IP Library Granted Patent US 8,541,053
Granted Patent B2
US 8,541,053 · App. 13/178,057 · Granted Sep 24, 2013

Enhanced densification of silicon oxide layers

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,541,053
App. No.
13/178,057
Granted
Sep 24, 2013
Kind
B2
Abstract

Densifying a multi-layer substrate includes providing a substrate with a first dielectric layer on a surface of the substrate. The first dielectric layer includes a multiplicity of pores. Water is introduced into the pores of the first dielectric layer to form a water-containing dielectric layer. A second dielectric layer is provided on the surface of the water-containing first dielectric layer. The first and second dielectric layers are annealed at temperature of 600° C. or less. In an example, the multi-layer substrate is a nanoimprint lithography template. The second dielectric layer may have a density and therefore an etch rate similar to that of thermal oxide, yet may still be porous enough to allow more rapid diffusion of helium than a thermal oxide layer.

Claims (24)

1. A method comprising:

providing a substrate with a first dielectric layer, wherein the first dielectric layer defines a multiplicity of water-containing pores and wherein providing the substrate with the first dielectric layer further comprises forming the first dielectric layer on the substrate and contacting the first dielectric layer with a fluid comprising water;

providing a second dielectric layer on the water-containing first dielectric layer; and

steam annealing the first and second dielectric layers at a temperature of 600° C. or less.

2. The method of claim 1 , wherein the substrate is impermeable to water.

3. The method of claim 1 , wherein steam annealing the first and second dielectric layers at a temperature of 600° C. or less increases the density of the first dielectric layer and the second dielectric layer.

4. The method of claim 1 , wherein before steam annealing, the first dielectric layer comprises SiO x , wherein x≠2.

5. The method of claim 1 , wherein the first dielectric layer comprises a silicon-containing polymer.

6. The method of claim 1 , wherein providing the second dielectric layer on the first dielectric layer comprises a chemical vapor deposition process or a spin coating process.

7. The method of claim 6 , wherein providing the second dielectric layer on the first dielectric layer comprises a spin coating process, and the spin coating process comprises spin coating a polysilazane film or a spin-on-glass film on the water-containing first dielectric layer.

8. The method of claim 1 , wherein a ratio of an etch rate of the second dielectric layer after annealing to an etch rate of thermal oxide is between 1:1 and 1.25:1.

9. The method of claim 1 , wherein forming the first dielectric layer on the substrate comprises a spin coating process or a chemical vapor deposition process.

10. The method of claim 1 , wherein the fluid is a vapor or a liquid.

11. The method of claim 1 , wherein contacting the first dielectric layer with a fluid comprising water comprises chemical mechanical planarization of the first dielectric layer.

12. The method of claim 1 , wherein contacting the first dielectric layer with a fluid comprising water comprises contacting the first dielectric layer with an aqueous solution or water.

13. A device fabricated by the method of claim 1 .

14. A method of fabricating an imprint lithography template, the method comprising:

providing a fused silica substrate with a porous layer, wherein the porous layer defines a multiplicity of water-containing pores and wherein providing the fused silica substrate with the porous layer further comprises forming the porous layer on the fused silica substrate and contacting the porous layer with a fluid comprising water;

providing a cap layer on the water-containing porous layer; and

steam annealing the porous layer and the cap layer at a temperature of 600° C. or less to increase a density of the cap layer.

15. The method of claim 14 , wherein providing the cap layer on the water-containing porous layer comprises spin-coating a polymerizable material on the water-containing porous layer.

16. The method of claim 15 , further comprising patterning the polymerizable material to form a patterned cap layer on the water-containing porous layer.

17. The method of claim 15 , further comprising pre-baking the polymerizable material before steam annealing the porous layer and the cap layer.

18. An imprint lithography template fabricated by the method of claim 14 .

Assignments (7)
ASSIGNMENT OF SECURITY INTEREST IN PATENTS Recorded Nov 7, 2019
From: JPMORGAN CHASE BANK, N.A.
To: CITIBANK, N.A.
Reel/Frame 050967/0138 →
PATENT SECURITY AGREEMENT Recorded Aug 22, 2019
From: MAGIC LEAP, INC.; MOLECULAR IMPRINTS, INC.; MENTOR ACQUISITION ONE, LLC
To: JP MORGAN CHASE BANK, N.A.
Reel/Frame 050138/0287 →
CONFIRMATORY ASSIGNMENT OF JOINT PATENT OWNERSHIP Recorded Apr 27, 2015
From: CANON NANOTECHNOLOGIES, INC.
To: MOLECULAR IMPRINTS, INC.
Reel/Frame 035507/0559 →
CHANGE OF NAME Recorded Jul 30, 2014
From: MII NEWCO, INC.
To: MOLECULAR IMPRINTS, INC.
Reel/Frame 033449/0684 →
CHANGE OF NAME Recorded Jul 24, 2014
From: MOLECULAR IMPRINTS, INC.
To: CANON NANOTECHNOLOGIES, INC.
Reel/Frame 033400/0184 →
ASSIGNMENT OF JOINT OWNERSHIP Recorded Jul 15, 2014
From: MOLECULAR IMPRINTS, INC.
To: MII NEWCO, INC.
Reel/Frame 033329/0280 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 2, 2011
From: MENEZES, MARLON; XU, FRANK Y.; WAN, FEN
To: MOLECULAR IMPRINTS, INC.
Reel/Frame 026685/0726 →