Systems and methods for providing user-initiated latch up to destroy SRAM data
View Patent ↗Systems and methods are provided for destroying or erasing circuitry elements, data, or both, such as transistors, volatile keys, or fuse blocks, located in an integrated circuit device. An initiation signal may be provided to induce latch-up in a circuitry element in response to a user command, a tampering event, or both. As a result of the latch-up effect, the circuitry element, data, or both may be destroyed or erased.
1. An integrated circuit device comprising:
a circuitry element operable to store data; and
logic circuitry coupled to the circuitry element, the logic circuitry operable to:
receive an initiation signal, selectively generated by circuitry within the integrated circuit device, to destroy the circuitry element, and
induce latch-up in the circuitry element responsive to the initiation signal, wherein the logic circuitry is operative to decouple the circuitry element from a first supply voltage and to couple the circuitry element to a second supply voltage based on the initiation signal.
2. The integrated circuit device of claim 1 , wherein the circuitry element is coupled to a negative supply voltage, and wherein the logic circuitry comprises:
a first transistor coupled to the circuitry element and the negative supply voltage, wherein the first transistor comprises an input operative to receive the initiation signal; and
a second transistor coupled to the circuitry element and a positive supply voltage, wherein the second transistor comprises an input operative to receive the initiation signal;
wherein the logic circuitry is further operable to:
decouple the circuitry element from the negative supply voltage based at least in part on operation of the first transistor, and
couple the circuitry element that is decoupled from the negative supply voltage to the positive supply voltage based at least in part on operation of the second transistor.
3. The integrated circuit device of claim 1 , wherein the initiation signal is a low voltage signal.
4. The integrated circuit device of claim 1 , wherein the integrated circuit device is a programmable integrated circuit device.
5. The integrated circuit device of claim 1 , wherein the circuitry element comprises a CMOS structure.
6. The integrated circuit device of claim 1 , wherein the circuitry element comprises a volatile memory element.
7. The integrated circuit device of claim 6 , wherein the volatile memory element is operable to store a volatile key.
8. The integrated circuit device of claim 1 , wherein the circuitry element comprises a nonvolatile memory element.
9. The integrated circuit device of claim 1 , wherein the initiation signal is generated in response to a user command.
10. The integrated circuit device of claim 1 , wherein the initiation signal is generated in response to a tampering event.
11. A method for destroying a selected portion of an integrated circuit device, the method comprising:
receiving an initiation signal, selectively generated by circuitry within the integrated circuit device, to destroy a circuitry element;
inducing latch-up in the circuitry element responsive to the initiation signal;
decoupling the circuitry element from a first supply voltage; and
coupling the circuitry element to a second supply voltage based on the initiation signal.
12. The method of claim 11 , wherein the circuitry element is coupled to a negative supply voltage, the method further comprising:
providing the initiation signal to a first transistor coupled to the negative supply voltage and the circuitry element; and
providing the initiation signal to a second transistor coupled to a positive supply voltage and the circuitry element;
decoupling the circuitry element from the negative supply voltage based at least in part on operation of the first transistor, and
coupling the circuitry element that is decoupled from the negative supply voltage to the positive supply voltage based at least in part on operation of the second transistor.
13. The method of claim 11 , wherein the initiation signal is a low voltage signal.
14. The method of claim 12 , wherein the decoupling the circuitry element from the negative supply voltage comprises decoupling an NMOS transistor from the negative supply voltage.
15. The method of claim 11 , wherein the decoupling comprises decoupling a CMOS structure from a negative supply voltage.
16. The method of claim 11 , wherein the circuitry element comprises a volatile memory element.
17. The method of claim 11 , wherein the circuitry element comprises a nonvolatile memory element.
18. The method of claim 11 , wherein the initiation signal is generated in response to one of a user command and a tampering event.
19. A system for destroying a selected portion of an integrated circuit device comprising:
logic circuitry coupled to a circuitry element, wherein the circuitry element is operable to store data, the logic circuitry operable to:
receive an initiation signal, selectively generated by circuitry within the integrated circuit device, to destroy the circuitry element; and
induce latch-up in the circuitry element responsive to the initiation signal, wherein the logic circuitry is operative to decouple the circuitry element from a first supply voltage and to couple the circuitry element to a second supply voltage based on the initiation signal.
20. The system of claim 19 , wherein the circuitry element comprises a volatile key.
21. The integrated circuit device of claim 1 , wherein the circuitry within the integrated circuit device is programmable logic circuitry.