IP Library Granted Patent US 8,334,588
Granted Patent B2
US 8,334,588 · App. 13/098,340 · Granted Dec 18, 2012

Circuit component with conductive layer structure

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Quick Facts
Patent No.
US 8,334,588
App. No.
13/098,340
Granted
Dec 18, 2012
Kind
B2
Abstract

A circuit component comprising a substrate, and a conductive layer over the substrate, wherein the conductive layer comprises a first portion between a first opening in the conductive layer and a second opening in the conductive layer, wherein the first and second openings are enclosed by the conductive layer, wherein a void is over the substrate and under the conductive layer, wherein the first portion and the first and second openings are over the void.

Claims (27)

1. A circuit component comprising:

a substrate; and

a conductive layer over said substrate, wherein said conductive layer comprises a first portion between a first opening in said conductive layer and a second opening in said conductive layer, wherein said first and second openings are enclosed by said conductive layer, wherein a void is over said substrate and under said conductive layer, wherein said first portion and said first and second openings are over said void.

2. The circuit component of claim 1 , wherein said substrate comprises a silicon substrate.

3. The circuit component of claim 1 further comprising a metal pad over said substrate and a dielectric layer over said substrate, wherein said conductive layer is further over said dielectric layer, wherein said conductive layer is connected to said metal pad through a third opening in said dielectric layer.

4. The circuit component of claim 3 , wherein said metal pad comprises aluminum.

5. The circuit component of claim 3 , wherein said metal pad comprises copper.

6. The circuit component of claim 1 further comprising a dielectric layer over said substrate, wherein said conductive layer is further over said dielectric layer.

7. The circuit component of claim 6 , wherein said dielectric layer comprises a nitride.

8. The circuit component of claim 6 , wherein said dielectric layer comprises silicon nitride.

9. The circuit component of claim 1 , wherein said conductive layer comprises a first metal layer and a second metal layer on said first metal layer, wherein said first metal layer is under said second metal layer, but not at a sidewall of said second metal layer.

10. The circuit component of claim 9 , wherein said first metal layer comprises titanium.

11. The circuit component of claim 9 , wherein said first metal layer comprises titanium nitride.

12. The circuit component of claim 1 further comprises a dielectric layer on said conductive layer and over said substrate.

13. The circuit component of claim 12 , wherein said dielectric layer comprises a polymer.

14. The circuit component of claim 1 , wherein said conductive layer comprises copper.

15. The circuit component of claim 1 , wherein said conductive layer comprises nickel.

16. The circuit component of claim 1 , wherein said conductive layer comprises gold.

17. The circuit component of claim 1 further comprising a tin-containing layer over said conductive layer.

18. The circuit component of claim 1 , wherein said void communicates with said first and second openings.

19. The circuit component of claim 1 , wherein no insulating layer is between said conductive layer and said void.

20. The circuit component of claim 19 further comprising a metal pad over said substrate and a dielectric layer over said substrate, wherein said conductive layer is further over said dielectric layer, wherein said conductive layer is connected to said metal pad through a third opening in said dielectric layer.

21. The circuit component of claim 20 , wherein said metal pad comprises aluminum.

22. The circuit component of claim 19 further comprising a dielectric layer over said substrate, wherein said void is over said dielectric layer.

23. The circuit component of claim 22 , wherein said dielectric layer comprises a nitride.

24. The circuit component of claim 19 , wherein said conductive layer comprises copper.

25. The circuit component of claim 6 , wherein said void is further over said dielectric layer.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2014
From: MEGIT ACQUISITION CORP.
To: QUALCOMM INCORPORATED
Reel/Frame 033303/0124 →
MERGER Recorded Sep 25, 2013
From: MEGICA CORPORATION
To: MEGIT ACQUISITION CORP.
Reel/Frame 031283/0198 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY NAME NEEDS TO CHANGE FROM MEGICA TO MEGIC PREVIOUSLY RECORDED ON REEL 030770 FRAME 0876. ASSIGNOR(S) HEREBY CONFIRMS THE MEGIC CORPORATION TO MEGICA CORPORATION. Recorded Aug 9, 2013
From: MEGIC CORPORATION
To: MEGICA CORPORATION
Reel/Frame 030997/0336 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 10, 2013
From: LEE, JIN-YUAN; LIN, ERIC
To: MEGIC CORPORATION
Reel/Frame 030766/0508 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 10, 2013
From: MEGICA CORPORATION
To: MEGICA CORPORATION
Reel/Frame 030770/0876 →