System for performing electrical characterization of asynchronous integrated circuit interfaces
View Patent ↗An integrated circuit with a single-channel input/output (I/O) interface and a multi-channel I/O interface includes functional circuits that operate in different clock domains and a test circuit. For a single-channel I/O interface, the test circuit simulates read/write operations by bypassing the functional circuits and performs electrical characterization of the single-channel I/O interface. For a multi-channel I/O interface, the test circuit configures a plurality of channels of the multi-channel interface in a half-duplex mode and performs electrical characterization using data loop back by bypassing the functional circuits.
1. An integrated circuit, comprising:
a plurality of functional circuits including a first functional circuit and a second functional circuit;
a plurality of input/output (I/O) pads coupled to the plurality of functional circuits;
a plurality of single-channel I/O interfaces for performing one or more read/write operations to the integrated circuit by way of the first and second functional circuits;
a capture flip-flop for capturing data at the plurality of single-channel I/O interfaces; and
a test circuit for performing electrical characterization of the plurality of single-channel I/O interfaces, wherein the test circuit includes at least one of an address register, a command register and a data register for simulating the one or more read/write operations, and wherein the test circuit is configured for:
simulating the one or more read/write operations by way of the at least one of the address register, the command register and the data register, such that the read/write operations bypass the first and the second functional circuits, and driving data from the data register to at least one of the plurality of single-channel I/O interfaces in order to perform transmit channel electrical characterization;
configuring a first single-channel interface in an input mode for receiving test data from an external tester, capturing the test data by way of the capture flip-flop, wherein the capture flip-flop samples the test data, and driving the sampled test data to at least one of the plurality of I/O pads in order to perform receive channel electrical characterization.
2. The integrated circuit of claim 1 , wherein the test circuit further comprises a comparator for comparing the captured test data with predetermined test data to determine data accuracy.
3. The integrated circuit of claim 1 , wherein the test circuit further comprises a memory module for storing a set of pre-programmed values for simulating the one or more read/write operations.
4. The integrated circuit of claim 1 , wherein the first functional circuit operates in a first clock domain and the second functional circuit operates in a second clock domain.
5. The integrated circuit of claim 4 , further comprising a bypass clock circuit for receiving clock signals from the first and second clock domains and generating a bypass clock signal, wherein the bypass clock signal synchronizes the operations of the first and second functional circuits.
6. The integrated circuit of claim 5 , wherein the bypass clock signal drives the test circuit.
7. The integrated circuit of claim 4 , wherein a clock signal from the first clock domain drives the second functional circuit.
8. The integrated circuit of claim 1 , further comprising a launch flip-flop for driving data from the data register to the at least one of the plurality of single-channel I/O interfaces.
9. The integrated circuit of claim 1 , wherein the at least one of the plurality of single-channel I/O interfaces is a parallel in-phase and quadrature phase (PIQ) interface.
10. The integrated circuit of claim 1 , wherein the at least one of the plurality of single-channel I/O interfaces is an external memory interface.
11. An integrated circuit, comprising:
a plurality of functional circuits including a first functional circuit and a second functional circuit;
a multi-channel input/output (I/O) interface, wherein the multi-channel I/O interface comprises a plurality of channels that operate in a half-duplex mode; and
a test circuit for performing electrical characterization of each of the plurality of channels, and wherein the test circuit is configured for:
setting a first channel of the plurality of channels to a receive mode;
setting a second channel of the plurality of channels to a transmit mode;
receiving input test data at the first channel;
sampling the input test data at the first channel;
transmitting the sampled input test data to the second channel by bypassing the first and second functional circuits; and
generating output data at the second channel, thereby performing the electrical characterization of the first and second channels.
12. The integrated circuit of claim 11 , wherein the test circuit further comprises a comparator for comparing the sampled input test data with predetermined test data to determine data accuracy.
13. The integrated circuit of claim 11 , wherein the test circuit comprises a memory module for storing a set of pre-programmed values for configuring the plurality of channels in the half-duplex mode.
14. The integrated circuit of claim 11 , wherein the first functional circuit operates in a first clock domain and the second functional circuit operates in a second clock domain.
15. The integrated circuit of claim 14 , further comprising a bypass clock circuit for receiving clock signals from the first and second clock domains and generating a bypass clock signal that synchronizes the operations of the first and second functional circuits.
16. The integrated circuit of claim 15 , wherein the bypass clock signal drives the test circuit.
17. The integrated circuit of claim 15 , wherein a clock signal from the first clock domain drives the second functional circuit.
18. The integrated circuit of claim 11 , wherein the multi-channel I/O interface is a radio front-end digital, parallel interface.