IP Library Granted Patent US 8,592,291
Granted Patent B2
US 8,592,291 · App. 13/081,762 · Granted Nov 26, 2013

Fabrication of large-area hexagonal boron nitride thin films

Inventors: Yumeng Shi (Cambridge, MA); Jing Kong (Winchester, MA); Christoph Hamsen (Hamm, DE); Lain-Jong Li (Hsinchu, TW)
Assignee: Massachusetts Institute of Technology
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Quick Facts
Patent No.
US 8,592,291
App. No.
13/081,762
Granted
Nov 26, 2013
Kind
B2
Abstract

A hexagonal boron nitride thin film is grown on a metal surface of a growth substrate and then annealed. The hexagonal boron nitride thin film is coated with a protective support layer and released from the metal surface. The boron nitride thin film together with the protective support layer can then be transferred to any of a variety of arbitrary substrates.

Claims (25)

1. A method for fabricating a hexagonal boron nitride film, comprising:

providing a growth substrate including a metal surface;

growing a hexagonal boron nitride film on the metal surface;

annealing the hexagonal boron nitride film;

coating the hexagonal boron nitride film with a protective support layer; and

releasing the whole hexagonal boron nitride film together with the protective support layer from the metal surface.

2. The method of claim 1 , wherein the hexagonal boron nitride film is deposited on the metal surface via chemical vapor deposition at a temperature less than 400° C.

3. The method of claim 2 , wherein the chemical vapor deposition is carried out at ambient pressure.

4. The method of claim 2 , wherein the chemical vapor deposition is carried out at a pressure of at least about 50 kPa.

5. The method of claim 1 , wherein the hexagonal boron nitride film is annealed at a temperature in a range from about 900° C. to about 1100° C.

6. The method of claim 1 , further comprising applying the hexagonal boron nitride film and the protective support layer coating to a target substrate.

7. The method of claim 6 , further comprising removing the protective support layer from the hexagonal boron nitride film after application to the target substrate.

8. The method of claim 7 , further comprising doping at least one region of the hexagonal boron nitride film to produce at least one p- or n-type region for a device.

9. The method of claim 7 , further comprising intercalating at least one other type of molecule into the hexagonal boron nitride film.

10. The method of claim 1 , wherein the metal surface comprises at least one of nickel, platinum, copper, ruthenium, iron, cobalt, and molybdenum.

11. The method of claim 10 , wherein the metal surface comprises nickel.

12. The method of claim 10 , wherein the growth substrate comprises silicon with a silica surface coating, and wherein the metal surface is formed over the silica surface coating.

13. The method of claim 10 , further comprising providing the metal surface on the growth substrate via a deposition method selected from evaporation, sputtering and electro-chemical deposition.

14. The method of claim 13 , further comprising patterning the metal surface via lithography.

15. The method of claim 1 , wherein the hexagonal boron nitride film is deposited on the metal surface via chemical vapor deposition using a precursor selected from at least one of borazine and B-trichloroborazine ((ClBNH) 3 ).

16. The method of claim 15 , wherein the precursor is borazine and the hexagonal boron nitride film is formed when the borazine contacts the metal surface at a temperature of about 400° C. and dehydrogenates.

17. The method of claim 15 , further comprising annealing the hexagonal boron nitride film at or above 1000° C. on the metal surface.

18. The method of claim 1 , wherein the protective support layer comprises at least one of polymethylmethacrylate, polydimethylsiloxane, polyethylene terephthalate, and polyethylene naphthalate.

19. The method of claim 1 , wherein the metal surface is etched to release the hexagonal boron nitride film and the protective support layer.

20. The method of claim 19 , wherein the hexagonal boron nitride film has a thickness of 1 nm to 50 nm and covers an area of at least about 1 cm 2 .

Assignments (2)
CONFIRMATORY LICENSE Recorded Aug 6, 2012
From: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 028726/0965 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2011
From: SHI, YUMENG; KONG, JING; HAMSEN, CHRISTOPH; LI, LAIN-JONG
To: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
Reel/Frame 026533/0528 →
Continuity (2)
Provisional Application 61321710 · Apr 7, 2010
Related Publication 20110256386A1 · Oct 20, 2011