IP Library Patent Application 13107962
Patent Application
App. No. 13/107,962

LOW-COST MULTI-JUNCTION SOLAR CELLS AND METHODS FOR THEIR PRODUCTION

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Patent No.
US None
App. No.
13/107,962
Abstract

Methods for fabricating solar cells without the need to perform gasification of metallurgical-grade silicon are disclosed. Consequently, the costs and health and environmental hazards involved in fabricating the solar or silicon grade silicon are being avoided. A solar cell structure comprises a metallurgical grade doped silicon substrate and a thin-film structure formed over the substrate to form a p-i-n junction with the substrate. The substrate may be doped p-type, and the thin film structure may be an intrinsic amorphous layer formed over the substrate and an n-type amorphous layer formed over the intrinsic layer.

Claims (28)

1 . A method for producing a solar cell comprising:

obtaining a multi-crystalline substrate consisting essentially of doped metallurgical grade silicon of purity of 99.9%-99.999% doped as one of a p-type or n-type and having an upper side and an underside, the upper side for facing the sun;

forming a first thin-film structure comprising an intrinsic silicon layer formed directly over and in direct contact with the upper side of the substrate and a first doped layer of opposite polarity as that of the substrate and formed directly over and in direct contact with the intrinsic layer, to thereby form a first p-i-n structure with the substrate;

forming a second thin-film structure over the first thin film structure;

forming a top conductive contact above the second thin-film structure;

forming a bottom conductive contact on the underside of the substrate.

2 . The method of claim 1 , further comprising wet chemical etching the substrate so as to texture the substrate prior to forming a first thin-film structure.

3 . The method of claim 1 , wherein forming a first thin-film structure comprises forming at least one of the first intrinsic layer and the first doped layer as an amorphous silicon layer.

4 . The method of claim 3 , wherein in forming a first thin-film structure at least one of the first intrinsic layer and the first doped layer are formed to comprise hydrogen atoms dispersed within a silicon layer.

5 . The method of claim 4 , wherein forming a bottom conductive contact comprises forming a doped conductive layer, of the same polarity as the substrate, on the underside of the substrate and forming a metal layer over the doped conductive layer.

6 . The method of claim 5 , wherein forming the top conductive contact comprises forming a transparent conductor over the first doped layer.

7 . The method of claim 6 , further comprising forming conductive electrodes over the transparent conductor.

8 . The method of claim 5 , further comprising forming an amorphous intrinsic layer on the underside of the substrate such that it is positioned between the underside of the substrate and the doped conductive layer.

9 . The method of claim 1 , wherein obtaining a multi-crystalline substrate comprises slowly solidifying metallurgical silicon melt into a cylinder with large silicon grains and resistivity of about 1 Ohmcm.

10 . The method of claim 1 , wherein forming a the second thin-film structure comprises forming a first doped thin-film over the first thin-film structure, forming an intrinsic thin-film over the first doped thin-film, and forming a second doped thin-film over the intrinsic thin-film, to thereby form a second thin-film p-i-n structure over the first p-i-n structure.

11 . The method of claim 1 , wherein the first doped layer is an n-type layer formed over and in contact with the intrinsic layer, and wherein forming the second thin-film structure comprises forming a p-type layer over and in contact with the first n-type layer, forming a second intrinsic layer over the p-type layer, and forming a second n-type layer.

12 . The method of claim 11 , further comprising forming a diffusion layer in the metallurgical grade substrate, the diffusion layer being one of an n-type or p-type.

13 . The method of claim 1 , wherein obtaining a multi-crystalline substrate comprises comprising obtaining silicon wafers consisting essentially of a p-type metallurgical grade silicon of resistivity of about 1.0 Ωcm.

14 . The method of claim 1 , wherein obtaining a multi-crystalline substrate comprises fabricating multi-crystalline wafers doped with both boron and phosphorous and having p-type polarity.

15 . A method of fabricating a solar cell, comprising:

obtaining a multi-crystalline substrate consisting essentially of doped metallurgical grade silicon of purity of 99.9%-99.999% doped to a first type of conductance;

forming a diffusion layer on top surface of the substrate such that the diffusion layer has opposite conductance of the first type; and,

forming a first thin-film structure over and in contact with the diffusion layer.

16 . The method of claim 15 , further comprising forming a second thin-film structure over the first thin-film structure.

17 . The method of claim 16 , wherein forming a first thin film structure comprises:

forming a first intrinsic layer over and in contact with the diffusion layer; and,

forming a first doped layer of same conductance of the first type over and in contact with the intrinsic layer.

18 . The method of claim 16 , wherein forming a second thin-film structure over the first thin-film structure comprises forming a thin-film p-i-n junction.

Assignments (2)
RELEASE OF SECURITY INTEREST Recorded Jul 13, 2015
From: TRUE GREEN-CAPRICORN HOLDINGS LLC
To: SUNPREME, LTD.
Reel/Frame 036101/0728 →
SECURITY INTEREST Recorded Dec 10, 2014
From: SUNPREME, LTD
To: TRUE GREEN-CAPRICORN HOLDINGS LLC
Reel/Frame 034465/0210 →