IP Library › Granted Patent US 8,363,465
Granted Patent B2
US 8,363,465 · App. 13/041,104 · Granted Jan 29, 2013

High speed low power magnetic devices based on current induced spin-momentum transfer

Inventors: Andrew Kent (New York, NY); Daniel Stein (New York, NY); Jean-Marc Beaujour (Elmhurst, NY)
Assignee: New York University
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Quick Facts
Patent No.
US 8,363,465
App. No.
13/041,104
Granted
Jan 29, 2013
Kind
B2
Abstract

A high speed and low power method to control and switch the magnetization direction and/or helicity of a magnetic region in a magnetic device for memory cells using spin polarized electrical current. The mapetic device comprises a reference magnetic layer with a fixed magnetic helicity and/or magnetization direction and a free magnetic layer with a changeable magnetic helicity and/or magnetization direction. The fixed magnetic layer and the free magnetic layer are preferably separated by a non-magnetic layer. The fixed and free magnetic layers may have magnetization directions at a substantially nonzero angle relative to the layer normal. A current can be applied to the device to induce a torque that alters the magnetic state of the device so that it can act as a magnetic memory for writing information. The resistance, which depends on the magnetic state of the device, is measured to read out the information stored in the device.

Claims (12)

1. A method of making a magnetic layer for use in a magnetic memory device comprising the steps of:

providing a substrate with a substrate surface;

providing a deposition source;

providing a seed layer on the substrate surface;

depositing at least one layer of high magnetic anisotropy materials from the deposition source onto the seed layer at a substantially non-zero angle relative to a normal to the substrate surface; and

forming at least one ferromagnetic layer from the depositing step to create in the at least one ferromagnetic layer a magnetization vector substantially non-normal angle to a longitudinal axis of the at least one ferromagnetic layer.

2. The method of making a magnetic layer for use in a magnetic memory device of claim 1 , wherein the layer(s) of high magnetic anisotropy materials have thicknesses of 0.1 to 1.5 nm.

3. The method of making a magnetic layer for use in a magnetic memory device of claim 1 , wherein the seed layer comprises Ta, Pt, Ti, Cu or Ru or alloys thereof

4. The method of making a magnetic layer for use in a magnetic memory device of claim 1 , wherein the layer(s) of high magnetic anisotropy materials comprise Co, Ni, Pt, Fe or Pd or alloys thereof.

5. The method of making a magnetic layer for use in a magnetic memory device of claim 1 , wherein the layer(s) of high magnetic anisotropy materials comprise the LI, phase of FePt.

6. The method of making a magnetic layer for use in a magnetic memory device of claim 1 , wherein the deposition source comprises an evaporation source or a sputtering source.

7. The method as defined in claim 1 wherein the non-zero angle is established by varying angle of deposition between direction of deposition and the normal to the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2014
From: KENT, ANDREW; STEIN, DANIEL; BEAUJOUR, JEAN-MARC
To: NEW YORK UNIVERSITY
Reel/Frame 032906/0423 →
Continuity (6)
Division 12490588 · Jun 24, 2009
Continuation In Part 11932745 · Oct 31, 2007
Continuation In Part 11498303 · Aug 1, 2006
Continuation In Part 11250791 · Oct 13, 2005
Continuation 10643762 · Aug 19, 2003
Related Publication 20120103792A1 · May 3, 2012