IP Library Granted Patent US 9,059,143
Granted Patent B2
US 9,059,143 · App. 13/075,890 · Granted Jun 16, 2015

Semiconductor device

Inventors: Yukari Imaizumi (Kanagawa, JP); Goshi Kawazu (Kanagawa, JP); Isao Kudo (Kanagawa, JP); Akio Katsumata (Kanagawa, JP); Yoichi Hiruta (Oita, JP)
Assignee: J-DEVICES CORPORATION
H01L23/4334H01L23/3128H01L24/16H01L24/29H01L24/30H01L24/32H01L24/45H01L24/48H01L24/73H01L25/0655H01L25/0657H01L2224/16145H01L2224/29036H01L2224/291H01L2224/2919H01L2224/30505H01L2224/32225H01L2224/32245H01L2224/45144H01L2224/45147H01L2224/48227H01L2224/73204H01L2224/73207H01L2224/73253H01L2224/73265H01L2225/0651H01L2225/06513H01L2225/06589H01L2924/15311H01L2924/01019H01L2924/01079H01L2924/01014H01L2224/32145H01L2924/3011H01L2924/01047
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Quick Facts
Patent No.
US 9,059,143
App. No.
13/075,890
Granted
Jun 16, 2015
Kind
B2
Abstract

A semiconductor device which includes a substrate, a semiconductor element arranged on the substrate, a heat dissipation component arranged on the semiconductor element, and a mold component covering an upper part of the substrate, the semiconductor element and the heat dissipation component, wherein an area of a surface on the semiconductor element of the heat dissipation component is larger than an area of a surface on which the heat dissipation component of the semiconductor element is arranged.

Claims (21)

1. A semiconductor device comprising:

a substrate;

a semiconductor element arranged on the substrate;

a spacer arranged on the semiconductor element by an adhesive;

a mold component covering an upper part of the substrate, the semiconductor element and the spacer and

a heat dissipation component arranged on the spacer, only on one side of the semiconductor element, and buried in the mold component, the heat dissipation component being a metal material,

wherein an area of a surface of the heat dissipation component is larger than an area of a surface of the semiconductor element on which the spacer is arranged.

2. The semiconductor device according to claim 1 , wherein the heat dissipation component includes one or a plurality of stacked parts.

3. The semiconductor device according to claim 2 , wherein a surface of the heat dissipation component which is arranged on the spacer is not flat.

4. The semiconductor device according to claim 1 , wherein the adhesive is a first adhesive and wherein the heat dissipation component is fixed on the spacer by a second adhesive.

5. The semiconductor device according to claim 4 , wherein the second adhesive is grease, a thermal interface material or a paste.

6. The semiconductor device according to claim 5 , wherein a surface of the heat dissipation component which is arranged on the spacer is not flat.

7. The semiconductor device according to claim 4 , wherein a surface of the heat dissipation component which is arranged on the spacer is not flat.

8. The semiconductor device according to claim 1 , wherein the adhesive is a first adhesive and wherein the spacer is fixed on another semiconductor element which is stacked on the semiconductor element by a second adhesive.

9. The semiconductor device according to claim 8 , wherein the second adhesive is grease, a thermal interface material or a paste.

10. The semiconductor device according to claim 9 , wherein a surface of the heat dissipation component which is arranged on the semiconductor element includes bumps.

11. The semiconductor device according to claim 9 , wherein a surface of the heat dissipation component which is arranged on the semiconductor element includes slits or holes.

12. The semiconductor device according to claim 8 , wherein a surface of the heat dissipation component which is arranged on the spacer is not flat.

13. The semiconductor device according to claim 1 , wherein the adhesive is grease, a thermal interface material or a paste.

14. The semiconductor device according to claim 1 , wherein a surface of the heat dissipation component which is arranged on the spacer is not flat.

15. The semiconductor device according to claim 1 , wherein the heat dissipation component is embedded by the mold component.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY NAME PREVIOUSLY RECORDED AT REEL: 53597 FRAME: 184. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 5, 2021
From: J-DEVICES CORPORATION
To: AMKOR TECHNOLOGY JAPAN, INC.
Reel/Frame 055605/0060 →
CHANGE OF NAME Recorded Aug 25, 2020
From: J-DEVICES CO., LTD.
To: AMKOR TECHNOLOGY JAPAN, INC.
Reel/Frame 053597/0184 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2014
From: TOSHIBA CORPORATION
To: J-DEVICES CORPORATION
Reel/Frame 034606/0146 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2011
From: IMAIZUMI, YUKARI; KAWAZU, GOSHI; KUDO, ISAO; KATSUMATA, AKIO; HIRUTA, YOICHI
To: J-DEVICES CORPORATION; TOSHIBA CORPORATION
Reel/Frame 026451/0052 →
Priority Claims (1)
JP 2010-169574 · Jul 28, 2010 · national
Continuity (1)
Related Publication 20120025367A1 · Feb 2, 2012