Fully X-tolerant, very high scan compression scan test systems and techniques
Scan testing and scan compression are key to realizing cost reduction and shipped quality. New defect types in ever more complex designs require increased compression. However, increased density of unknown (X) values reduces effective compression. A scan compression method can achieve very high compression and full coverage for any density of unknown values. The described techniques can be fully integrated in the design-for-test (DFT) and automatic test pattern generation (ATPG) flows. Results from using these techniques on industrial designs demonstrate consistent and predictable advantages over other methods.
1. A method for mapping care bits to a CARE pseudo-random pattern generator (PRPG), which uses the care bits to generate patterns for identifying faults of an integrated circuit design, the method comprising:
determining a maximal window of shifts for which all care bits are mappable to a single seed, wherein determining the maximal window includes sorting the care bits by shift cycle; and
using a scan test system, mapping the care bits to the CARE PRPG using the maximal window.
2. The method of claim 1 , wherein determining the maximal window further includes initializing a variable start shift to 0.
3. The method of claim 2 , wherein determining the maximal window further includes determining a variable limit to a length of the CARE PRPG less a margin for which mapping to the single seed is likely.
4. The method of claim 1 , wherein determining the maximal window further includes, for each shift cycle, computing the maximal window so that a total number of care bits in a window does not exceed a pre-computed limit.
5. The method of claim 4 , wherein when all care bits in the window are mappable to the single seed, then loading the single seed into the CARE PRPG.
6. The method of claim 5 , further including:
when not all care bits are mappable to the single seed, then decreasing the window.
7. The method of claim 6 , further including performing a binary search to determine a maximum number of care bits mappable to the single seed.
8. A method for mapping X-tolerance (XTOL) control bits to an XTOL pseudo-random pattern generator (PRPG), the XTOL control bits determining a level of observability of scan chains, the method comprising:
determining a maximal window of shifts for which all XTOL control bits are mappable to a single seed; and
using a scan test system, determining an optimal start for the maximal window.
9. The method of claim 8 , further including:
for a full observability mode, determining whether a first option of turning off an XTOL enable bit or a second option of leaving the XTOL enable bit on is better; and
selecting a better option, the better option being one of the first option and the second option.