IP Library Granted Patent US 8,750,354
Granted Patent B1
US 8,750,354 · App. 13/104,362 · Granted Jun 10, 2014

Nearfield testing architecture

Inventors: William M. Heruska (Sicklerville, NJ); Michael Uscinowicz (Hainesport, NJ); Gregory A. Arlow (Southampton, NJ); Fred Tanjutco (Cherry Hill, NJ)
Assignee: Lockheed Martin Corporation
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Quick Facts
Patent No.
US 8,750,354
App. No.
13/104,362
Granted
Jun 10, 2014
Kind
B1
Abstract

An open architecture design for a digital nearfield test system for nearfield testing of a phased array antenna allows the ability to use the components of an individual phased array antenna to be tested in conjunction with a nearfield scanner probe system allowing an efficient and cost-saving “radar testing the radar” scenario.

Claims (8)

1. A digital nearfield testing architecture for nearfield testing of a digital phased array antenna under test, wherein the digital phased array antenna comprises a digital receiver/exciter and an onboard processor, the digital nearfield architecture comprising:

a digital nearfield scanner probe system comprising:

a nearfield scanner probe connected to the digital receiver/exciter and the onboard processor, wherein when the phased array antenna under test is in transmit mode, the nearfield scanner probe detects RF signal from the phased array antenna under test and sends detected receive (Rx) RF data to the digital receiver/exciter, and when the phased array antenna under test is in receive mode, the digital receiver/exciter generates and sends transmit (Tx) RF data to the digital nearfield scanner probe which then transmits an RF signal to the phased array antenna under test which generates digital I/Q data;

a data processing and array control unit; and

a local oscillator distribution network for synchronizing operations of the components of the digital nearfield architecture,

wherein the digital nearfield scanner probe system correlates the digital RF Tx and RF Rx data to the digital I/Q data from the phased array antenna under test.

2. The digital nearfield testing architecture of claim 1 further comprising an RF signal drift monitor loop between the nearfield scanner probe and the digital receiver/exciter for injecting RF signal back onto the nearfield scanner probe's digital receiver/exciter.

3. The digital nearfield testing architecture of claim 1 , wherein the digital receiver/exciter and the onboard processor formats the RF Rx data from the digital nearfield scanner probe and bus the RF Rx data back to the nearfield data processing and array control unit.

Assignments (2)
CONFIRMATORY LICENSE Recorded Apr 9, 2012
From: LOCKHEED MARTIN CORPORATION
To: THE GOVERNMENT OF THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY
Reel/Frame 028009/0950 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2011
From: HERUSKA, WILLIAM M.; USCINOWICZ, MICHAEL; ARLOW, GREGORY A.; TANJUTCO, FRED
To: LOCKHEED MARTIN CORPORATION
Reel/Frame 026252/0614 →