IP Library Patent Application 13177276
Patent Application
App. No. 13/177,276

INSULATION STRUCTURE FOR HIGH TEMPERATURE CONDITIONS AND MANUFACTURING METHOD THEREOF

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Quick Facts
Patent No.
US None
App. No.
13/177,276
Abstract

An insulation structure for high temperature conditions and a manufacturing method thereof. In the insulation structure, a substrate has a conductive pattern formed on at least one surface thereof for electrical connection of a device. A metal oxide layer pattern is formed on a predetermined portion of the conductive pattern by anodization, the metal oxide layer pattern made of one selected from a group consisting of Al, Ti and Mg.

Claims (9)

1 . An insulation structure for high temperature conditions comprising:

a substrate having a conductive pattern formed on at least one surface thereof for electrical connection of a device; and

a metal oxide layer pattern formed on a predetermined portion of the conductive pattern by anodization, the metal oxide layer pattern comprising one selected from a group consisting of Al, Ti and Mg.

2 . The insulation structure according to claim 1 , wherein the device comprises a power chip or a light emitting diode.

3 . The insulation structure according to claim 1 , further comprising an upper substrate provided on the metal oxide layer pattern.

4 . The insulation structure according to claim 3 , wherein the upper substrate and the metal oxide pattern are bonded together by Au/Sn eutectic bonding.

5 . The insulation structure according to claim 3 , wherein the device comprises a light emitting diode, and the upper substrate comprises a reflecting plate.

6 . The insulation structure according to claim 1 , wherein the substrate is a Si substrate.

7 - 11 . (canceled)

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 9, 2014
From: SAMSUNG ELECTRO-MECHANICS CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 031933/0211 →
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →