IP Library Granted Patent US 8,749,788
Granted Patent B2
US 8,749,788 · App. 13/118,618 · Granted Jun 10, 2014

Optoelectronic apparatus for gas analysis and method

Inventors: Jürgen Kaufmann (Denzlingen, DE); Frank Nuber (Emmendingen, DE); Michael Overdick (Emmendingen, DE); Rolf Schiffler (Kenzingen, DE)
Assignee: Sick AG
G01N21/15G01N21/3504G01N21/67H01J49/0422
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Quick Facts
Patent No.
US 8,749,788
App. No.
13/118,618
Granted
Jun 10, 2014
Kind
B2
Abstract

The invention relates to an improved optoelectronic apparatus for optical gas analysis by means of which the interfering influence of the particles contained in the gas is reduced with regard to the intended measurement. For this purpose the optoelectronic apparatus in accordance with the invention has a light transmitter and a light receiver which define an optical measurement path including a measurement volume between one another. The received signals of the light receiver can be evaluated in an evaluation unit, to ultimately obtain the desired information therefrom, for example, the concentration of a specific gas content. In accordance with the invention an ionizer is further provided which is arranged upstream of the optical measurement path. The ionizer causes an ionization of the undesirable particles, i.e. e.g. the dust particles, smoke particles or such like aerosols so that the ionized particles can be deflected by electric fields or also magnetic fields by means of an ion acceleration apparatus. In this respect the ion acceleration apparatus and/or its electromagnetic fields is/are aligned such that the generated ions experience a deflection to be able to flow past the measurement volume.

Claims (13)

1. An optoelectronic apparatus for optical gas analysis in a gas flow, having a light transmitter and a light receiver which define an optical measurement path including a measurement volume between one another, an evaluation unit, an ionizer which is arranged upstream of the optical measurement path, and an ion acceleration apparatus which is aligned such that the generated ions experience a deflection to away from the measurement volume.

2. An optoelectronic apparatus in accordance with claim 1 , wherein the ionizer is configured as a discharge electrode of an electric filter and the ion acceleration apparatus is formed by the discharge electrode and a collector electrode of the electric filter.

3. An optoelectronic apparatus in accordance with claim 2 , wherein the collector electrode is arranged at least laterally to the measurement volume when viewed in the flow direction.

4. An optoelectronic apparatus in accordance with claim 2 , wherein a plurality of discharge electrodes are arranged upstream of the optical measurement path.

5. An optoelectronic apparatus for optical gas analysis, having a light transmitter and a light receiver which define an optical measurement path including a measurement volume between one another, an evaluation unit, an electric filter, wherein at least one discharge electrode of the electric filter is arranged in the volume which forms the optical measurement path and a collector electrode is arranged outside of the volume.

6. An apparatus in accordance with claim 5 , wherein the electric filter is integrated into a mechanical filter, namely into a filter frit.

7. An apparatus in accordance with claim 5 , wherein the discharge electrode is arranged centrally in the measurement volume, at least partially, and the collector electrode is arranged at the interior surfaces of the mechanical filter or is formed by the filter itself.

8. A method for optically analyzing a gas in a gas flow having the steps of: transmitting a light beam into a measurement volume penetrated the gas flow receiving the light beam with a receiver and generating received signals, evaluating the received signals, ionizing particles in the gas flow in an electric field and deflecting the ionized particles with the electric field so that they experience a deflection in a direction out of measurement volume so that they can flow past the measurement volume.

9. A method in accordance with claim 8 , wherein the field strength is modulated and the received signals are evaluated under consideration of the modulation.

10. An optoelectronic apparatus for optical gas analysis in a gas flow, comprising:

a light transmitter and a light receiver, configured to receive incident light from the light transmitter, the light transmitter and light receiver defining an optical measurement path including a measurement volume between one another,

an evaluation unit,

an ionizer which is arranged upstream of the optical measurement path, and an ion acceleration apparatus which is aligned such that the generated ions experience a deflection to flow away from the measurement volume towards a collector electrode that collects the ions.

Assignments (3)
NUNC PRO TUNC ASSIGNMENT Recorded Jan 16, 2026
From: SICK AG
To: ENDRESS+HAUSER SICK GMBH+CO. KG
Reel/Frame 073492/0458 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 9, 2012
From: SICK MAIHAK GMBH
To: SICK AG
Reel/Frame 028509/0201 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 1, 2011
From: KAUFMANN, JURGEN; NUBER, FRANK; OVERDICK, MICHAEL; SCHIFFLER, ROLF
To: SICK MAIHAK GMBH
Reel/Frame 026366/0262 →
Priority Claims (1)
EP 10168397 · Jul 5, 2010 · regional
Continuity (1)
Related Publication 20120002205A1 · Jan 5, 2012