IP Library Patent Application 13101538
Patent Application
App. No. 13/101,538

SYSTEM AND METHOD FOR FABRICATING THIN-FILM PHOTOVOLTAIC DEVICES

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Quick Facts
Patent No.
US None
App. No.
13/101,538
Abstract

Described are a system and a method for depositing a thin film on a substrate. In some embodiments, the system includes a substrate transport system to transport a plurality of discrete substrates, such as glass substrates or wafers, along a closed path. The system also includes a metal deposition zone, a selenization zone and a cooling chamber each disposed on the closed path. During transport along the closed path, the metal deposition zone deposits a layer of a composite metal onto the discrete substrates and the selenization zone selenizes the layer of the composite metal. The cooling zone cools the discrete substrates prior to a subsequent pass through the metal deposition zone and the selenization zone.

Claims (41)

1 . A system for depositing a thin film on a substrate, comprising:

a substrate transport system to transport a plurality of discrete substrates along a closed path;

a metal deposition zone disposed on the closed path and configured to deposit a layer of a composite metal onto the discrete substrates during passage through the metal deposition zone;

a selenization zone disposed on the closed path to receive the discrete substrates after passing through the metal deposition zone; and

a cooling chamber disposed along the closed path to receive the discrete substrates after passing through the selenization zone, the cooling chamber configured to cool the discrete substrates prior to a subsequent pass of the discrete substrates through the metal deposition zone and the selenization zone.

2 . The system of claim 1 wherein the metal deposition zone is a sputtering zone.

3 . The system of claim 2 wherein the sputtering zone comprises a plurality of magnetrons, the system further comprising a target material for each of the magnetrons, each of the target materials having a composition comprising one of copper indium gallium, copper gallium and copper indium.

4 . The system of claim 3 wherein the target material for each magnetron in one of the sputtering zones has a composition that is different from a composition of the target material for each of the other magnetrons in the sputtering zone.

5 . The system of claim 1 wherein the layer of the composite metal is a copper indium gallium layer.

6 . The system of claim 1 wherein the selenization zone comprises:

a selenization furnace;

a first selenium trap disposed between the metal deposition zone and the selenization furnace; and

a second selenium trap disposed between the selenization furnace and the cooling chamber.

7 . The system of claim 6 wherein the selenization furnace is configured to maintain a temperature in a range of approximately 250° C. to 600° C.

8 . The system of claim 6 further comprising:

a first low conductance aperture disposed between the metal deposition zone and the first selenium trap; and

a second low conductance aperture disposed between the second selenium trap and the cooling chamber.

9 . The system of claim 6 wherein the first and second selenium traps are differentially pumped.

10 . The system of claim 6 wherein the selenization furnace has a heater comprising a plurality of zones each having a temperature that is independently controlled.

11 . The system of claim 1 further comprising:

a load mechanism disposed along the closed path to load the discrete substrates onto the substrate transport system; and

an unload mechanism disposed along the closed path to remove the discrete substrates from the substrate transport system.

12 . The system of claim 1 wherein the discrete substrates comprise glass substrates.

13 . A system for depositing a thin film on a substrate, comprising:

a substrate transport system to transport a plurality of discrete substrates along a path having a load end and an unload end;

a plurality of metal deposition zones disposed on the path, each metal deposition zone configured to deposit a layer of a composite metal onto the discrete substrates during passage through the metal deposition zone;

a plurality of selenization zones, each selenization zone disposed on the path to receive the discrete substrates after passing through a respective one of the metal deposition zones; and

a plurality of cooling zones, each cooling zone disposed on the path to receive the discrete substrates after passing through a respective one of the selenization zones.

14 . The system of claim 13 further comprising:

a load mechanism disposed at the load end of the path to load the discrete substrates into the substrate transport system; and

an unload mechanism disposed at the unload end of the path to remove the discrete substrates from the substrate transport system.

15 . A method of depositing a thin film on a substrate, the method comprising:

(a) depositing a layer of a composite metal onto a discrete substrate during transport through a metal deposition zone;

(b) transporting the discrete substrate to a selenization zone;

(c) depositing a selenium layer onto the layer of the composite metal during transport of the discrete substrate through the selenization zone;

(d) heating the discrete substrate during transport through the selenization zone to selenize the layer of the composite metal;

(e) determining if the layer of the composite metal deposited onto the discrete substrate is a last deposition layer;

(f) repeating steps (a) to (d) if a determination is made that the layer of the composite metal deposited onto the discrete substrate is not the last deposition layer.

16 . The method of claim 15 further comprising cooling the discrete substrate after step (e) if a determination is made that the layer of the composite metal deposited onto the discrete substrate is not a last deposition layer.

17 . The method of claim 15 wherein the layer of the composite metal comprises a copper indium gallium layer.

18 . The method of claim 17 wherein a plurality of layers of the composite metal are deposited and wherein a relative composition of copper, indium and is different for at least two of the layers.

Assignments (3)
SECURITY AGREEMENT Recorded Jun 17, 2013
From: AVENTA TECHNOLOGIES, INC.
To: RICHARD S. POST
Reel/Frame 030628/0796 →
MERGER Recorded Sep 27, 2012
From: AVENTA TECHNOLOGIES, LLC
To: AVENTA TECHNOLOGIES, INC.
Reel/Frame 029034/0556 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2012
From: SFERLAZZO, PIERO; LAMPROS, THOMAS MICHAEL
To: AVENTA TECHNOLOGIES LLC
Reel/Frame 027540/0342 →