IP Library Granted Patent US 8,487,792
Granted Patent B2
US 8,487,792 · App. 13/121,951 · Granted Jul 16, 2013

Method of gain calibration of an ADC stage and an ADC stage

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Quick Facts
Patent No.
US 8,487,792
App. No.
13/121,951
Granted
Jul 16, 2013
Kind
B2
Abstract

A method of gain calibration of an ADC stage is provided. The method includes steps of receiving an input analog signal, converting the input analog signal into an m-bit digital signal by means of an analog to digital converter, generating a calibration signal by means of a random number generator, adding the calibration signal to the m-bit digital signal to produce an adjusted m-bit digital signal, converting the adjusted m-bit digital signal into an adjusted partial analog signal by means of a digital to analogue converter, subtracting the partial analog signal from the input analog signal, to produce a residual analog signal, amplifying the residual analog signal. The the calibration signal may take any one of three values and may be constrained to one of only two of these three values. An ADC stage adapted to operate according to the method is also provided.

Claims (25)

1. A method of calibrating an analog to digital converter system, comprising:

receiving an input analog signal;

converting the input analog signal into an m-bit digital signal using an analog to digital converter;

generating a calibration signal using a random number generator, the calibration signal being positive, null, or negative based on a state of a digital signal generated by the random number generator;

adding the calibration signal to the m-bit digital signal to produce an adjusted m-bit digital signal;

converting the adjusted m-bit digital signal into an adjusted partial analog signal using a digital to analogue converter;

subtracting the partial analog signal from the input analog signal, to produce a residual analog signal; and

amplifying the residual analog signal.

2. A method as claimed in claim 1 , wherein the state of the digital signal comprises any one of three states including a negative state, zero, and a positive state.

3. The method as claimed in claim 2 , wherein the negative state is −1, and the positive state is +1.

4. The method as claimed in claim 2 , wherein, when the input analog signal lies within a lowest sub-range, the random generator is constrained to be the negative state and 0.

5. The method as claimed in claim 2 , wherein, when the input analog signal lies within a highest sub-range, the random generator is constrained to be zero and the positive state.

6. A stage of an analog-to-digital converter (ADC), the stage of the ADC calibrating the ADC according to the method of claim 1 .

7. The stage of an ADC according to claim 6 , wherein the stage is a pipeline stage.

8. A method of calibrating an analog to digital converter system, comprising:

receiving an input analog signal;

converting the input analog signal into an m-bit digital signal using an analog to digital converter;

generating a calibration signal using a random number generator, wherein the random number generator generates a digital signal having any one of three states including a negative state, zero, and a positive state, the calibration signal being positive, null, or negative based on the state of the digital signal generated by the random number generator, and the random number generator constrained to be two of the three states based on the input analog signal;

adding the calibration signal to the m-bit digital signal to produce an adjusted m-bit digital signal;

converting the adjusted m-bit digital signal into an adjusted partial analog signal using a digital to analogue converter;

subtracting the partial analog signal from the input analog signal, to produce a residual analog signal; and

amplifying the residual analog signal.

9. The method as claimed in claim 8 , wherein the negative state is −1, and the positive state is +1.

10. A stage of an analog-to-digital converter (ADC), the stage of the ADC calibrating the ADC according to the method of claim 8 .

11. The stage of an ADC according to claim 10 , wherein the stage is a pipeline stage.

Assignments (14)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 29, 2019
From: JPMORGAN CHASE BANK, N.A.
To: INTEGRATED DEVICE TECHNOLOGY, INC.; GIGPEAK, INC.; CHIPX, INCORPORATED; ENDWAVE CORPORATION; MAGNUM SEMICONDUCTOR, INC.
Reel/Frame 048746/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
SECURITY AGREEMENT Recorded Apr 5, 2017
From: INTEGRATED DEVICE TECHNOLOGY, INC.; GIGPEAK, INC.; MAGNUM SEMICONDUCTOR, INC.; ENDWAVE CORPORATION; CHIPX, INCORPORATED
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 042166/0431 →
PATENT RELEASE Recorded Aug 17, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 039707/0471 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2012
From: NXP B.V.
To: INTEGRATED DEVICE TECHNOLOGY, INC.
Reel/Frame 029213/0890 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2011
From: ERDMANN, CHRISTOPHE
To: NXP B.V.,
Reel/Frame 026737/0678 →