Generating pulse parameters in a particle analyzer

1. A method of generating measurement parameters for a particle sample in a particle analyzer, comprising:

(a) interrogating the particle sample with interrogators respectively positioned along a length of an interrogation area, the interrogators comprising a triggering interrogator and one or more secondary interrogators;

(b) generating respective pulses based upon the interrogation of a first particle from the particle sample, wherein the pulses comprise a triggering pulse corresponding to the triggering interrogator and a secondary pulse corresponding to one of the secondary interrogators;

(c) determining a primary pulse detection window based upon the triggering pulse;

(d) determining a search interval to find the secondary pulse based upon factors including the primary pulse detection window and a velocity of the first particle;

(e) adjusting the search interval for variation in the velocity of the first particle dynamically based on the interrogation of the first particle;

(f) identifying the secondary pulse in the adjusted search interval; and

(g) processing the secondary pulse to determine a peak value of the secondary pulse.

2. The method of claim 1 , further comprising: (h) processing the secondary pulse to determine a pulse width value of the secondary pulse.

3. The method of claim 2 , wherein the pulse width value is a predetermined percentage of the peak value of the secondary pulse.

4. The method of claim 1 , wherein the adjusting step (e) comprises:

determining a size of adjustment based upon the interrogation of the first particle; and

increasing the search interval in proportion to the size of the adjustment.

5. The method of claim 1 , wherein the search interval comprises a secondary pulse detection window determined based upon factors including the primary pulse detection window and the velocity of the first particle, and wherein the adjusting step (e) comprises: identifying portions of the secondary pulse in the secondary pulse detection window; and expanding the search interval to include portions of the secondary pulse outside of the secondary pulse detection window.

6. The method of claim 5 , wherein a duration of the secondary pulse detection window substantially equals a duration of the primary pulse detection window plus a predetermined window extension.

7. The method of claim 5 , wherein processing the secondary pulse step (g) comprises: (i) determining an initial peak value for the secondary pulse based upon portions of the secondary pulse inside the secondary pulse detection window;

(ii) detecting the secondary pulse at a predetermined threshold of the initial peak value; and

(iii) repetitively storing a highest value detected for the secondary pulse.

8. The method of claim 7 , wherein steps (ii)-(iii) are performed during a reprocessing of the secondary pulse.

9. The method of claim 1 , wherein determining a search interval step (d) comprises:

determining a time of occurrence for the primary pulse detection window;

determining a laser delay between the triggering interrogator and the secondary interrogator; and

calculating a time of occurrence for the secondary pulse detection window based upon the time of occurrence for the primary pulse detection window and the laser delay.

10. The method of claim 9 , wherein the laser delay is determined based on a separation distance from the primary interrogator to the secondary interrogator and a velocity of the first particle.

11. The method of claim 9 , wherein the determining a search interval step (d) further comprises:

determining a duration of the primary pulse detection window; and

setting a duration of the secondary pulse detection window based on the duration of the primary pulse detection window.

12. The method of claim 11 , wherein the setting the duration of the secondary pulse detection window is further based on a predetermined window extension.

13. The method of claim 10 , wherein the distance is measured from the center of the primary pulse detection window.

14. The method of claim 1 , wherein step (c) comprises:

detecting a first and second position on the triggering pulse corresponding to a predetermined pulse threshold; and

determining the primary pulse detection window based upon the first and second positions.

15. The method of claim 1 , wherein the search interval comprises a secondary pulse detection window determined based upon factors including the primary pulse detection window and the velocity of the first particle, and wherein the adjusting step (e) comprises:

detecting characteristics of a perturbation signal applied to the first particle; and

shifting the secondary pulse detection window based upon factors including the primary pulse detection window and the characteristics of the perturbation signal.

16. The method of claim 15 , wherein the perturbation signal is applied at a nozzle through which the particle sample is passed, and wherein the nozzle is positioned before the interrogators.

17. The method of claim 15 , wherein the characteristics include a phase of the perturbation signal during which the signal is applied to the first particle.

18. The method of claim 17 , wherein the perturbation signal is a sine wave.

19. The method of claim 1 , further comprising:

(i) reporting the peak value of the secondary pulse.

20. A method of generating measurement parameters for a particle sample in a particle analyzer, comprising:

(a) interrogating the particle sample with interrogators respectively positioned along a length of an interrogation area, the interrogators comprising a triggering interrogator and one or more secondary interrogators;

(b) generating respective pulses based upon the interrogation of a first particle from the particle sample, wherein the pulses comprise a triggering pulse corresponding to the triggering interrogator and a secondary pulse corresponding to one of the secondary interrogators;

(c) determining a primary pulse detection window based upon the triggering pulse;

(d) determining a secondary pulse detection window based upon factors including the primary pulse detection window and a velocity of the first particle;

(e) detecting characteristics of a perturbation signal applied to the first particle;

(f) shifting the secondary pulse detection window based upon the characteristics of the perturbation signal;

(g) identifying the secondary pulse in an adjusted search interval; and

(h) processing the secondary pulse to determine measurement parameters of the secondary pulse.

21. A particle analyzer, comprising:

at least one processor;

a particle interrogator coupled to the at least one processor and configured to: interrogate a particle sample with interrogators respectively positioned along a length of a particle flow, the interrogators comprising a triggering interrogator and one or more secondary interrogators; and

generate respective pulses based upon the interrogation of a first particle from the particle sample, wherein the pulses comprise a triggering pulse corresponding to the triggering interrogator and a secondary pulse corresponding to one of the secondary interrogators; and

a pulse analyzer coupled to the at least one processor and comprising:

a primary pulse detection window creator configured to:

determine a primary pulse detection window based upon the triggering pulse;

a secondary pulse detection window creator configured to:

determine a search interval to find the secondary pulse based upon factors including the primary pulse detection window and a velocity of the first particle; and

adjust the search interval for variation in the velocity of the first particle dynamically based on the first particle; and

a secondary pulse parameter generator configured to:

identify, the secondary pulse in the adjusted search interval; and

process the secondary pulse to determine a peak value of the secondary pulse.

22. The apparatus of claim 21 , further comprising:

a data analyzer coupled to the at least one processor and configured to receive parameters from the pulse analyzer; and

a display coupled to the at least one processor.

23. The apparatus of claim 21 , wherein the search interval comprises a secondary pulse detection window determined based upon factors including the primary pulse detection window and the velocity of the first particle, and wherein the secondary pulse detection window creator is further configured to:

identify portions of the secondary pulse in the secondary pulse detection window; and

expand the search interval to include portions of the secondary pulse outside of the secondary pulse detection window.

24. The apparatus of claim 21 , wherein the search interval comprises a secondary pulse detection window determined based upon factors including the primary pulse detection window and the velocity of the first particle, and wherein the secondary pulse detection window creator is further configured to:

detect characteristics of a perturbation signal applied to the first particle; and

shift the secondary pulse detection window based upon factors including the primary pulse detection window and the characteristics of the perturbation signal.

25. A computer program product comprising a non-transitory computer usable medium having control logic stored therein for causing a computer to generate parameters for a particle sample with interrogators respectively positioned along a length of an interrogation area, the interrogators comprising a triggering interrogator and one or more secondary interrogators, said control logic comprising:

determining a primary pulse detection window based upon a triggering pulse;

determining a search interval to find the secondary pulse based upon factors including the primary pulse detection window and a velocity of the first particle;

adjusting the search interval for variation in the velocity of the first particle dynamically based on the first particle;

identifying the secondary pulse in the adjusted search interval; and

processing the secondary pulse to determine a peak value of the secondary pulse.