IP Library › Granted Patent US 8,592,240
Granted Patent B2
US 8,592,240 · App. 13/121,478 · Granted Nov 26, 2013

Method for manufacturing semiconductor light-emitting element

Inventor: Katsuki Kusunoki (Ichihara, JP)
Assignee: Toyoda Gosei Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,592,240
App. No.
13/121,478
Granted
Nov 26, 2013
Kind
B2
Abstract

Provided is a method for manufacturing a semiconductor light-emitting element having a narrow wavelength distribution and comprising a substrate and a group III compound semiconductor layer formed thereon, the substrate being made of a material different from the compound semiconductor constituting the semiconductor layer. The method for manufacturing a semiconductor light-emitting element having a group III compound semiconductor layer is characterized by comprising a semiconductor layer-forming step wherein a group III compound semiconductor layer having a total thickness of not less than 8 μm is formed on a substrate ( 11 ) having a diameter D, a thickness and an amount of warpage H within the range of ±30 μm. The method is also characterized in that the diameter D and the thickness d of the substrate ( 11 ) satisfy the following formula (1): 0.7×10 2 ≦( D/d )≦1.5×10 2   (1).

Claims (21)

1. A method for manufacturing a semiconductor light-emitting element having a group III compound semiconductor layer, the method comprising:

a semiconductor layer forming step to form the group III compound semiconductor layer having a total thickness selected from a range of 8 μm to 15 μm on a substrate having an amount of warpage H selected from a range of −7.1 μm≦H<0, a diameter D selected from a range of 50 mm to 155 mm and a thickness d selected from a range of 0.7 mm to 1.5 mm,

wherein the diameter D and the thickness d of the substrate satisfy a relation of the following formula (1):

0.7×10 2 ≦( D/d )≦1.5×10 2   (1).

2. The method for manufacturing a semiconductor light-emitting element according to claim 1 , wherein the group III compound semiconductor layer contains a group III nitride.

3. The method for manufacturing a semiconductor light-emitting element according to claim 1 , wherein the substrate is made of a material different from a material of a group III compound semiconductor.

4. The method for manufacturing a semiconductor light-emitting element according to claim 1 , wherein the substrate is made of sapphire.

5. The method for manufacturing a semiconductor light-emitting element according to claim 1 , further comprising an intermediate layer forming step to form an intermediate layer between the substrate and the group III compound semiconductor layer by a sputtering method.

6. The method for manufacturing a semiconductor light-emitting element according to claim 1 , wherein the group III compound semiconductor layer is formed by laminating a base layer, an n-type semiconductor layer, a light-emitting layer and a p-type semiconductor layer in this order on the substrate.

7. The method for manufacturing a semiconductor light-emitting element according to claim 1 , wherein the group III compound semiconductor layer is formed on the substrate by a metalorganic chemical vapor deposition method.

8. A method for manufacturing a semiconductor light-emitting element having a group III compound semiconductor layer, the method comprising:

a semiconductor layer forming step to form the group III compound semiconductor layer on a substrate having an amount of warpage H in a range of −30 μm≦H<0, a diameter D selected from a range of 50 mm to 155 mm and a thickness d selected from a range of 0.7 mm to 1.5 mm,

wherein, in a case where the diameter D of the substrate is 50 mm to 51 mm, the amount of warpage H of the substrate is selected from a range of 0<H≦30 μm and −30 μm≦H<0, whereas in a case where the diameter D of the substrate is 100 mm to 102 mm, the amount of warpage H of the substrate is selected from a range of −10 μm<H<0,

wherein the diameter D and the thickness d of the substrate satisfy a relation of the following formula (1):

0.7×10 2 ≦( D/d )≦1.5×10 2   (1).

9. The method for manufacturing a semiconductor light-emitting element according to claim 8 , wherein the group III compound semiconductor layer contains a group III nitride.

10. The method for manufacturing a semiconductor light-emitting element according to claim 8 , wherein the substrate is made of a material different from a material of a group III compound semiconductor.

11. The method for manufacturing a semiconductor light-emitting element according to claim 8 , wherein the substrate is made of sapphire.

12. The method for manufacturing a semiconductor light-emitting element according to claim 8 , further comprising an intermediate layer forming step to form an intermediate layer between the substrate and the group III compound semiconductor layer by a sputtering method.

13. The method for manufacturing a semiconductor light-emitting element according to claim 8 , wherein the group III compound semiconductor layer is formed by laminating a base layer, an n-type semiconductor layer, a light-emitting layer and a p-type semiconductor layer in this order on the substrate.

14. The method for manufacturing a semiconductor light-emitting element according to claim 8 , wherein the group III compound semiconductor layer is formed on the substrate by a metalorganic chemical vapor deposition method.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 4, 2012
From: SHOWA DENKO K.K.
To: TOYODA GOSEI CO., LTD.
Reel/Frame 029400/0672 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2011
From: KUSUNOKI, KATSUKI
To: SHOWA DENKO K.K.
Reel/Frame 026069/0497 →
Priority Claims (2)
JP 2008-258855 · Oct 3, 2008 · national
JP 2008-335020 · Dec 26, 2008 · national
Continuity (1)
Related Publication 20110177642A1 · Jul 21, 2011