Wafer edge inspection
View Patent ↗Wafer edge inspection approaches are disclosed wherein an imaging device captures at least one image of an edge of a wafer. The at least one image can be analyzed in order to identify an edge bead removal line. An illumination system having a diffuser can further be used in capturing images.
1. A method for inspecting a wafer, comprising:
positioning a wafer with respect to at least one imaging device;
altering a field of view of the at least one imaging device to define a plurality of different depths of field for the at least one imaging device with respect to the wafer;
capturing at least one color image of at least a portion of a wafer edge with the imaging device for each different depth of field;
analyzing the at least one color image for each different depth of field using a controller to identify a color signature corresponding to an edge bead removal line; and
modifying a wafer processing step based on the identification of the edge bead removal line.
2. The method of claim 1 wherein the image corresponds to a top surface of the edge of the wafer.
3. The method of claim 1 wherein the image corresponds to a surface normal to a top surface of the edge of the wafer.
4. The method of claim 1 and further comprising using an image fusion technique to concatenate images for each different depth of field.
5. The method of claim 1 and further comprising:
illuminating the wafer edge using at least one of brightfield illumination and darkfield illumination.
6. The method of claim 1 further comprising analyzing the at least one color image using multiple color regimes and correlating information from multiple color regimes to identify the edge bead removal line.
7. A method of performing wafer edge inspection, comprising:
providing a wafer having a top surface, a bottom surface and an edge normal surface positioned between the top and bottom surface;
altering a field of view for the at least one imaging device to define a plurality of different depths of field for the at least one imaging device with respect to the wafer;
capturing at least one grayscale image of the edge normal surface of the wafer using at least one imaging device for each different depth of field;
analyzing the at least one grayscale image of the edge normal surface for each different depth of field using a controller to identify an edge bead removal line formed on the wafer; and
modifying a wafer processing step based on the identification of the edge bead removal line.
8. The method of claim 7 and further comprising using an image fusion technique to concatenate images for each different depth of field.
9. The method of claim 7 and further comprising:
illuminating the wafer edge using at least one of brightfield illumination and darkfield illumination.
10. The method of claim 1 , wherein the at least one imaging device includes a lens defining an optical axis and altering the field of view includes moving the lens along the optical axis.
11. The method of claim 7 , wherein the at least one imaging device includes a lens defining an optical axis and altering the field of view includes moving the lens along the optical axis.