IP Library Granted Patent US 8,114,699
Granted Patent B2
US 8,114,699 · App. 13/072,879 · Granted Feb 14, 2012

Integration manufacturing process for MEMS device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,114,699
App. No.
13/072,879
Granted
Feb 14, 2012
Kind
B2
Abstract

A method for manufacturing an MEMS device is provided. The method includes steps of a) providing a first substrate having a concavity located thereon, b) providing a second substrate having a connecting area and an actuating area respectively located thereon, c) forming plural microstructures in the actuating area, d) mounting a conducting element in the connecting area and the actuating area, e) forming an insulating layer on the conducting element and f) connecting the first substrate to the connecting area to form the MEMS device. The concavity contains the plural microstructures.

Claims (10)

1. A method for manufacturing a resonance device, comprising:

a) manufacturing a cover having a concavity;

b) providing a substrate;

c) locating plural microstructures on said substrate, wherein said plural microstructures comprise one non-testing microstructure and one testing element which is distinct from the non-testing microstructure;

d) locating a conducting element on said substrate for controlling said plural microstructures; and

e) packaging the plural microstructures in a vacuum by placing the cover over the plural microstructures to form said resonance device, wherein said concavity contains said testing element.

2. The method as claimed in claim 1 , wherein said step e) is performed by connecting said cover and said substrate.

3. The method as claimed in claim 1 , wherein said resonance device is an MEMS device.

4. The method as claimed in claim 1 , further comprising testing one or more properties of said resonance device using said testing element.

5. The method as claimed in claim 4 , wherein the one or more properties include a resonance frequency, a scanning angle, or a quality factor.

Assignments (3)
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2017
From: GREDMANN TAIWAN LTD.
To: TESSERA ADVANCED TECHNOLOGIES, INC.
Reel/Frame 044442/0960 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2014
From: WALSIN LIHWA CORPORATION
To: GREDMANN TAIWAN LTD.
Reel/Frame 033017/0228 →