IP Library › Granted Patent US 8,902,702
Granted Patent B2
US 8,902,702 · App. 13/087,387 · Granted Dec 2, 2014

Methods and apparatus to image subsurface formation features

Inventors: Nobuyasu Hirabayashi (Yokohama, JP); Kentaro Torii (Sagamihara, JP); Hiroaki Yamamoto (Kamakura, JP); Jakob Haldorsen (Nesbru, NO); Arne Voskamp (Beijing, CN)
Assignee: Schlumberger Technology Corporation
G01V1/42G01V1/284
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Quick Facts
Patent No.
US 8,902,702
App. No.
13/087,387
Granted
Dec 2, 2014
Kind
B2
Abstract

Methods of and apparatus to image one or more subsurface formation features are disclosed. An example method includes generating acoustic waves with a transmitter and receiving the acoustic waves and acoustic data contained therein at one or more receivers. The example method also includes extracting one or more S-S, P-S or S-P reflected waveform data from the acoustic data, estimating a dip of the one or more subsurface formation features, migrating the one or more S-S, P-S or S-P reflected waveform data with the estimated dip and mapping the migrated one or more S-S, P-S or S-P reflected waveform data. In addition, the example method includes identifying one or more permeable subsurface formation features using the mapped migrated one or more S-S, P-S or S-P reflected waveform data.

Claims (46)

1. A method of acoustic subsurface imaging, the method comprising:

generating acoustic waves with a downhole acoustic transmitter;

receiving the acoustic waves and acoustic data contained therein at one or more downhole acoustic receivers;

filtering for one or more S-S, P-S or S-P reflected waveform data from the acoustic data;

estimating a dip of the one or more S-S, P-S or S-P reflected waveform data;

migrating the one or more S-S P-S or S-P reflected waveform data with the estimated dip;

mapping the migrated one or more S-S, P-S or S-P reflected waveform data; and

identifying one or more permeable subsurface karst caves using the mapped migrated one or more S-S, P-S or S-P reflected waveform data.

2. A method as defined in claim 1 wherein the one or more karst caves align along the dip.

3. A method as defined in claim 2 wherein a set of karst caves aligning along the dip indicates a fracture.

4. A method as defined in claim 1 wherein the one or more permeable subsurface karst caves have at least one of strong S-S reflectivity, P-S reflectivity or S-P reflectivity.

5. A method as defined in claim 1 further comprising migrating the one or more S-S, P-S or S-P reflected waveform data with an established coordinate system.

6. A method as defined in claim 5 wherein the coordinate system includes a first axis defined in the direction of a borehole and a second axis perpendicular to the first axis and perpendicular to a strike of one of the permeable subsurface karst caves.

7. A method as defined in claim 1 further comprising migrating the one or more S-S P-S or S-P reflected waveform data with a relative dip angle between a well and the dip of the one or more subsurface formation features.

8. A method as defined in claim 1 further comprising migrating the one or more S-S, P-S or S-P reflected waveform data with a dip aperture that is about five degrees or less.

9. A method as defined in claim 1 further comprising migrating the one or more S-S, P-S or S-P reflected waveform data with common-depth-point mapping.

10. A method as defined in claim 1 further comprising filtering the data in the common offset domain with one or more of a median filter or a velocity filter.

11. An apparatus for acoustic subsurface imaging, the apparatus comprising:

one or more downhole acoustic transmitters to generate acoustic waves;

one or more downhole acoustic receivers to sense the acoustic waves and acoustic data contained therein;

a filter to extract one or more S-S, P-S or S-P reflected waveform data from the acoustic data; and

a processor configured to:

estimate a dip of the one or more S-S, P-S or S-P reflected waveform data,

migrate the one or more S-S, P-S or S-P reflected waveform data with the estimated dip;

map the migrated one or more S-S, P-S or S-P reflected waveform data; and

identify one or more permeable subsurface karst caves based on the map of the migrated one or more S-S, P-S or S-S reflected waveform data and at least one resistivity image.

12. An apparatus as defined in claim 11 wherein the one or more karst caves align along the dip.

13. An apparatus as defined in claim 12 wherein a set of karst caves aligning along the dip indicates a fracture.

14. An apparatus as defined in claim 11 wherein the processor is further configured to distinguish the one or more permeable subsurface karst caves from a crack in a borehole wall by comparing the at least one resistivity image to the map of the migrated one or more S-S, P-S or S-S reflected waveform data.

15. An apparatus as defined in claim 11 wherein the processor is further configured to distinguish the one or more permeable subsurface karst caves from a change in a borehole diameter by comparing the at least one resistivity image to the map of the migrated one or more S-S, P-S or S-S reflected waveform data.

16. An apparatus as defined in claim 11 wherein the one or more permeable subsurface karst caves have at least one of strong S-S reflectivity, P-S reflectivity or S-P reflectivity.

17. An apparatus as defined in claim 11 wherein the processor is further configured to migrate the one or more S-S, P-S or S-P reflected waveform data with an established coordinate system.

18. An apparatus as defined in claim 17 wherein the coordinate system includes a first axis defined in the direction of a borehole and a second axis perpendicular to the first axis and perpendicular to a strike of one of the permeable subsurface karst caves.

19. An apparatus as defined in claim 11 wherein the processor is further configured to migrate the one or more S-S, P-S or S-P reflected waveform data with a relative dip angle between a well and the dip of the one or more S-S, P-S or S-P reflected waveform data.

20. An apparatus as defined in claim 11 wherein the processor is further configured to migrate the one or more S-S, P-S or S-P reflected waveform data with a dip aperture that is about five degrees or less.

21. An apparatus as defined in claim 11 wherein the processor is further configured to migrate the one or more S-S, P-S or S-P reflected waveform data with common-depth-point mapping.

22. An apparatus as defined in claim 11 wherein the filter or a second filter is to filter the data in the common offset domain with one or more of a median filter or a velocity filter.

23. A method for imaging subsurface karst caves, the method comprising:

receiving acoustic waves at one or more depths of a borehole traversing a subsurface formation, the formation having a strike and a dip;

recording waveform data based on the acoustic waves; filtering to extract one or more S-S, P-S or S-P reflected waveform from the recorded waveform data;

processing the one or more S-S, S-P or P-S reflected waveform data to determine one or more an S-S, P-S or S-P reflection point for a feature of interest; and

imaging the subsurface karst caves using the one or more S-S, P-S or S-P reflection point,

wherein the processing includes:

providing a coordinate system having a first axis along the borehole, a second axis perpendicular to the first axis and the strike, and a relative dip angle between the borehole and the dip; and

performing a migration of the one or more S-S, P-S or S-P reflected waves by using at least one of a narrow dip aperture around the relative dip angle or a common depth point transform for the relative dip angle.

24. The method of claim 23 , wherein the S-S reflected waves appear more dominant in the waveform data than each of the P-P reflected waves, the P-S reflected waves and the S-P reflected waves.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 16, 2011
From: HIRABAYASHI, NOBUYASU; TORII, KENTARO; YAMAMOTO, HIROAKI; HALDORSEN, JAKOB; VOSKAMP, ARNE
To: SCHLUMBERGER TECHNOLOGY CORPORATION
Reel/Frame 026277/0326 →
Continuity (2)
Provisional Application 61324759 · Apr 16, 2010
Related Publication 20110255370A1 · Oct 20, 2011