Apparatus and method for multi-modal imaging in nonlinear raman microscopy

1. An apparatus for the microscopic examination of an object, with an illumination system that generates a first illumination light beam and a second illumination light beam,

a first polarization filter ( 28 ) that circularly polarizes the first illumination light beam,

a second polarization filter ( 32 ) that p-polarizes the second illumination light beam,

a modulator ( 34 ) for modulating the polarized second illumination light beam,

an excitation optical system that directs the two illumination light beams onto an object,

a detection optical system that directs detection light beams emanating from the object onto at least two detector units,

a first detector unit detecting a first nonlinear Raman effect and

a second detector unit detecting a second nonlinear Raman effect.

2. The apparatus according to claim 1 , with a third detector unit that detects a third nonlinear Raman effect.

3. The apparatus according to claim 1 , in which each time two of the three detector units simultaneously detect the respective nonlinear Raman effect.

4. The apparatus according to claim 1 , the components of which are arranged such that the detection light beams emitted in forward direction with respect to the illumination light beams and/or the detection light beams emitted in reverse direction are detected.

5. An apparatus for the microscopic examination of an object, with an illumination system that generates a first illumination light beam and a second illumination light beam,

a first polarization filter ( 28 ) that circularly polarizes the first illumination light beam,

a second polarization filter ( 32 ) that p-polarizes the second illumination light beam,

a modulator ( 34 ) for modulating the polarized second illumination light beam,

an excitation optical system that directs the two illumination light beams onto an object,

a detection optical system that directs detection light beams emanating from the object onto at least two detector units,

a first detector unit detecting a first nonlinear Raman effect and

a second detector unit detecting a second nonlinear Raman effect,

in which the first illumination light beam is a pump laser beam ( 21 ) and in which the second illumination light beam is a Stokes laser beam ( 31 ),

with a first wavelength-selective element ( 52 ) that directs a first wavelength range of the detection light beam, in which wavelengths of a Stokes emission or anti-Stokes emission lie, via a third polarization filter ( 54 ) that p-polarizes the light of the first wavelength range onto a first detector ( 56 ) that is sensitive in the first wavelength range,

a second wavelength-selective element ( 58 ) that separates a second wavelength range of the detection light beam, in which wavelengths of the pump laser beam ( 21 ) lie, from a third wavelength range, in which wavelengths of the Stokes laser beam ( 31 ) lie, and directs it onto a second detector ( 70 ) that is sensitive in the second wavelength range,

a fourth polarization filter ( 60 ) that p-polarizes the light of the second wavelength range before it is incident on the second detector ( 70 ),

a demodulator for demodulating the output signal of the second detector ( 70 ),

and with a fifth polarization filter ( 72 ) that s-polarizes the light of the third wavelength range that is directed onto a third detector ( 74 ) that is sensitive in the third wavelength range.

6. An apparatus for the microscopic examination of an object, with an illumination system that generates a first illumination light beam and a second illumination light beam,

a first polarization filter ( 28 ) that circularly polarizes the first illumination light beam,

a second polarization filter ( 32 ) that p-polarizes the second illumination light beam,

a modulator ( 34 ) for modulating the polarized second illumination light beam,

an excitation optical system that directs the two illumination light beams onto an object,

a detection optical system that directs detection light beams emanating from the object onto at least two detector units,

a first detector unit detecting a first nonlinear Raman effect and

a second detector unit detecting a second nonlinear Raman effect,

in which the first illumination light beam is a Stokes laser beam ( 31 ) and in which the second illumination light beam is a pump laser beam ( 21 ),

with a first wavelength-selective element ( 52 ) that directs a first wavelength range of the detection light beam, in which a Stokes emission or anti-Stokes emission lies, via a third polarization filter ( 54 ) that p-polarizes the light of the first wavelength range onto a first detector ( 56 ) that is sensitive in the first wavelength range,

a second wavelength-selective element ( 58 ) that separates a second wavelength range of the detection light beam, in which the wavelengths of the pump laser beam ( 21 ) lie, from a third wavelength range, in which wavelengths of the Stokes laser beam ( 31 ) lie, and directs it onto a fourth detector ( 76 ) that is sensitive in the third wavelength range,

a sixth polarization filter ( 62 ) that s-polarizes the light of the second wavelength range before it is incident on the fourth detector ( 76 ),

a seventh polarization filter ( 64 ) that p-polarizes the light of the third wavelength range directed onto a fifth detector ( 78 ) that is sensitive in the third wavelength range,

and with a demodulator for demodulating the output signal of the fifth detector ( 78 ).

7. A method for examining an object with a microscope,

in which a first illumination light beam is generated,

the first illumination light beam is circularly polarized,

a second illumination light beam is generated,

the second illumination light beam is p-polarized,

the two polarized illumination light beams ( 21 , 31 ) are directed onto the object via an excitation optical system,

and in which detection light beams emanating from the object are directed onto at least two detector units via a detection optical system,

wherein, when the second illumination light beam is not modulated, a first nonlinear Raman effect is detected with a first detector unit, and

a second nonlinear Raman effect is detected with a second detector unit.

8. The method according to claim 7 , in which the first and the second nonlinear Raman effect are detected simultaneously.

9. The method according to claim 7 , in which, when the second illumination light beam is modulated, a third nonlinear Raman effect is detected with a third detector unit.

10. The method according to claim 7 , in which the detection beams, starting out from the object, are detected in forward direction and/or in reverse direction with respect to the illumination beams.

11. A method for examining an object with a microscope,

in which a first illumination light beam is generated,

the first illumination light beam is circularly polarized,

a second illumination light beam is generated,

the second illumination light beam is p-polarized,

the two polarized illumination light beams ( 21 , 31 ) are directed onto the object via an excitation optical system,

and in which detection light beams emanating from the object are directed onto at least two detector units via a detection optical system,

wherein, when the second illumination light beam is not modulated, a first nonlinear Raman effect is detected with a first detector unit, and

a second nonlinear Raman effect is detected with a second detector unit,

in which the first illumination light beam is a pump laser beam ( 21 ) and in which the second illumination light beam is a Stokes laser beam ( 31 ),

and in which, when the Stokes laser beam ( 31 ) is not modulated,

radiation of a first wavelength range of the detection light beam, in which wavelengths of the Stokes emission or anti-Stokes emission emanating from the sample ( 48 ) lie, is p-polarized and directed onto a first detector ( 56 ) that is sensitive in the first wavelength range,

and radiation of a third wavelength range of the detection light beam, in which wavelengths of the Stokes laser beam ( 31 ) lie, is s-polarized and directed onto a third detector ( 74 ) that is sensitive in the third wavelength range.

12. The method according to claim 11 , in which, when the Stokes laser beam ( 31 ) is modulated,

radiation of the second wavelength range of the detection light beam is p-polarized and directed onto a second detector ( 70 ) that is sensitive in the second wavelength range,

an output signal of the second detector ( 70 ) is demodulated.

13. A method for examining an object with a microscope,

in which a first illumination light beam is generated,

the first illumination light beam is circularly polarized,

a second illumination light beam is generated,

the second illumination light beam is p-polarized,

the two polarized illumination light beams ( 21 , 31 ) are directed onto the object via an excitation optical system,

and in which detection light beams emanating from the object are directed onto at least two detector units via a detection optical system,

wherein, when the second illumination light beam is not modulated, a first nonlinear Raman effect is detected with a first detector unit, and

a second nonlinear Raman effect is detected with a second detector unit,

in which the first illumination light beam is a Stokes laser beam ( 31 ) and in which the second illumination light beam is a pump laser beam ( 21 ),

and in which, when the pump laser beam ( 21 ) is not modulated,

radiation of a first wavelength range of the detection light beam, in which wavelengths of the Stokes emission or anti-Stokes emission emanating from the sample lie, is p-polarized and directed onto a first detector ( 56 ) that is sensitive in the first wavelength range,

and in which radiation of a second wavelength range of the detection light beam, in which wavelengths of the pump laser beam ( 31 ) lie, is s-polarized and directed onto a fourth detector ( 76 ) that is sensitive in the second wavelength range.

14. The method according to claim 13 , and in which, when the pump laser beam ( 21 ) is modulated,

radiation of the third wavelength range of the detection light beam is p-polarized and directed onto a fifth detector ( 78 ) that is sensitive in the third wavelength range,

an output signal of the fifth detector ( 78 ) is demodulated.