IP Library Granted Patent US 8,693,625
Granted Patent B2
US 8,693,625 · App. 13/127,595 · Granted Apr 8, 2014

Dynamic shaping time modification in X-ray detectors

Inventors: Michael E. Dugas (Londonderry, NH); Lee Grodzins (Lexington, MA)
Assignee: Thermo Scientific Portable Analytical Instruments Inc.
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Quick Facts
Patent No.
US 8,693,625
App. No.
13/127,595
Granted
Apr 8, 2014
Kind
B2
Abstract

Methods and apparatus for adapting the shaping time and/or other pulse processing parameters of an x-ray detector ( 114 ) in accordance with the elemental composition of a sample and/or energy resolving requirements. X-rays ( 104 ) are directed from a source ( 102 ) onto a sample ( 110 ) and the radiation ( 108 ) responsively emitted from the sample (e.g., fluoresced radiation characteristic of the sample's elemental composition) and detected by an x-ray detector ( 114 ) that generates pulses representative of the energy and intensity of the incident radiation. Based upon initial analysis of elemental composition, the shaping time and/or other pulse processing parameter (s) are set to optimize count rate subject to constraints of energy resolution in a spectral region of interest.

Claims (18)

1. A method for analyzing elemental composition of a sample, the method comprising:

a. irradiating the sample with x-rays;

b. detecting x-rays fluoresced by the sample in response to irradiation, thereby generating detector signal pulses;

c. preamplifying the detector signal pulses;

d. processing the detector signal pulses subject to pulse processing parameters;

e. determining energy resolution requirements based on analysis of sample composition; and

f. setting at least one of the pulse processing parameters on the basis of the determined energy resolution requirements.

2. A method in accordance with claim 1 , wherein the at least one of the pulse processing parameters includes a detector shaping time.

3. An x-ray fluorescence instrument for analyzing elemental composition of a sample, the instrument comprising:

a. a source of x-rays for irradiating the sample;

b. a detector for detecting x-rays fluoresced by the sample in response to irradiation, thereby generating detector signal pulses;

c. a preamplifier for amplifying the detector signal pulses;

d. a signal processor for processing the detector signal pulses;

e. a controller for governing processing parameters; and

f. a signal path between the controller and at least one of the signal processor and the preamplifier, so that a pulse processing parameter can be varied in accordance with composition of the sample.

4. An x-ray fluorescence instrument in accordance with claim 3 , wherein the signal processor includes a digital signal processor.

5. An x-ray fluorescence instrument in accordance with claim 3 , wherein the source of x-rays is an x-ray tube.

6. An x-ray fluorescence instrument in accordance with claim 3 , wherein the pulse processing parameter is a detector shaping time.

Assignments (2)
MERGER Recorded Feb 12, 2014
From: THERMO NITON ANALYZERS LLC
To: THERMO SCIENTIFIC PORTABLE ANALYTICAL INSTRUMENTS INC.
Reel/Frame 032206/0716 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2011
From: DUGAS, MICHAEL E.; GRODZINS, LEE
To: THERMO NITON ANALYZERS LLC
Reel/Frame 026445/0866 →
Continuity (2)
Provisional Application 61111252 · Nov 4, 2008
Related Publication 20110211670A1 · Sep 1, 2011