IP Library Granted Patent US 8,409,930
Granted Patent B2
US 8,409,930 · App. 13/071,741 · Granted Apr 2, 2013

Semiconductor device manufacturing method

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,409,930
App. No.
13/071,741
Granted
Apr 2, 2013
Kind
B2
Abstract

A BGA substrate which has a back surface to which a heat radiating plate is attached and an opening for accommodating a relay wiring substrate therein, which is provided in the center of its surface, is used. The relay wiring substrate to which an ASIC chip and a memory chip are flip-chip connected, is bonded to the heat radiating plate in the opening with a thermal conductive bonding material. Further, each of the back surfaces of the ASIC chip and the memory chip is connected to a metal cap for sealing the opening through a thermal conductive material interposed therebetween.

Claims (37)

1. A method for manufacturing a semiconductor device, comprising:

mounting a plurality of semiconductor chips over a relay wiring substrate by flip-chip connections;

bonding a heat radiating plate to a back surface of a main wiring substrate which has an opening therethrough;

bonding the relay wiring substrate equipped with the semiconductor chips to the heat radiating plate in the opening of the main wiring substrate using a bonding material having thermal conductivity;

connecting bonding wires between the relay wiring substrate and the main wiring substrate;

applying a thermal conductive material to each of back surfaces of the semiconductor chips; and

covering the opening of the main wiring substrate with a metal sealing plate, so that the metal sealing plate is connected to the semiconductor chips by the thermal conductive material.

2. The method for manufacturing a semiconductor device of claim 1 , wherein the semiconductor chips comprise a first chip that is an application specific integrated circuit (ASIC) chip and a second chip that is a memory chip.

3. The method for manufacturing a semiconductor device of claim 1 , wherein the thermal conductive material comprises thermal conductive grease.

4. The method for manufacturing a semiconductor device of claim 1 , wherein the thermal conductive material comprises thermal conductive gel.

5. The method for manufacturing a semiconductor device of claim 1 , further comprising disposing the main wiring substrate on a mounting board by soldering the metal sealing plate directly to a ground wire of the mounting board.

6. The method for manufacturing a semiconductor device of claim 1 , wherein the main wiring substrate is configured as a ball grid array substrate.

7. The method for manufacturing a semiconductor device of claim 1 , wherein the heat radiating plate comprises copper.

8. A method for manufacturing a semiconductor device, comprising:

mounting a plurality of semiconductor chips over a relay wiring substrate by flip-chip connections;

bonding a heat radiating plate to a back surface of a main wiring substrate which has an opening therethrough;

bonding the relay wiring substrate equipped with the semiconductor chips to the heat radiating plate in the opening of the main wiring substrate using a bonding material having thermal conductivity;

connecting bonding wires between the relay wiring substrate and the main wiring substrate;

filling the opening of the main wiring substrate with a thermal conductive material; and

covering the opening of the main wiring substrate with a metal sealing plate.

9. The method for manufacturing a semiconductor device of claim 8 , wherein the semiconductor chips comprise a first chip that is an application specific integrated circuit (ASIC) chip and a second chip that is a memory chip.

10. The method for manufacturing a semiconductor device of claim 8 , wherein the thermal conductive material comprises thermal conductive resin.

11. The method for manufacturing a semiconductor device of claim 8 , wherein the thermal conductive material comprises thermal conductive oil.

12. The method for manufacturing a semiconductor device of claim 8 , further comprising disposing the main wiring substrate on a mounting board by soldering the metal sealing plate directly to a ground wire of the mounting board.

13. The method for manufacturing a semiconductor device of claim 8 , wherein the main wiring substrate is configured as a ball grid array substrate.

14. The method for manufacturing a semiconductor device of claim 8 , wherein the heat radiating plate comprises copper.

15. A method for manufacturing a semiconductor device, comprising:

mounting a plurality of semiconductor chips over a relay wiring substrate by flip-chip connections;

bonding a heat radiating plate to a back surface of a main wiring substrate which has an opening therethrough;

bonding the relay wiring substrate equipped with the semiconductor chips to the heat radiating plate in the opening of the main wiring substrate using a bonding material having thermal conductivity;

connecting bonding wires between the relay wiring substrate and the main wiring substrate; and

attaching a metal sealing plate to the main wiring substrate to cover the opening and so that the metal sealing plate is in thermal contact with the semiconductor chips via a thermal conductive material.

16. The method for manufacturing a semiconductor device of claim 15 , wherein the thermal conductive material is disposed only as substantially sandwiched between the metal sealing plate and the semiconductor chips.

17. The method for manufacturing a semiconductor device of claim 16 , wherein the thermal conductive material is one of thermal conductive grease and thermal conductive gel.

18. The method for manufacturing a semiconductor device of claim 15 , wherein the opening is filled with the thermal conductive material.

19. The method for manufacturing a semiconductor device of claim 18 , wherein the thermal conductive material comprises one of thermal conductive resin and thermal conductive oil.

20. The method for manufacturing a semiconductor device of claim 15 , further comprising disposing the main wiring substrate on a mounting board by soldering the metal sealing plate directly to a ground wire of the mounting board.

Assignments (3)
CHANGE OF NAME Recorded Aug 29, 2014
From: OKI SEMICONDUCTOR CO., LTD.
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 033639/0817 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2014
From: TERUI, MAKOTO; SHIRAISHI, YASUSHI
To: OKI ELECTRIC INDUSTRY CO., LTD.
Reel/Frame 033630/0090 →
CHANGE OF NAME Recorded Aug 28, 2014
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 033630/0118 →