Anti-tamper mesh
An electronic device includes at least one terminal formed on the electronic device. The electronic device also includes at least one of a semiconductor device, an integrated circuit chip, and a computer. A seamless conductive mesh is formed on at least one surface of the electronic device. The conductive mesh is in electrical contact with the terminal. The terminal facilitates electrical conduction between the conductive mesh and an electrical detection circuit. The electronic device also may include a pattern having traces formed on at least two surfaces where each of the traces includes a continuous loop of conductive material is formed on at least two surfaces. The electronic device also may include a first plurality of conductive loops formed on the electronic device that are continuous and surround the electronic device in a first direction and a second plurality of conductive loops formed on the electronic device that are continuous and surround the electronic device in a second direction.
1. An electronic device, comprising:
at least one terminal formed on the electronic device, the electronic device comprising at least one of a semiconductor device, an integrated circuit chip, and a computer; and
a plurality of conductive mesh layers formed on at least one surface of the electronic device, wherein the plurality of conductive mesh layers are in electrical contact with the terminal, and wherein the terminal facilitates electrical conduction between the conductive mesh and an electrical detection circuit
wherein each of the plurality of conductive mesh layers comprises at least two layers of conductive patterns and a non-conductive layer formed between the at least two layers of conductive patterns.
2. The electronic device of claim 1 , wherein the seamless conductive mesh is formed of a curable polymeric material.
3. The electronic device of claim 1 , wherein the non-conductive layer comprises a dielectric material.
4. The electronic device of claim 3 , wherein the dielectric material has elastomeric properties.
5. The electronic device of claim 1 , wherein the electrical detection circuit is configured to detect a change in at least one of a resistance and a conductance of the conductive mesh.
6. The electronic device of claim 1 , wherein the electrical detection circuit is configured to detect a change in capacitance caused by a disruption of at least one of a conductive mesh layer and a non-conductive layer.
7. The electronic device of claim 1 , wherein the conductive mesh is arranged in one of a crisscross pattern, a crosshatch pattern, a serpentine pattern, a wave-like pattern, a comb pattern, a multi-comb pattern, and a random swirl pattern.
8. An electronic device, comprising:
a plurality of conductive pattern layers formed on at least two surfaces of the electronic device, the electronic device comprising at least one of a semiconductor device, an integrated circuit chip, and an electronic substrate, each of the plurality of conductive patterns comprising one or more than one conductive traces, each of the one or more than one conductive traces comprising a continuous loop of conductive material and being formed on at least two surfaces of the electronic device,
wherein a non-conductive layer is formed between adjacent layers of the plurality of conductive pattern layers.
9. The electronic device of claim 8 , further comprising a terminal formed on the electronic device, wherein the terminal facilitates electrical conduction between the one or more than one traces and an electrical detection circuit.
10. The electronic device of claim 9 , wherein the electrical detection circuit is configured to detect a change in at least one of a resistance and a conductance of the pattern.
11. The electronic device of claim 8 , wherein the non-conductive layer comprises a dielectric material.
12. The electronic device of claim 11 , wherein the dielectric material has elastomeric properties.
13. The electronic device of claim 8 , wherein the electrical detection circuit is configured to detect a change in capacitance caused by a disruption of at least one of the plurality of conductive pattern layers and a non-conductive layer.
14. An electronic device, comprising:
a first plurality of conductive loops formed on the electronic device, each of the first plurality of conductive loops continuous and surrounding the electronic device in a first direction, the electronic device comprising at least one of a semiconductor device, an integrated circuit chip, and an electronic substrate; and
a second plurality of conductive loops formed on the electronic device, each of the second plurality of conductive loops continuous and surrounding the electronic device in a second direction; and
a non-conductive layer formed between the first plurality of conductive loops and the second plurality of conductive loops.
15. The electronic device of claim 14 , wherein the first direction is different than the second direction.
16. The electronic device of claim 14 , further comprising a terminal formed on the electronic device, wherein the terminal facilitates electrical conduction between the first plurality of conductive loops, the second plurality of conductive loops, and an electrical detection circuit, wherein the electrical detection circuit is configured to detect a change in at least one of a resistance and a conductance of the pattern.
17. The electronic device of claim 14 , wherein the electrical detection circuit is configured to detect a change in capacitance caused by the disturbance of at least one of the first plurality of conductive loops, the second plurality of conductive loops, and the non-conductive layer.