Determining a logic state based on currents received by a sense amplifer
View Patent ↗Determining that a first input of a sense amplifier is to receive information based upon a state of a storage cell during a first portion of a read cycle, and determining that a conductance at the first input is substantially equal to a conductance at a second input of the sense amplifier during the first portion. A plurality of NAND string modules are connected to a global bit line of a memory device that includes a memory column where a plurality of NAND strings and a buffer are formed.
1. A method comprising:
receiving a first current and a second current at a first input and a second input of a sense amplifier, respectively;
generating a first voltage and a second voltage at a respective first node and a second node of the sense amplifier, wherein the first and second voltages are based on the first and second currents, respectively; and
generating a logic state at an output of the sense amplifier based on the first voltage being substantially equal to the second voltage.
2. The method of claim 1 , wherein the generating comprises determining whether the first voltage at the first node is substantially equal to the second voltage at the second node based on a value defined at the sense amplifier.
3. The method of claim 2 , wherein the value defined at the sense amplifier is based on a charge stored by a passive storage element of the sense amplifier.
4. The method of claim 3 , wherein the passive storage element comprises a capacitive storage element.
5. The method of claim 2 , wherein the value defined at the sense amplifier is based on a first charge stored by a first passive storage element of the sense amplifier and by a second charge stored by a second passive storage element of the sense amplifier.
6. The method of claim 5 , wherein each of the first passive storage element and the second passive storage element comprises a capacitive storage element.
7. The method of claim 2 , further comprising:
setting the value defined at the sense amplifier based on a threshold voltage (Vt) of a transistor of the sense amplifier and a defined offset value.
8. The method of claim 2 , wherein the value defined at the sense amplifier is based on a relationship between a first defined value at the sense amplifier and a second defined value at the sense amplifier.
9. The method of claim 8 , wherein the first defined value is represented by a first charge at a first passive storage element and the second defined value is represented by a second charge at a second passive storage element.
10. The method of claim 9 , further comprising:
during a first portion of a read cycle,
transferring information at a first electrode of the first passive storage element to a control gate of a transistor of the sense amplifier, and
transferring information at a second electrode of the first passive storage element to the first input and to the second input of the sense amplifier, and
during a second portion of the read cycle,
maintaining an electrical connection between the first electrode of the first passive storage element and the control gate of the transistor of the sense amplifier, and
maintaining an electrical connection between the second electrode of the first passive storage element and the first input of the sense amplifier, while the second electrode of the first passive storage element does not maintain an electrical connection with the second input of the sense amplifier.
11. The method of claim 10 , where the second portion of the read cycle immediately follows the first portion of the read cycle.
12. The method of claim 10 , wherein, during the second portion of the read cycle, a first current electrode of the transistor is in electrical connection with the first input of the sense amplifier.
13. A method for determining a logic value at a sense amplifier comprising:
during a first time period of a read cycle:
charging a first capacitive storage element to a first voltage based on a threshold voltage of a first transistor, and
charging a second capacitive storage element to a second voltage based on a threshold voltage of a second transistor;
during a second time period of the read cycle:
modifying the first voltage at the first capacitive storage element by a voltage offset, and
maintaining the second voltage at the second capacitive storage element;
during a third time period of the read cycle:
amplifying a signal difference between a first signal at a first current electrode of the first transistor and a second signal at a first current electrode of the second transistor, wherein a first effective threshold voltage of the first transistor is greater than a second effective threshold voltage of the second transistor by the offset voltage; and
during a fourth time period of the read cycle, determining the logic value based on the amplified signal difference.
14. The method of claim 13 , wherein the voltage offset is less than 300 mV.
15. The method of claim 13 , wherein the voltage offset is less than 250 mV.
16. The method of claim 13 , wherein the voltage offset is less than 200 mV.
17. The method of claim 13 , wherein the voltage offset is less than 150 mV.
18. The method of claim 13 , wherein the voltage offset is less than 100 mV.