Scanning focal length metrology
View Patent ↗An optical metrology system collects data while scanning over the focal range. The data is evaluated to determine a peak intensity value from the data. In one embodiment, only data from one side of the peak value is used. The characteristic of the sample is determined based on the peak value. In one embodiment, monochromatic light is used. In another embodiment, polychromatic light is used and peak intensity values for a plurality of wavelengths are determine and combined to form a measured spectrum for the sample, which can then be used to determine the sample properties of interest. In one embodiment, the peak intensity is determined using curve fitting.
1. A method of measuring a characteristic of a sample using light that interacts with the sample and is detected from which data is collected, the method comprising:
collecting data from the sample at a plurality of focal positions;
determining a peak value based on the collected data from only one side of the peak value; and
determining the characteristic of the sample based on the peak value.
2. The method of claim 1 , wherein the light is polychromatic light, the collected data is spectral data, and determining a peak value comprises determining a peak value for each of a plurality of wavelengths in the polychromatic light based on the collected spectral data, the method further comprising generating a spectrum using the determined peak value for each of the plurality of wavelengths, and wherein determining the characteristic of the sample based on the peak value comprises determining the characteristic of the sample based on the generated spectrum.
3. The method of claim 2 , wherein each peak value is a peak intensity value.
4. The method of claim 2 , wherein each peak value is determined using at least one of curve fitting and a statistical analysis.
5. The method of claim 2 , wherein each peak value is determined using the maximum measured value, and a statistical analysis.
6. The method of claim 2 , wherein collecting spectral data from the sample at a plurality of focal positions comprises storing a plurality of data points for each wavelength, wherein determining a peak value for each of a plurality of wavelengths comprises using different numbers of data points for at least two different wavelengths.
7. The method of claim 2 , the spectral data is collected using an optical system having color dispersive characteristics.
8. The method of claim 7 , wherein the optical system having color dispersive characteristics comprises at least one of a refractive objective lens and a diffractive optical element.
9. The method of claim 2 , wherein collecting spectral data from the sample at a plurality of focal positions in the range of focal positions for the polychromatic light comprises varying a distance along an optical path between the sample and at least one component in an optical system used to collect the spectral data.
10. The method of claim 2 , wherein the spectral data includes intensity values.
11. The method of claim 2 , further comprising storing or displaying the determined characteristic of the sample.
12. The method of claim 1 , wherein the collected data includes data on both sides of the peak value.
13. The method of claim 1 , wherein the peak value is determined by curve fitting.
14. The method of claim 13 , further comprising calibrating the shape of the curve prior to curve fitting.
15. A method of measuring a characteristic of a sample using monochromatic light that interacts with the sample and is detected from which data is collected, the method comprising: collecting data from the sample using the monochromatic light at a plurality of focal positions; determining a peak value based on the collected data; and determining the characteristic of the sample based on the peak value, wherein the collected data includes data from only one side of the peak value.
16. The method of claim 15 , wherein each peak value is a peak intensity value.
17. The method of claim 15 , wherein each peak value is determined using at least one of curve fitting and a statistical analysis.
18. The method of claim 15 , wherein each peak value is determined using the maximum measured value, and a statistical analysis.
19. The method of claim 15 , wherein the collected data includes data on both sides of the peak value.
20. The method of claim 15 , wherein the peak value is determined by curve fitting.
21. The method of claim 20 , further comprising calibrating the shape of the curve prior to curve fitting.