IP Library Granted Patent US 8,575,819
Granted Patent B1
US 8,575,819 · App. 13/184,970 · Granted Nov 5, 2013

Microelectromechanical resonators with passive frequency tuning using built-in piezoelectric-based varactors

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Quick Facts
Patent No.
US 8,575,819
App. No.
13/184,970
Granted
Nov 5, 2013
Kind
B1
Abstract

Microelectromechanical resonators include a resonator body with a built-in piezoelectric-based varactor diode. This built-in varactor diode supports passive frequency tuning by enabling low-power manipulation of the stiffness of a piezoelectric layer, in response to controlling charge build-up therein at resonance. A resonator may include a composite stack of a bottom electrode, a piezoelectric layer on the bottom electrode and at least one top electrode on the piezoelectric layer. The piezoelectric layer includes a built-in varactor diode, which is defined by at least two regions having different concentrations of electrically active dopants therein.

Claims (23)

1. A microelectromechanical resonator, comprising:

a resonator body comprising a composite stack of a bottom electrode, a piezoelectric layer on said bottom electrode and at least one top electrode on said piezoelectric layer, said piezoelectric layer comprising a built-in varactor diode defined by at least two regions in said piezoelectric layer having different concentrations of electrically active dopants therein.

2. The resonator of claim 1 , wherein the electrically active dopants in a first of the at least two regions are N-type dopants.

3. The resonator of claim 1 , wherein the at least two regions comprise an N-type piezoelectric layer on an undoped piezoelectric layer.

4. The resonator of claim 1 , wherein the built-in varactor diode comprises a first piezoelectric region therein doped with N-type impurities selected from a group consisting of silicon and chromium.

5. The resonator of claim 4 , wherein said piezoelectric layer comprises aluminum nitride.

6. The resonator of claim 5 , wherein said bottom electrode and said at least one top electrode comprise molybdenum.

7. The resonator of claim 1 , wherein said resonator body comprises a suspended semiconductor layer anchored to a surrounding substrate by a pair of tethers; and wherein said bottom electrode extends between the semiconductor layer and said piezoelectric layer.

8. The resonator of claim 7 , wherein the built-in varactor comprises an N-type piezoelectric layer on an undoped piezoelectric layer; and wherein the N-type piezoelectric layer defines an interface with said bottom electrode or said at least one top electrode.

9. The resonator of claim 7 , wherein the N-type piezoelectric layer defines a doped/undoped piezoelectric junction with the undoped piezoelectric layer.

10. The resonator of claim 9 , wherein the N-type piezoelectric layer comprises an N-type aluminum nitride layer having impurities therein selected from a group consisting of silicon and chromium.

11. The resonator of claim 1 , wherein the at least two regions comprise an N-type piezoelectric region and a P-type piezoelectric region that defines a P-N junction with the N-type piezoelectric region.

12. The resonator of claim 11 , wherein the P-type piezoelectric region is doped with P-type impurities selected from a group consisting of zinc and magnesium.

13. The resonator of claim 1 , wherein the at least two regions comprise a N-type aluminum nitride region and at least one of an undoped aluminum nitride region and a P-type aluminum nitride region.

14. The resonator of claim 1 , wherein the at least two regions comprise a P-type aluminum nitride region and at least one of an undoped aluminum nitride region and an N-type aluminum nitride region.

15. A periodic signal generator, comprising:

a resonator body including a composite stack of a semiconductor layer anchored by at least a pair of tethers to a surrounding substrate, a bottom electrode on the semiconductor layer, a piezoelectric layer on the bottom electrode and at least one sense electrode and at least one drive electrode on the piezoelectric layer, said piezoelectric layer comprising a built-in varactor diode defined by at least two regions in said piezoelectric layer having different concentrations of electrically active dopants therein; and

a DC reference voltage generator electrically coupled to one of the sense electrode and drive electrode.

16. The generator of claim 15 , wherein the at least two regions are of opposite conductivity type.

17. The generator of claim 15 , wherein the at least two regions are of net first conductivity type.

18. The generator of claim 15 , wherein one of the at least two regions is undoped and another of the at least two regions is of net N-type conductivity or net P-type conductivity.

19. The generator of claim 15 , wherein one of the at least two regions is doped with dopants selected from a group consisting of silicon, chromium, zinc and magnesium.

20. The generator of claim 15 , wherein a width of a depletion region in the varactor diode changes in response to changes in a magnitude of a voltage generated by said DC reference voltage generator.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Mar 29, 2019
From: JPMORGAN CHASE BANK, N.A.
To: INTEGRATED DEVICE TECHNOLOGY, INC.; GIGPEAK, INC.; CHIPX, INCORPORATED; ENDWAVE CORPORATION; MAGNUM SEMICONDUCTOR, INC.
Reel/Frame 048746/0001 →
SECURITY AGREEMENT Recorded Apr 5, 2017
From: INTEGRATED DEVICE TECHNOLOGY, INC.; GIGPEAK, INC.; MAGNUM SEMICONDUCTOR, INC.; ENDWAVE CORPORATION; CHIPX, INCORPORATED
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 042166/0431 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2011
From: BHUGRA, HARMEET; SAMARAO, ASHWIN
To: INTEGRATED DEVICE TECHNOLOGY, INC.
Reel/Frame 026611/0248 →