IP Library Granted Patent US 8,416,216
Granted Patent B2
US 8,416,216 · App. 13/092,166 · Granted Apr 9, 2013

Method and system for touch sensor interface fault detection

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Quick Facts
Patent No.
US 8,416,216
App. No.
13/092,166
Granted
Apr 9, 2013
Kind
B2
Abstract

A touch sensor interface includes one or more touch detection electrodes whose capacitance increases when touched. A processor converts the increase in capacitance into a change in a counter value. A detector compares the change in the counter value with one or more count thresholds to detect faults in the touch sensor interface.

Claims (32)

1. A system for detecting one or more faults in a touch sensor interface, the touch sensor interface comprising one or more touch detection electrodes for sensing a touch event, the system comprising:

a first oscillator, connected to at least one of the touch detection electrodes, for generating a first periodic signal based on the capacitance of the at least one touch detection electrode;

a prescaler, connected to the first oscillator, for reducing the frequency of the first periodic signal by a predetermined value to generate a second periodic signal;

a counter, connected to the prescaler, for receiving the second periodic signal and a third periodic signal, wherein the frequency of the third periodic signal is greater than the frequency of the second periodic signal, wherein the counter is updated for a count time window equal to the time period of the second periodic signal, and wherein the counter is updated for a plurality of counts based on the frequency of the third periodic signal; and

a fault and touch detector, connected to the counter, for detecting the one or more faults by calculating a difference between the plurality of counts corresponding to the count time window and a previous plurality of counts corresponding to a previous count time window and comparing the calculated difference with one or more count thresholds.

2. The fault detection system of claim 1 , further comprising at least one shared input/output (I/O) pad, connected to the at least one touch detection electrode, for receiving an input signal provided to the touch sensor interface and for transmitting an output signal to the touch sensor interface.

3. The fault detection system of claim 2 , wherein the at least one shared I/O pad receives and transmits one or more touch sensing signals from the at least one touch detection electrode to the first oscillator.

4. The fault detection system of claim 3 , further comprising at least one communication channel, connected to the at least one shared I/O pad and the first oscillator, for transmitting the one or more touch sensing signals between the at least one shared I/O pad and the first oscillator.

5. The fault detection system of claim 1 , further comprising a second oscillator, connected to the counter, for generating the third periodic signal.

6. The fault detection system of claim 5 , further comprising a programmable current source, connected to the first and second oscillators, for providing a first current to the first oscillator and a second current to the second oscillator.

7. The fault detection system of claim 1 , wherein the one or more faults comprise at least one of a PCB trace open fault, a PCB trace short fault, a touch detection electrode leakage fault, a software configuration fault, and a communication channel short fault.

8. The fault detection system of claim 7 , wherein the one or more count thresholds correspond to at least one of the PCB trace open fault, the PCB trace short fault, the touch detection electrode leakage fault, and the software configuration fault.

9. A touch sensor interface, comprising:

at least one touch detection electrode for sensing a touch event;

at least one shared input/output (I/O) pad, connected to the at least one touch detection electrode, for receiving and transmitting one or more touch sensing signals from the at least one touch detection electrode, wherein the at least one shared I/O pad receives an input signal provided to the touch sensor interface and transmits an output signal to the touch sensor interface;

at least one communication channel, connected to the at least one shared I/O pad, for receiving the one or more touch sensing signals from the at least one shared I/O pad;

a first oscillator, connected to the at least one communication channel, for generating a first periodic signal based on the capacitance of the at least one touch detection electrode;

a prescaler, connected to the first oscillator, for reducing the frequency of the first periodic signal by a predetermined value to generate a second periodic signal;

a counter, connected to the prescaler, for receiving the second periodic signal and a third periodic signal, wherein the third periodic signal is generated by a second oscillator, wherein the frequency of the third periodic signal is greater than the frequency of the second periodic signal, wherein the counter is updated for a count time window equal to the time period of the second periodic signal, and wherein the counter is updated for a plurality of counts based on the frequency of the third periodic signal;

a programmable current source, connected to the first and second oscillators, for providing a first current to the first oscillator and a second current to the second oscillator; and

a fault and touch detector, connected to the counter, for detecting the one or more faults by calculating a difference between the plurality of counts corresponding to the count time window and a previous plurality of counts corresponding to a previous count time window and comparing the calculated difference with one or more count thresholds.

10. The touch sensor interface of claim 9 , wherein each touch detection electrode comprises one or more printed circuit board (PCB) traces.

11. The touch sensor interface of claim 9 , wherein the one or more faults comprise at least one of a PCB trace open fault, a PCB trace short fault, a touch detection electrode leakage fault, a software configuration fault, and a communication channel short fault.

12. The touch sensor interface of claim 11 , wherein the one or more count thresholds correspond to at least one of the PCB trace open fault, the PCB trace short fault, the touch detection electrode leakage fault, and the software configuration fault.

13. A method for detecting one or more faults in a touch sensor interface, the touch sensor interface comprising at least one touch detection electrode for sensing a touch event, the method comprising:

generating a first periodic signal based on the capacitance of the at least one touch detection electrode;

reducing the frequency of the first periodic signal by a predetermined value to generate a second periodic signal;

updating a counter based on the second periodic signal and a third periodic signal, wherein the frequency of the third periodic signal is greater than the frequency of the second periodic signal, wherein the counter is updated for a count time window equal to the time period of the second periodic signal, wherein the counter is updated for a plurality of counts based on the frequency of the third periodic signal;

calculating a difference between the plurality of counts corresponding to the count time window and a previous plurality of counts corresponding to a previous count time window; and

comparing the calculated difference with one or more count thresholds to detect the one or more faults in the touch sensor interface.

14. The method for detecting one or more faults of claim 13 , wherein the one or more faults comprise at least one of a PCB trace open fault, a PCB trace short fault, a touch detection electrode leakage fault, a software configuration fault, and a communication channel short fault.

15. The method for detecting one or more faults of claim 14 , wherein the one or more count thresholds correspond to at least one of the PCB trace open fault, the PCB trace short fault, the touch detection electrode leakage fault, and the software configuration fault.

Assignments (24)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Aug 17, 2016
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To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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SECURITY AGREEMENT Recorded Nov 6, 2013
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