrical connection adapted to provide electrically coupling to the magnetometer during testing;

holding the magnetometer in the predetermined position in cooperative contact or communication with the electrical connection during testing;

using the one or more magnetic field sources, creating a magnetic field H in the predetermined position passing through the magnetometer;

using the electrical connection, measuring a response of the magnetometer to the magnetic field H;

comparing the measured response to a stored expected value of the response to asses whether the magnetometer provided an expected value of the response; and

removing the magnetometer from the test socket.

2. The method of claim 1 , wherein the holding step is performed using a pressing element within the cavity.

3. The method of claim 2 , wherein the pressing element is retracted when the magnetometer is being removed from the cavity.

4. The method of claim 1 , wherein if the magnetometer did not provide an expected value, the method further comprises, using the measured response to calculate a trimming or calibrating parameter intended to correct the measured response to more closely match the expected value, sending the trimming or calibrating parameter to the magnetometer, and repeating the creating, measuring, and comparing steps to assess a result thereof.

5. The method of claim 4 , wherein the steps comprising calculating a trimming or calibrating parameter, sending it to the magnetometer, and comparing and assessing the results thereof, comprises at least, (i) a coarse trim or calibration and assessment operation, and (ii) a fine trim or calibration and assessment operation.

6. The method of claim 1 , wherein the step of creating a magnetic field H in the predetermined position, comprises creating a magnetic field having at least two predetermined values.

7. The method of claim 1 , further comprising, subjecting the magnetometer in the same or a substantially similar test socket to a test using a non-magnetic stimulus, measuring a response thereto and comparing it to an expected non-magnetic stimulus response value.

8. The method of claim 7 , further comprising using the first response, obtaining and sending a first non-magnetic trimming or calibrating signal to the magnetometer to alter its response to the non-magnetic stimulus, performing a further test using a non-magnetic stimulus, determining a further response thereto and comparing it to another expected non-magnetic stimulus response value.

9. The method of claim 1 , wherein the magnetometer has an exterior volume V MAG and the test socket has an exterior volume V TS and a ratio V TS /V MAG is less than 2.8×10 4 .

10. A method of manufacturing a magnetometer unit, comprising:

inserting a magnetometer unit in a test socket having a substantially rigid body with a cavity therein for holding the unit in a predetermined position proximate electrical connection thereto and one or more magnetic field sources fixed in the body to provide a known magnetic field H at the position;

using the one or more magnetic field sources fixed in the body, exposing the untested magnetometer unit to the known magnetic field H;

using the electrical connection, measuring a response of the magnetometer unit to the magnetic field H;

determining any difference between the measured response and a stored expected response to the magnetic field H;

using such difference, calculating a trimming parameter adapted to alter the response of the magnetometer unit to reduce the magnitude of the difference;

performing a trimming operation by sending the trimming parameter to the magnetometer unit using the electrical connection; and

assessing the success of the trimming operation by repeating the exposing, measuring and determining steps.

11. The method of claim 10 , wherein the trimming operation comprises a coarse trimming and assessing operation, and thereafter repeating the exposing, measuring, determining and calculating steps to then perform a fine trimming and assessing operation.

12. The method of claim 10 , further comprising:

in the same or a substantially similar test socket, exposing the magnetometer unit to other energy sources;

using the electrical connection, measuring a response of the magnetometer unit to the other energy sources;

determining any difference between the measured response and a stored expected response to the other energy sources; and

performing a trimming operation to reduce the magnitude of the difference if any.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0285 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0387 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0334 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0477 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0075 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027621/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2011
From: JONES, PETER T.; MYERS, DAVID T.; MYERS, FRANKLIN P.; PAK, JIM D.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 026021/0687 →